JPH11500583A - トンネルデバイスとその製造方法 - Google Patents
トンネルデバイスとその製造方法Info
- Publication number
- JPH11500583A JPH11500583A JP9534295A JP53429597A JPH11500583A JP H11500583 A JPH11500583 A JP H11500583A JP 9534295 A JP9534295 A JP 9534295A JP 53429597 A JP53429597 A JP 53429597A JP H11500583 A JPH11500583 A JP H11500583A
- Authority
- JP
- Japan
- Prior art keywords
- tunnel
- electron
- tunnel device
- tunneling
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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- 230000005641 tunneling Effects 0.000 claims abstract description 77
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- 239000007787 solid Substances 0.000 claims abstract description 10
- 230000004807 localization Effects 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 47
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 8
- 229910002804 graphite Inorganic materials 0.000 claims description 8
- 239000010439 graphite Substances 0.000 claims description 8
- 238000006116 polymerization reaction Methods 0.000 claims description 6
- 230000015572 biosynthetic process Effects 0.000 claims description 4
- 125000003636 chemical group Chemical group 0.000 claims description 3
- 238000010276 construction Methods 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 230000007704 transition Effects 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
- 239000002120 nanofilm Substances 0.000 claims 1
- 230000002596 correlated effect Effects 0.000 abstract description 15
- 239000000969 carrier Substances 0.000 abstract description 3
- 239000002356 single layer Substances 0.000 description 25
- 235000021355 Stearic acid Nutrition 0.000 description 18
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 18
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 18
- 239000008117 stearic acid Substances 0.000 description 18
- 239000000126 substance Substances 0.000 description 16
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 14
- 230000008859 change Effects 0.000 description 10
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- 229910052751 metal Inorganic materials 0.000 description 10
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- 239000004020 conductor Substances 0.000 description 5
- 239000013547 langmuir monolayer Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 4
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 4
- 210000000981 epithelium Anatomy 0.000 description 4
- 238000013139 quantization Methods 0.000 description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 3
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- 238000004611 spectroscopical analysis Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 239000013543 active substance Substances 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
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- 230000000379 polymerizing effect Effects 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 2
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical compound C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 1
- -1 Chlorosilyl groups Chemical group 0.000 description 1
- 238000001074 Langmuir--Blodgett assembly Methods 0.000 description 1
- 241001351225 Sergey Species 0.000 description 1
- FNYLWPVRPXGIIP-UHFFFAOYSA-N Triamterene Chemical compound NC1=NC2=NC(N)=NC(N)=C2N=C1C1=CC=CC=C1 FNYLWPVRPXGIIP-UHFFFAOYSA-N 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
