JPS54148485A - Test method for semiconductor device - Google Patents

Test method for semiconductor device

Info

Publication number
JPS54148485A
JPS54148485A JP5780978A JP5780978A JPS54148485A JP S54148485 A JPS54148485 A JP S54148485A JP 5780978 A JP5780978 A JP 5780978A JP 5780978 A JP5780978 A JP 5780978A JP S54148485 A JPS54148485 A JP S54148485A
Authority
JP
Japan
Prior art keywords
test
elements
necessity
decide
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5780978A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6111465B2 (enrdf_load_stackoverflow
Inventor
Michio Honma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP5780978A priority Critical patent/JPS54148485A/ja
Publication of JPS54148485A publication Critical patent/JPS54148485A/ja
Publication of JPS6111465B2 publication Critical patent/JPS6111465B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP5780978A 1978-05-15 1978-05-15 Test method for semiconductor device Granted JPS54148485A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5780978A JPS54148485A (en) 1978-05-15 1978-05-15 Test method for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5780978A JPS54148485A (en) 1978-05-15 1978-05-15 Test method for semiconductor device

Publications (2)

Publication Number Publication Date
JPS54148485A true JPS54148485A (en) 1979-11-20
JPS6111465B2 JPS6111465B2 (enrdf_load_stackoverflow) 1986-04-03

Family

ID=13066240

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5780978A Granted JPS54148485A (en) 1978-05-15 1978-05-15 Test method for semiconductor device

Country Status (1)

Country Link
JP (1) JPS54148485A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5948934A (ja) * 1982-09-14 1984-03-21 Fujitsu Ltd 半導体集積回路装置の製造方法
JPS59115642U (ja) * 1983-01-26 1984-08-04 日本電気アイシ−マイコンシステム株式会社 半導体ウエフア
JPS6037138A (ja) * 1983-08-08 1985-02-26 Nec Corp 半導体集積回路装置
JPH01145869A (ja) * 1987-12-01 1989-06-07 Nec Ic Microcomput Syst Ltd 冗長回路付きｕｖｅｐｒｏｍの製造方法
DE19655006C2 (de) * 1995-03-30 2001-12-06 Mitsubishi Electric Corp Halbleiterchip
US6498396B1 (en) 1995-03-30 2002-12-24 Mitsubishi Denki Kabushiki Kaisha Semiconductor chip scale package and ball grid array structures

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5948934A (ja) * 1982-09-14 1984-03-21 Fujitsu Ltd 半導体集積回路装置の製造方法
JPS59115642U (ja) * 1983-01-26 1984-08-04 日本電気アイシ−マイコンシステム株式会社 半導体ウエフア
JPS6037138A (ja) * 1983-08-08 1985-02-26 Nec Corp 半導体集積回路装置
JPH01145869A (ja) * 1987-12-01 1989-06-07 Nec Ic Microcomput Syst Ltd 冗長回路付きｕｖｅｐｒｏｍの製造方法
DE19655006C2 (de) * 1995-03-30 2001-12-06 Mitsubishi Electric Corp Halbleiterchip
US6498396B1 (en) 1995-03-30 2002-12-24 Mitsubishi Denki Kabushiki Kaisha Semiconductor chip scale package and ball grid array structures

Also Published As

Publication number Publication date
JPS6111465B2 (enrdf_load_stackoverflow) 1986-04-03

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