JPH11134242A - メモリ手段にアクセスするための装置 - Google Patents

メモリ手段にアクセスするための装置

Info

Publication number
JPH11134242A
JPH11134242A JP10248261A JP24826198A JPH11134242A JP H11134242 A JPH11134242 A JP H11134242A JP 10248261 A JP10248261 A JP 10248261A JP 24826198 A JP24826198 A JP 24826198A JP H11134242 A JPH11134242 A JP H11134242A
Authority
JP
Japan
Prior art keywords
data
memory
buffer
access
repetition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP10248261A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11134242A5 (https=
Inventor
Thomas Henkel
トーマス・ヘンケル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH11134242A publication Critical patent/JPH11134242A/ja
Publication of JPH11134242A5 publication Critical patent/JPH11134242A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F5/00Methods or arrangements for data conversion without changing the order or content of the data handled
    • G06F5/06Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
    • G06F5/16Multiplexed systems, i.e. using two or more similar devices which are alternately accessed for enqueue and dequeue operations, e.g. ping-pong buffers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919Storing and outputting test patterns
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F5/00Methods or arrangements for data conversion without changing the order or content of the data handled
    • G06F5/06Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919Storing and outputting test patterns
    • G01R31/31921Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Dram (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Memory System (AREA)
JP10248261A 1997-09-13 1998-09-02 メモリ手段にアクセスするための装置 Ceased JPH11134242A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP97115982.7 1997-09-13
EP97115982A EP0864977B1 (en) 1997-09-13 1997-09-13 Memory latency compensation

Publications (2)

Publication Number Publication Date
JPH11134242A true JPH11134242A (ja) 1999-05-21
JPH11134242A5 JPH11134242A5 (https=) 2005-11-04

Family

ID=8227349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10248261A Ceased JPH11134242A (ja) 1997-09-13 1998-09-02 メモリ手段にアクセスするための装置

Country Status (4)

Country Link
US (1) US6351793B2 (https=)
EP (1) EP0864977B1 (https=)
JP (1) JPH11134242A (https=)
DE (1) DE69700328T2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013062326A (ja) * 2011-09-12 2013-04-04 Canon Inc 描画装置及び物品の製造方法

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2829253A1 (fr) * 2001-08-31 2003-03-07 Koninkl Philips Electronics Nv Controle d'acces dynamique d'une fonction a ressource collective
DE10159165B4 (de) * 2001-12-03 2007-02-08 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes
DE60131067T2 (de) 2001-12-05 2008-05-15 Verigy (Singapore) Pte. Ltd. Leitungsentzerrer zur Kompensation von Droop-Effekten
EP1351067B1 (en) 2003-02-25 2004-11-10 Agilent Technologies Inc Transition tracking
US7104346B2 (en) * 2003-03-25 2006-09-12 Schaffner Walter E Power wheelchair
DE60308844T2 (de) 2003-06-17 2007-03-01 Agilent Technologies, Inc., Palo Alto Sigma-Delta-Modulator mit Pulsbreitenmodulations-Ausgang
EP1600784A1 (en) 2004-05-03 2005-11-30 Agilent Technologies, Inc. Serial/parallel interface for an integrated circuit
EP1610204B1 (en) 2004-06-24 2008-10-29 Verigy (Singapore) Pte. Ltd. Fast synchronization of a number of digital clocks
EP1610137B1 (en) 2004-06-24 2009-05-20 Verigy (Singapore) Pte. Ltd. Per-pin clock synthesis
WO2006002693A1 (en) 2004-07-07 2006-01-12 Agilent Technologies, Inc. Evaluation of an output signal of a device under test
EP1624577B1 (en) 2004-08-06 2008-07-23 Verigy (Singapore) Pte. Ltd. Improved analog signal generation using a delta-sigma modulator
WO2006092173A1 (en) 2005-03-02 2006-09-08 Agilent Technologies, Inc. Analog signal test using a-priori information
EP1701173B1 (en) 2005-03-11 2008-08-20 Verigy (Singapore) Pte. Ltd. Error detection in compressed data
WO2006117255A1 (en) 2005-04-29 2006-11-09 Verigy (Singapore) Pte Ltd. Communication circuit for a bi-directonal data transmission
US8838406B2 (en) 2008-11-11 2014-09-16 Advantest (Singapore) Pte Ltd Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5847741B2 (ja) * 1978-03-29 1983-10-24 日本電信電話株式会社 パタ−ン発生器
CA1251575A (en) * 1985-12-18 1989-03-21 A. Keith Jeffrey Automatic test system having a "true tester-per-pin" architecture
US5317718A (en) * 1990-03-27 1994-05-31 Digital Equipment Corporation Data processing system and method with prefetch buffers
JPH07253922A (ja) * 1994-03-14 1995-10-03 Texas Instr Japan Ltd アドレス生成回路
US5890219A (en) * 1996-11-27 1999-03-30 Emc Corporation Redundant writing of data to cached storage system
US5890207A (en) * 1996-11-27 1999-03-30 Emc Corporation High performance integrated cached storage device
US6112266A (en) * 1998-01-22 2000-08-29 Pc-Tel, Inc. Host signal processing modem using a software circular buffer in system memory and direct transfers of samples to maintain a communication signal

