JPH11134242A - メモリ手段にアクセスするための装置 - Google Patents
メモリ手段にアクセスするための装置Info
- Publication number
- JPH11134242A JPH11134242A JP10248261A JP24826198A JPH11134242A JP H11134242 A JPH11134242 A JP H11134242A JP 10248261 A JP10248261 A JP 10248261A JP 24826198 A JP24826198 A JP 24826198A JP H11134242 A JPH11134242 A JP H11134242A
- Authority
- JP
- Japan
- Prior art keywords
- data
- memory
- buffer
- access
- repetition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F5/00—Methods or arrangements for data conversion without changing the order or content of the data handled
- G06F5/06—Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
- G06F5/16—Multiplexed systems, i.e. using two or more similar devices which are alternately accessed for enqueue and dequeue operations, e.g. ping-pong buffers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F5/00—Methods or arrangements for data conversion without changing the order or content of the data handled
- G06F5/06—Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Dram (AREA)
- Memory System (AREA)
- Memory System Of A Hierarchy Structure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP97115982A EP0864977B1 (en) | 1997-09-13 | 1997-09-13 | Memory latency compensation |
| EP97115982.7 | 1997-09-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11134242A true JPH11134242A (ja) | 1999-05-21 |
| JPH11134242A5 JPH11134242A5 (enExample) | 2005-11-04 |
Family
ID=8227349
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10248261A Ceased JPH11134242A (ja) | 1997-09-13 | 1998-09-02 | メモリ手段にアクセスするための装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6351793B2 (enExample) |
| EP (1) | EP0864977B1 (enExample) |
| JP (1) | JPH11134242A (enExample) |
| DE (1) | DE69700328T2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013062326A (ja) * | 2011-09-12 | 2013-04-04 | Canon Inc | 描画装置及び物品の製造方法 |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2829253A1 (fr) * | 2001-08-31 | 2003-03-07 | Koninkl Philips Electronics Nv | Controle d'acces dynamique d'une fonction a ressource collective |
| DE10159165B4 (de) | 2001-12-03 | 2007-02-08 | Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto | Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes |
| EP1255386B1 (en) | 2001-12-05 | 2007-10-24 | Agilent Technologies, Inc. | Line equaliser for compensation of droop effect |
| DE60300141T2 (de) | 2003-02-25 | 2005-11-03 | Agilent Technologies, Inc., Palo Alto | Aufspüren eines Signalübergangs |
| US7104346B2 (en) * | 2003-03-25 | 2006-09-12 | Schaffner Walter E | Power wheelchair |
| DE60308844T2 (de) | 2003-06-17 | 2007-03-01 | Agilent Technologies, Inc., Palo Alto | Sigma-Delta-Modulator mit Pulsbreitenmodulations-Ausgang |
| EP1600784A1 (en) | 2004-05-03 | 2005-11-30 | Agilent Technologies, Inc. | Serial/parallel interface for an integrated circuit |
| DE602004017440D1 (de) | 2004-06-24 | 2008-12-11 | Verigy Pte Ltd Singapore | Schnelle Synchronisierung einem Anzahl von digitale Takten |
| DE602004021178D1 (de) | 2004-06-24 | 2009-07-02 | Verigy Pte Ltd Singapore | Taktsynthese pro Stift |
| ATE441120T1 (de) | 2004-07-07 | 2009-09-15 | Verigy Pte Ltd Singapore | Auswertung eines ausgangssignals eines gerade geprüften bausteins |
| EP1624577B1 (en) | 2004-08-06 | 2008-07-23 | Verigy (Singapore) Pte. Ltd. | Improved analog signal generation using a delta-sigma modulator |
| WO2006092173A1 (en) | 2005-03-02 | 2006-09-08 | Agilent Technologies, Inc. | Analog signal test using a-priori information |
| DE602005009133D1 (de) | 2005-03-11 | 2008-10-02 | Verigy Pte Ltd Singapore | Fehlererkennung in komprimierten Daten |
| EP1875650A1 (en) | 2005-04-29 | 2008-01-09 | Verigy (Singapore) Pte. Ltd. | Communication circuit for a bi-directonal data transmission |
| WO2010054669A1 (en) | 2008-11-11 | 2010-05-20 | Verigy (Singapore) Pte.Ltd. | Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5847741B2 (ja) * | 1978-03-29 | 1983-10-24 | 日本電信電話株式会社 | パタ−ン発生器 |
| CA1251575A (en) * | 1985-12-18 | 1989-03-21 | A. Keith Jeffrey | Automatic test system having a "true tester-per-pin" architecture |
| US5317718A (en) * | 1990-03-27 | 1994-05-31 | Digital Equipment Corporation | Data processing system and method with prefetch buffers |
| JPH07253922A (ja) * | 1994-03-14 | 1995-10-03 | Texas Instr Japan Ltd | アドレス生成回路 |
| US5890207A (en) * | 1996-11-27 | 1999-03-30 | Emc Corporation | High performance integrated cached storage device |
| US5890219A (en) * | 1996-11-27 | 1999-03-30 | Emc Corporation | Redundant writing of data to cached storage system |
| US6112266A (en) * | 1998-01-22 | 2000-08-29 | Pc-Tel, Inc. | Host signal processing modem using a software circular buffer in system memory and direct transfers of samples to maintain a communication signal |
-
1997
- 1997-09-13 DE DE69700328T patent/DE69700328T2/de not_active Expired - Fee Related
- 1997-09-13 EP EP97115982A patent/EP0864977B1/en not_active Expired - Lifetime
-
1998
- 1998-08-20 US US09/137,439 patent/US6351793B2/en not_active Expired - Lifetime
- 1998-09-02 JP JP10248261A patent/JPH11134242A/ja not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013062326A (ja) * | 2011-09-12 | 2013-04-04 | Canon Inc | 描画装置及び物品の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6351793B2 (en) | 2002-02-26 |
| DE69700328D1 (de) | 1999-08-19 |
| US20010013092A1 (en) | 2001-08-09 |
| EP0864977A1 (en) | 1998-09-16 |
| DE69700328T2 (de) | 1999-11-04 |
| EP0864977B1 (en) | 1999-07-14 |
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Legal Events
| Date | Code | Title | Description |
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