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- 230000006835 compression Effects 0.000 description 1
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- 230000002349 favourable effect Effects 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 229910003472 fullerene Inorganic materials 0.000 description 1
- 230000013632 homeostatic process Effects 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
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- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000003121 nonmonotonic effect Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
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- 229920000642 polymer Polymers 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N99/00—Subject matter not provided for in other groups of this subclass
- H10N99/05—Devices based on quantum mechanical effects, e.g. quantum interference devices or metal single-electron transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/7613—Single electron transistors; Coulomb blockade devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/936—Specified use of nanostructure for electronic or optoelectronic application in a transistor or 3-terminal device
- Y10S977/937—Single electron transistor
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Crystallography & Structural Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Junction Field-Effect Transistors (AREA)
- Semiconductor Memories (AREA)
- Thin Film Transistor (AREA)
- Non-Volatile Memory (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.トンネル障壁によって隔てられた入力、出力および制御電極を含むトンネ ルデバイスりにおいて、 N個の制御電極を備え、トンネル障壁および障壁間の空間がトンネル接合を形 成する分子およびクラスタからなる整列した構造で構成されており、デバイス内 部での単一電子の電子トンネル現象相関を可能にし、しかもそれぞれの制御電極 が、分子およびクラスタからなる整列した構造の領域中におかれていることを特 徴とするトンネルデバイス。 2.請求項1に記載のトンネルデバイスにおいて、 前記入力、出力および制御電極が固体基板の表面に置かれていることを特徴と するトンネルデバイス。 3.請求項1に記載のトンネルデバイスにおいて、 前記入力電極とK個の制御電極(K<N)とが前記固体基板の表面に置かれ、 (N−K)個の制御電極と前記出力電極とが前記固体基板の表面をはずれた分子 とクラスタとの整列した構造の領域中に置かれていることを特徴とするトンネル デバイス。 4.請求項1又は2に記載のトンネルデバイスにおいて、 前記基板が黒鉛によって作製されていることを特徴とするトンネルデバイス。 5.請求項1又は2に記載のトンネルデバイスにおいて、 前記入力、出力および制御電極が金で作製されていることを特徴とするトンネ ルデバイス。 6.原子的に平滑な固体基板表面に入力、出力及び制御電極をそれぞれ形成し 、ついで 単一分子又は複数の単一分子膜を形成し、 前記分子膜中にトンネル電子の局部化の中心となり、単一電子トンネル接合を 形成し、不活性誘電性分子マトリックスに活性分子とクラスタとを固定して 組込み、さらに 前記原子的に平滑な固体基板表面に(N−1)個の制御電極を形成する、こと を特徴とするトンネルデバイスの製造方法。 7.請求項6に記載のトンネルデバイスの製造方法において、 前記不活性な誘電性分子マトリックスに、ラングミュール・ブロジェット法に よって生成される活性分子とクラスタとを組み込むことを特徴とするトンネルデ バイスの製造方法。 8.請求項6又は7に記載のトンネルデバイスの製造方法において、 前記不活性な誘電性分子マトリックスの生成のために、重合化可能な化学基を 含む分子を利用することを特徴とするトンネルデバイスの製造方法。 9.請求項6,7又は8のいずれかに記載のトンネルデバイスの製造方法にお いて、 前記不活性な誘電性分子マトリックスの生成の後、トンネル電子の局部化の中 心となる単一電子トンネル接合を形成し、さらに分子構造の重合化を実現する活 性分子とクラスタとを固定して組み込むことを特徴とするトンネルデバイスの製 造方法。 10.請求項6に記載のトンネルデバイスの製造方法において、 前記不活性な誘電性分子マトリックスに、化学的吸着法よって生成される活性 分子とクラスタとを組み込むことを特徴とするトンネルデバイスの製造方法。 11.請求項6又は10に記載のトンネルデバイスの製造方法において、 前記不活性な誘電性分子マトリックスの生成のために、重合化可能な化学基を 含む分子を利用することを特徴とするトンネルデバイスの製造方法。 12.請求項6又は10に記載のトンネルデバイスの製造方法において、 前記不活性な誘電性分子マトリックスの生成の後、トンネル電子の局部化の中 心となる単一電子トンネル転移を形成し、さらに分子構造の重合化を実現する活 性分子とクラスタとを固定して組み込むことを特徴とするトンネルデバイスの製 造方法。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU96105544 | 1996-03-26 | ||
RU96105544A RU2105386C1 (ru) | 1996-03-26 | 1996-03-26 | Туннельный прибор |
RU96112308 | 1996-06-21 | ||
