JPH11134242A - メモリ手段にアクセスするための装置 - Google Patents

メモリ手段にアクセスするための装置

Info

Publication number
JPH11134242A
JPH11134242A JP10248261A JP24826198A JPH11134242A JP H11134242 A JPH11134242 A JP H11134242A JP 10248261 A JP10248261 A JP 10248261A JP 24826198 A JP24826198 A JP 24826198A JP H11134242 A JPH11134242 A JP H11134242A
Authority
JP
Japan
Prior art keywords
data
memory
buffer
access
repetition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP10248261A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11134242A5 (enExample
Inventor
Thomas Henkel
トーマス・ヘンケル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH11134242A publication Critical patent/JPH11134242A/ja
Publication of JPH11134242A5 publication Critical patent/JPH11134242A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F5/00Methods or arrangements for data conversion without changing the order or content of the data handled
    • G06F5/06Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
    • G06F5/16Multiplexed systems, i.e. using two or more similar devices which are alternately accessed for enqueue and dequeue operations, e.g. ping-pong buffers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919Storing and outputting test patterns
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F5/00Methods or arrangements for data conversion without changing the order or content of the data handled
    • G06F5/06Methods or arrangements for data conversion without changing the order or content of the data handled for changing the speed of data flow, i.e. speed regularising or timing, e.g. delay lines, FIFO buffers; over- or underrun control therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919Storing and outputting test patterns
    • G01R31/31921Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dram (AREA)
  • Memory System (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
JP10248261A 1997-09-13 1998-09-02 メモリ手段にアクセスするための装置 Ceased JPH11134242A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP97115982A EP0864977B1 (en) 1997-09-13 1997-09-13 Memory latency compensation
EP97115982.7 1997-09-13

Publications (2)

Publication Number Publication Date
JPH11134242A true JPH11134242A (ja) 1999-05-21
JPH11134242A5 JPH11134242A5 (enExample) 2005-11-04

Family

ID=8227349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10248261A Ceased JPH11134242A (ja) 1997-09-13 1998-09-02 メモリ手段にアクセスするための装置

Country Status (4)

Country Link
US (1) US6351793B2 (enExample)
EP (1) EP0864977B1 (enExample)
JP (1) JPH11134242A (enExample)
DE (1) DE69700328T2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013062326A (ja) * 2011-09-12 2013-04-04 Canon Inc 描画装置及び物品の製造方法

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2829253A1 (fr) * 2001-08-31 2003-03-07 Koninkl Philips Electronics Nv Controle d'acces dynamique d'une fonction a ressource collective
DE10159165B4 (de) 2001-12-03 2007-02-08 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes
EP1255386B1 (en) 2001-12-05 2007-10-24 Agilent Technologies, Inc. Line equaliser for compensation of droop effect
DE60300141T2 (de) 2003-02-25 2005-11-03 Agilent Technologies, Inc., Palo Alto Aufspüren eines Signalübergangs
US7104346B2 (en) * 2003-03-25 2006-09-12 Schaffner Walter E Power wheelchair
DE60308844T2 (de) 2003-06-17 2007-03-01 Agilent Technologies, Inc., Palo Alto Sigma-Delta-Modulator mit Pulsbreitenmodulations-Ausgang
EP1600784A1 (en) 2004-05-03 2005-11-30 Agilent Technologies, Inc. Serial/parallel interface for an integrated circuit
DE602004017440D1 (de) 2004-06-24 2008-12-11 Verigy Pte Ltd Singapore Schnelle Synchronisierung einem Anzahl von digitale Takten
DE602004021178D1 (de) 2004-06-24 2009-07-02 Verigy Pte Ltd Singapore Taktsynthese pro Stift
ATE441120T1 (de) 2004-07-07 2009-09-15 Verigy Pte Ltd Singapore Auswertung eines ausgangssignals eines gerade geprüften bausteins
EP1624577B1 (en) 2004-08-06 2008-07-23 Verigy (Singapore) Pte. Ltd. Improved analog signal generation using a delta-sigma modulator
WO2006092173A1 (en) 2005-03-02 2006-09-08 Agilent Technologies, Inc. Analog signal test using a-priori information
DE602005009133D1 (de) 2005-03-11 2008-10-02 Verigy Pte Ltd Singapore Fehlererkennung in komprimierten Daten
EP1875650A1 (en) 2005-04-29 2008-01-09 Verigy (Singapore) Pte. Ltd. Communication circuit for a bi-directonal data transmission
WO2010054669A1 (en) 2008-11-11 2010-05-20 Verigy (Singapore) Pte.Ltd. Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5847741B2 (ja) * 1978-03-29 1983-10-24 日本電信電話株式会社 パタ−ン発生器
CA1251575A (en) * 1985-12-18 1989-03-21 A. Keith Jeffrey Automatic test system having a "true tester-per-pin" architecture
US5317718A (en) * 1990-03-27 1994-05-31 Digital Equipment Corporation Data processing system and method with prefetch buffers
JPH07253922A (ja) * 1994-03-14 1995-10-03 Texas Instr Japan Ltd アドレス生成回路
US5890207A (en) * 1996-11-27 1999-03-30 Emc Corporation High performance integrated cached storage device
US5890219A (en) * 1996-11-27 1999-03-30 Emc Corporation Redundant writing of data to cached storage system
US6112266A (en) * 1998-01-22 2000-08-29 Pc-Tel, Inc. Host signal processing modem using a software circular buffer in system memory and direct transfers of samples to maintain a communication signal

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013062326A (ja) * 2011-09-12 2013-04-04 Canon Inc 描画装置及び物品の製造方法

Also Published As

Publication number Publication date
US6351793B2 (en) 2002-02-26
DE69700328D1 (de) 1999-08-19
US20010013092A1 (en) 2001-08-09
EP0864977A1 (en) 1998-09-16
DE69700328T2 (de) 1999-11-04
EP0864977B1 (en) 1999-07-14

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