JPS5368981A - Vacuum contact printing apparatus - Google Patents
Vacuum contact printing apparatusInfo
- Publication number
- JPS5368981A JPS5368981A JP14528776A JP14528776A JPS5368981A JP S5368981 A JPS5368981 A JP S5368981A JP 14528776 A JP14528776 A JP 14528776A JP 14528776 A JP14528776 A JP 14528776A JP S5368981 A JPS5368981 A JP S5368981A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum contact
- printing apparatus
- contact printing
- duplicating
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70841—Constructional issues related to vacuum environment, e.g. load-lock chamber
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
Abstract
PURPOSE: To avert the effect of oxygen on rubber base photo resist even in the event of the occurrence of leakage in the apparatus and obtain a duplicating mask of high accuracy by keeping the surroundings of a reference photo mask and a duplicating specimen always filled with an inert gas from prior to starting of vacuum contact until the completion of vacuum contact exposure.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14528776A JPS5368981A (en) | 1976-12-02 | 1976-12-02 | Vacuum contact printing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14528776A JPS5368981A (en) | 1976-12-02 | 1976-12-02 | Vacuum contact printing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5368981A true JPS5368981A (en) | 1978-06-19 |
Family
ID=15381640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14528776A Pending JPS5368981A (en) | 1976-12-02 | 1976-12-02 | Vacuum contact printing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5368981A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55141944U (en) * | 1979-03-29 | 1980-10-11 | ||
JPS5836738U (en) * | 1981-08-31 | 1983-03-10 | 三洋電機株式会社 | Exposure mask device |
JPS58151025A (en) * | 1982-03-04 | 1983-09-08 | Toshiba Corp | Exposing method of photosensitive film of semiconductor wafer |
JP2001168027A (en) * | 1999-11-05 | 2001-06-22 | Asm Lithography Bv | Lithography device |
JP2010040831A (en) * | 2008-08-06 | 2010-02-18 | Orc Mfg Co Ltd | Exposing method for substrate in exposing device |
-
1976
- 1976-12-02 JP JP14528776A patent/JPS5368981A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55141944U (en) * | 1979-03-29 | 1980-10-11 | ||
JPS5836738U (en) * | 1981-08-31 | 1983-03-10 | 三洋電機株式会社 | Exposure mask device |
JPS623804Y2 (en) * | 1981-08-31 | 1987-01-28 | ||
JPS58151025A (en) * | 1982-03-04 | 1983-09-08 | Toshiba Corp | Exposing method of photosensitive film of semiconductor wafer |
JPH0254652B2 (en) * | 1982-03-04 | 1990-11-22 | Tokyo Shibaura Electric Co | |
JP2001168027A (en) * | 1999-11-05 | 2001-06-22 | Asm Lithography Bv | Lithography device |
JP2010040831A (en) * | 2008-08-06 | 2010-02-18 | Orc Mfg Co Ltd | Exposing method for substrate in exposing device |
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