RU96112308A RU2106041C1 (ru) | 1996-06-21 | 1996-06-21 | Способ изготовления туннельного прибора |
PCT/RU1997/000082 WO1997036333A1 (fr) | 1996-03-26 | 1997-03-25 | Dispositif a effet de tunnel et procede de fabrication de ce dispositif |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH11500583A true JPH11500583A (ja) | 1999-01-12 |
JP3635409B2 JP3635409B2 (ja) | 2005-04-06 |
Family
ID=26653867
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53429597A Expired - Fee Related JP3635409B2 (ja) | 1996-03-26 | 1997-03-25 | トンネルデバイスとその製造方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6057556A (ja) |
EP (1) | EP0836232B1 (ja) |
JP (1) | JP3635409B2 (ja) |
KR (1) | KR100272702B1 (ja) |
CN (1) | CN1097857C (ja) |
AU (1) | AU2579297A (ja) |
DE (1) | DE69721929T2 (ja) |
WO (1) | WO1997036333A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015128192A (ja) * | 2015-04-06 | 2015-07-09 | 株式会社東芝 | 不揮発性半導体記憶装置 |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
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GB9724642D0 (en) * | 1997-11-21 | 1998-01-21 | British Tech Group | Single electron devices |
FR2772984B1 (fr) | 1997-12-19 | 2003-07-25 | Commissariat Energie Atomique | Procede de formation d'un reseau regulier d'ilots semi-conducteurs sur un substrat isolant |
JPH11186538A (ja) * | 1997-12-24 | 1999-07-09 | Fujitsu Ltd | 単一電子トンネル接合素子を利用した位相同期型回路装置とその製造方法 |
WO2000041245A1 (en) * | 1998-12-30 | 2000-07-13 | Alexander Mikhailovich Ilyanok | Quantum-size electronic devices and methods of operating thereof |
EP1022560B1 (en) * | 1999-01-21 | 2004-12-22 | Sony International (Europe) GmbH | Nanoparticle structure for use in an electronic device, especially in a chemical sensor |
US6339227B1 (en) | 1999-02-01 | 2002-01-15 | The Mitre Corporation | Monomolecular electronic device |
KR100325689B1 (ko) * | 1999-12-01 | 2002-02-25 | 오길록 | 전자-홀 결합을 이용한 단전자 메모리 소자 |
JP2001168317A (ja) | 1999-12-13 | 2001-06-22 | Nec Corp | 金属微粒子秩序構造形成方法 |
DE10042663A1 (de) * | 2000-08-31 | 2002-03-14 | Deutsche Telekom Ag | Eletronenspektrometer |
US6423583B1 (en) * | 2001-01-03 | 2002-07-23 | International Business Machines Corporation | Methodology for electrically induced selective breakdown of nanotubes |
US6483125B1 (en) | 2001-07-13 | 2002-11-19 | North Carolina State University | Single electron transistors in which the thickness of an insulating layer defines spacing between electrodes |
US6653653B2 (en) | 2001-07-13 | 2003-11-25 | Quantum Logic Devices, Inc. | Single-electron transistors and fabrication methods in which a projecting feature defines spacing between electrodes |
EP1436844B1 (en) | 2001-09-05 | 2016-03-23 | Rensselaer Polytechnic Institute | Passivated nanoparticles, method of fabrication thereof, and devices incorporating nanoparticles |
JP3974429B2 (ja) * | 2002-02-28 | 2007-09-12 | 株式会社東芝 | 乱数発生素子 |
US6673717B1 (en) | 2002-06-26 | 2004-01-06 | Quantum Logic Devices, Inc. | Methods for fabricating nanopores for single-electron devices |
AU2003264480A1 (en) * | 2002-09-19 | 2004-04-08 | Sharp Kabushiki Kaisha | Variable resistance functional body and its manufacturing method |
WO2005013337A2 (en) * | 2003-03-06 | 2005-02-10 | Rensselaer Polytechnic Institute | Rapid generation of nanoparticles from bulk solids at room temperature |
ITTO20030217A1 (it) * | 2003-03-25 | 2004-09-26 | Fiat Ricerche | Dispositivo elettronico comprendente un film a struttura |
