JPH1056657A - 測定回路 - Google Patents
測定回路Info
- Publication number
- JPH1056657A JPH1056657A JP9101748A JP10174897A JPH1056657A JP H1056657 A JPH1056657 A JP H1056657A JP 9101748 A JP9101748 A JP 9101748A JP 10174897 A JP10174897 A JP 10174897A JP H1056657 A JPH1056657 A JP H1056657A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- measurement
- signal
- signal processing
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 104
- 239000003990 capacitor Substances 0.000 claims abstract description 42
- 238000000034 method Methods 0.000 claims description 16
- 238000010586 diagram Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000002411 adverse Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19615745A DE19615745A1 (de) | 1996-04-20 | 1996-04-20 | Meßschaltung |
| DE19615745:5 | 1996-04-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1056657A true JPH1056657A (ja) | 1998-02-24 |
| JPH1056657A5 JPH1056657A5 (enExample) | 2005-03-17 |
Family
ID=7791914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9101748A Pending JPH1056657A (ja) | 1996-04-20 | 1997-04-18 | 測定回路 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6133949A (enExample) |
| EP (1) | EP0802422A3 (enExample) |
| JP (1) | JPH1056657A (enExample) |
| DE (1) | DE19615745A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4802626A (en) * | 1986-12-22 | 1989-02-07 | Hunter's Specialties, Inc. | Molded scent impregnated devices |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6870375B2 (en) * | 2002-07-01 | 2005-03-22 | Texas Instruments Incorporated | System and method for measuring a capacitance associated with an integrated circuit |
| DE10258299B4 (de) | 2002-12-13 | 2019-08-08 | Volkswagen Ag | Karosseriefronthaube für ein Kraftfahrzeug |
| CN102207522B (zh) * | 2011-04-01 | 2013-01-02 | 广州润芯信息技术有限公司 | 一种基于频率测量的rc常数测量方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1312239A (en) * | 1969-07-25 | 1973-04-04 | Mullard Ltd | Electrical circuit arrangements for converting a variable rate of pulse transmission into a related electrical output quantity |
| US3614634A (en) * | 1969-09-02 | 1971-10-19 | Texas Instruments Inc | Frequency conversion system |
| US3652872A (en) * | 1970-04-02 | 1972-03-28 | Us Air Force | Video bandwidth analyzer |
| US3697781A (en) * | 1970-11-12 | 1972-10-10 | Johnson Service Co | Frequency to voltage converter |
| US3839673A (en) * | 1971-06-07 | 1974-10-01 | Honeywell Inf Systems | Precise frequency measuring analog circuit |
| US3859512A (en) * | 1973-04-26 | 1975-01-07 | Karl R Ritzinger | Rate meter |
| US3813599A (en) * | 1973-06-04 | 1974-05-28 | Us Navy | Bandwidth measurement system |
| US4128808A (en) * | 1976-11-04 | 1978-12-05 | Sencore, Inc. | Channel frequency analyser |
| US4090133A (en) * | 1977-01-06 | 1978-05-16 | Bell Telephone Laboratories, Incorporated | Digital time interval sensor using a free running counter and a cycle counter with only the latter being reset at each event |
| GB1604678A (en) * | 1978-05-30 | 1981-12-16 | Indep Broadcasting Authority | Television systems |
| US4217524A (en) * | 1978-05-11 | 1980-08-12 | Bell Telephone Laboratories, Incorporated | Method and structure for generating representations of repetitive electrical waveforms |
| US4531193A (en) * | 1981-07-30 | 1985-07-23 | Fuji Electric Company, Ltd. | Measurement apparatus |
| JPS61130881A (ja) * | 1984-11-30 | 1986-06-18 | Nec Corp | 時間差測定回路 |
| US4720670A (en) * | 1986-12-23 | 1988-01-19 | International Business Machines Corporation | On chip performance predictor circuit |
| US4786861A (en) * | 1987-09-01 | 1988-11-22 | Sundstrand Data Control, Inc. | Frequency counting apparatus and method |
| JP3213941B2 (ja) * | 1990-06-05 | 2001-10-02 | セイコーエプソン株式会社 | 遅延測定用論理回路を備えた半導体装置 |
| US5181191A (en) * | 1991-11-27 | 1993-01-19 | Hughes Aircraft Company | Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations |
| TW255052B (enExample) * | 1992-11-03 | 1995-08-21 | Thomson Consumer Electronics | |
| US5574499A (en) * | 1993-05-10 | 1996-11-12 | Nec Corporation | Integrated circuit for testing a plurality of 1H memories |
| GB2281421B (en) * | 1993-08-23 | 1998-04-01 | Advanced Risc Mach Ltd | Integrated circuit |
-
1996
- 1996-04-20 DE DE19615745A patent/DE19615745A1/de not_active Withdrawn
-
1997
- 1997-04-11 EP EP97201093A patent/EP0802422A3/de not_active Withdrawn
- 1997-04-17 US US08/841,913 patent/US6133949A/en not_active Expired - Lifetime
- 1997-04-18 JP JP9101748A patent/JPH1056657A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4802626A (en) * | 1986-12-22 | 1989-02-07 | Hunter's Specialties, Inc. | Molded scent impregnated devices |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0802422A2 (de) | 1997-10-22 |
| EP0802422A3 (de) | 1999-04-07 |
| DE19615745A1 (de) | 1997-10-23 |
| US6133949A (en) | 2000-10-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20040415 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20040415 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20041126 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20041130 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20050419 |