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013062326A (ja) * 2011-09-12 2013-04-04 Canon Inc 描画装置及び物品の製造方法

Also Published As

Publication number Publication date
EP0864977A1 (en) 1998-09-16
DE69700328T2 (de) 1999-11-04
US6351793B2 (en) 2002-02-26
EP0864977B1 (en) 1999-07-14
US20010013092A1 (en) 2001-08-09
DE69700328D1 (de) 1999-08-19

Similar Documents

Publication Publication Date Title
JPH11134242A (ja) メモリ手段にアクセスするための装置
US5673272A (en) Apparatus and method for performing digital signal processing in an electronic circuit tester
KR100492205B1 (ko) 집적회로메모리디바이스의내장자가테스트구성
EP0255118B1 (en) Pattern generator
JPH1055694A (ja) メモリ試験装置
JPH11154119A (ja) メモリインターフェース装置及びデバッギングを支援する方法
US6131174A (en) System and method for testing of embedded processor
EP0409285A2 (en) Method and apparatus for data transfer between processor elements
JPH0731614B2 (ja) データ転送方法
JPH026765A (ja) 自動回路テスタ制御システム
US5606568A (en) Method and apparatus for performing serial and parallel scan testing on an integrated circuit
EP0228332B1 (en) Automatic test system having a "true tester-per-pin" architecture
KR19980070330A (ko) 가변 대기 메모리 회로
US5097468A (en) Testing asynchronous processes
JPH11134242A5 (https=)
EP0699999B1 (en) Memory architecture for automatic test equipment using vector module table
JP2002216499A (ja) シリアルアクセス機能付きアドレスマルチプレクサメモリのテスト方式
US4727312A (en) Circuit tester
CN114461472A (zh) 一种基于ate的gpu核心全速功能测试方法
US6839648B1 (en) Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment
KR100492235B1 (ko) 자동테스트장치회로테스터내에서의테스트패턴연결및루핑방법
US6006350A (en) Semiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor device
WO2000007084A2 (en) Algorithmic pattern generator
EP0553080A1 (en) High frequency testing apparatus and method for providing successive loops of data signals at a predetermined clock frequency.
US5559779A (en) Digital audio recorder using external memory medium and leading portion audio data memory

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050812

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050812

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20080815

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080819

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20081118

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20081118

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20081125

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20081204

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090113

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090319

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20090407

A045 Written measure of dismissal of application [lapsed due to lack of payment]

Free format text: JAPANESE INTERMEDIATE CODE: A045

Effective date: 20090825