US7067341B2 (en) * | 2003-10-28 | 2006-06-27 | Stmicroelectronics S.R.L. | Single electron transistor manufacturing method by electro-migration of metallic nanoclusters |
US7602069B2 (en) | 2004-03-31 | 2009-10-13 | Universität Duisburg-Essen | Micro electronic component with electrically accessible metallic clusters |
DE102004040238A1 (de) * | 2004-08-13 | 2006-02-23 | Hahn-Meitner-Institut Berlin Gmbh | Flexibler Nanotransistor und Verfahren zur Herstellung |
EP1905064A2 (en) * | 2005-06-24 | 2008-04-02 | Applied Nanoworks, Inc. | Nanoparticles and method of making thereof |
ATE376260T1 (de) * | 2005-07-26 | 2007-11-15 | Univ Duisburg Essen | Mikroelektronisches bauelement |
TWI278072B (en) * | 2005-12-28 | 2007-04-01 | Ind Tech Res Inst | Nano grain varied-resistance memory |
US20080245769A1 (en) * | 2006-07-17 | 2008-10-09 | Applied Nanoworks, Inc. | Nanoparticles and method of making thereof |
US20140150860A1 (en) * | 2011-05-16 | 2014-06-05 | The Board Of Trustees Of The University Of Illinoi | Electronic device from dissipative quantum dots |
CN102891083B (zh) * | 2011-07-22 | 2016-10-19 | 中国人民解放军国防科学技术大学 | 一种制备室温单电子晶体管的方法 |
CN106595897B (zh) * | 2016-11-15 | 2018-11-16 | 湖南理工学院 | 隧道效应超灵敏度电磁控制恒温系统 |
CN115220085B (zh) * | 2022-07-06 | 2023-06-09 | 苏州科技大学 | 探测隧穿电离电子初始横向位置的方法 |
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JPH0770690B2 (ja) * | 1986-01-14 | 1995-07-31 | オリンパス光学工業株式会社 | 三次元トンネルメモリ装置 |
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JP2507153B2 (ja) * | 1990-07-31 | 1996-06-12 | 松下電器産業株式会社 | 有機デバイスとその製造方法 |
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JP3560630B2 (ja) * | 1994-02-09 | 2004-09-02 | 株式会社日立製作所 | 単一電子素子 |
GB9415718D0 (en) * | 1994-08-03 | 1994-09-21 | Hitachi Europ Ltd | Conduction control device |
US5731598A (en) * | 1995-06-23 | 1998-03-24 | Matsushita Electric Industrial Co. Ltd. | Single electron tunnel device and method for fabricating the same |
US5844279A (en) * | 1995-09-14 | 1998-12-01 | Kabushiki Kaisha Toshiba | Single-electron semiconductor device |
-
1997
- 1997-03-25 WO PCT/RU1997/000082 patent/WO1997036333A1/ru active IP Right Grant
- 1997-03-25 CN CN97190420A patent/CN1097857C/zh not_active Expired - Lifetime
- 1997-03-25 US US08/973,355 patent/US6057556A/en not_active Expired - Lifetime
- 1997-03-25 KR KR1019970708445A patent/KR100272702B1/ko not_active IP Right Cessation
- 1997-03-25 EP EP97917492A patent/EP0836232B1/en not_active Expired - Lifetime
- 1997-03-25 AU AU25792/97A patent/AU2579297A/en not_active Abandoned
- 1997-03-25 DE DE69721929T patent/DE69721929T2/de not_active Expired - Lifetime
- 1997-03-25 JP JP53429597A patent/JP3635409B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015128192A (ja) * | 2015-04-06 | 2015-07-09 | 株式会社東芝 | 不揮発性半導体記憶装置 |
Also Published As
Publication number | Publication date |
---|---|
CN1097857C (zh) | 2003-01-01 |
DE69721929D1 (de) | 2003-06-18 |
WO1997036333A1 (fr) | 1997-10-02 |
DE69721929T2 (de) | 2004-05-13 |
KR100272702B1 (ko) | 2000-11-15 |
JP3635409B2 (ja) | 2005-04-06 |
US6057556A (en) | 2000-05-02 |
AU2579297A (en) | 1997-10-17 |
EP0836232B1 (en) | 2003-05-14 |
EP0836232A4 (en) | 2000-01-19 |
CN1189921A (zh) | 1998-08-05 |
EP0836232A1 (en) | 1998-04-15 |
KR19990021970A (ko) | 1999-03-25 |
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