JPS5390784A - Production of semiconductor device - Google Patents
Production of semiconductor deviceInfo
- Publication number
- JPS5390784A JPS5390784A JP533277A JP533277A JPS5390784A JP S5390784 A JPS5390784 A JP S5390784A JP 533277 A JP533277 A JP 533277A JP 533277 A JP533277 A JP 533277A JP S5390784 A JPS5390784 A JP S5390784A
- Authority
- JP
- Japan
- Prior art keywords
- production
- semiconductor device
- oxide film
- impurity
- diffuse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Led Devices (AREA)
Abstract
PURPOSE: To increase the rate of impurity diffusion in oxide film and diffuse an impurity through the oxide film by heat-treating the semiconductor substrate formed with the oxide film on its surface in a hydrogen current.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52005332A JPS5917845B2 (en) | 1977-01-19 | 1977-01-19 | Manufacturing method of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52005332A JPS5917845B2 (en) | 1977-01-19 | 1977-01-19 | Manufacturing method of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5390784A true JPS5390784A (en) | 1978-08-09 |
JPS5917845B2 JPS5917845B2 (en) | 1984-04-24 |
Family
ID=11608275
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52005332A Expired JPS5917845B2 (en) | 1977-01-19 | 1977-01-19 | Manufacturing method of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5917845B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2101347A1 (en) * | 2008-03-04 | 2009-09-16 | KISCO Corporation | Annealing method of zinc oxide thin film |
-
1977
- 1977-01-19 JP JP52005332A patent/JPS5917845B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2101347A1 (en) * | 2008-03-04 | 2009-09-16 | KISCO Corporation | Annealing method of zinc oxide thin film |
US8034656B2 (en) | 2008-03-04 | 2011-10-11 | Kisco | Annealing method of zinc oxide thin film |
Also Published As
Publication number | Publication date |
---|---|
JPS5917845B2 (en) | 1984-04-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5390784A (en) | Production of semiconductor device | |
JPS5338271A (en) | Semiconductor device | |
JPS5379378A (en) | Semoconductor davice and its production | |
JPS5377168A (en) | Production of semiconductor device | |
JPS5258360A (en) | Production of semiconductor device | |
JPS5339081A (en) | Semiconductor device | |
JPS5228879A (en) | Semiconductor device and method for its production | |
JPS5320862A (en) | Production of semiconductor device | |
JPS53108394A (en) | Semiconductor intergrated circuit device | |
JPS5380184A (en) | Manufacture of semiconductor device | |
JPS5272186A (en) | Production of mis type semiconductor device | |
JPS5279871A (en) | Production of impurity diffused layer | |
JPS5273673A (en) | Production of semiconductor device | |
JPS54586A (en) | Production of semiconductor device | |
JPS52154344A (en) | Impurity diffusion method | |
JPS5372482A (en) | Manufacture for semiconductor device | |
JPS53101977A (en) | Diffusion method of inpurity to semiconductor substrate | |
JPS5365086A (en) | Production of semiconductor device | |
JPS5350670A (en) | Production of semiconductor device | |
JPS53120264A (en) | Manufacture of semiconductor device | |
JPS53117963A (en) | Production of semiconductor device | |
JPS5348681A (en) | Semiconductor device and its production | |
JPS53143162A (en) | Production of semiconductor device | |
JPS5349943A (en) | Impurity diffusion method | |
JPS5363982A (en) | Production of silicon gate type mis semiconductor |