JPH10508944A - 静電駆動式容量型トランスデューサ - Google Patents
静電駆動式容量型トランスデューサInfo
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- JPH10508944A JPH10508944A JP8516144A JP51614496A JPH10508944A JP H10508944 A JPH10508944 A JP H10508944A JP 8516144 A JP8516144 A JP 8516144A JP 51614496 A JP51614496 A JP 51614496A JP H10508944 A JPH10508944 A JP H10508944A
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Classifications
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- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B7/22—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
- G01D5/241—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes
- G01D5/2417—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes by varying separation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G7/00—Weighing apparatus wherein the balancing is effected by magnetic, electromagnetic, or electrostatic action, or by means not provided for in the preceding groups
- G01G7/06—Weighing apparatus wherein the balancing is effected by magnetic, electromagnetic, or electrostatic action, or by means not provided for in the preceding groups by electrostatic action
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
- G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
- G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
- G01L1/144—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors with associated circuitry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/36—DC mode
- G01Q60/366—Nanoindenters, i.e. wherein the indenting force is measured
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/005—Electromagnetic means
- G01N2203/0051—Piezoelectric means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
- G01N2203/0647—Image analysis
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/872—Positioner
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Radiology & Medical Imaging (AREA)
- Nanotechnology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Electromagnetism (AREA)
- Biochemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.力及び変位用高精度トランスデューサであって、 a.一対の容量型トランスデューサと、前記各トランスデューサが独立したド ライブ・プレート及び共有ピックアップ・プレートを有し、前記共有ピックアッ プ・プレートは複数の独立したドライブ・プレート間に配置されていることと、 b.力を遠位の物体に対して選択的に伝達すべくピックアップ・プレートを制 御する手段と を含むトランスデューサ。 2.前記ピックアップ・プレートを制御する手段は静電駆動を含む請求項1に記 載のトランスデューサ。 3.前記静電駆動は複数のドライブ・プレートのうちの1つに対して電圧を選択 的に印加することを含む請求項2に記載のトランスデューサ。 4.前記ピックアップ・プレートの位置を制御する手段は静電コントローラを有 する請求項1に記載のトランスデューサ。 5.前記静電コントローラは電圧を複数のドライブ・プレートのうちの1つに対 して選択的に印加することを含む請求項4に記載のトランスデューサ。 6.前記静電コントローラは電圧をドライブ・プレートに対して印加する選択的 に変更可能な電源を含む請求項5に記載のトランスデューサ。 7.前記静電コントローラは各ドライブ・プレートに対して電気的に接続されて いる請求項4に記載のトランスデューサ。 8.前記静電コントローラは電圧を各ドライブ・プレートに対して選択的に印加 する請求項7に記載のトランスデューサ。 9.a.遠位の物体及びピックアップ・プレート間で力を伝達する手段を含む請 求項1に記載のトランスデューサ。 10.前記力を伝達する手段はピックアップ・プレート及び遠位の物体にそれぞ れ当接する非導電性軸部を含む請求項9に記載のトランスデューサ。 11.前記ピックアップ・プレートを制御する手段はドライブ・プレートに対す るピックアップ・プレートの位置を制御する請求項1に記載のトランスデューサ 。 12.力または動作を検出または伝達し、さらには力、重量または位置を検出す る高精度トランスデューサであって、 a.一対の容量型トランスデューサと、前記各トランスデューサは独立したド ライブ・プレート及び共有ピックアップ・プレートを有し、前記共有ピックアッ プ・プレートは複数の独立したドライブ・プレート間に移動可能に配置されてい ることと、 b.ドライブ・プレートに対するピックアップ・プレートの移動を制御する手 段と、 c.ドライブ・プレートに対するピックアップ・プレートの位置に比例した出 力信号を形成すべく前記ドライブ・プレートに対するピックアップ・プレートの 位置に応答する手段と、 d.前記出力信号を監視する手段と を含むトランスデューサ。 13.前記ピックアップ・プレートの位置を制御する手段は静電駆動を含む請求 項12に記載のトランスデューサ。 14.前記静電駆動は複数のドライブ・プレートのうちの1つに対して電圧を選 択的に印加することを含む請求項13に記載のトランスデューサ。 15.前記監視する手段は、 a.信号を一対のドライブ・プレートに対して入力する手段 を含む請求項12に記載のトランスデューサ。 16.前記ドライブ・プレートに入力される信号は交流信号であり、一方のドラ イブ・プレートに入力される信号は他方のドライブ・プレートに入力される信号 に対して位相が180度ずれている請求項15に記載のトランスデューサ。 17.前記ピックアップ・プレートの位置を制御する手段は静電コントローラを 含み、前記静電コントローラは電圧を各ドライブ・プレートに対して選択的に印 加する請求項15に記載のトランスデューサ。 18.前記一対のドライブ・プレートに印加された信号の周波数は静電コントロ ーラによってドライブ・プレートに印加された電圧に対して高い請求項17に記 載のトランスデューサ。 19.前記監視する手段は前記台座の変位に比例した直流信号を形成すべく前記 出力信号を同期復調する請求項12に記載のトランスデューサ。 20.a.ピックアップ・プレートから離間した位置と、ピックアップ・プレー トとの間で力を伝達する手段を含む請求項12に記載のトランスデューサ。 21.顕微鏡試験システムに使用される力または動作を伝達し、さらには力、重 量または位置を検出する高解像度トランスデューサ・システムであって、 a.トランスデューサと、前記トランスデューサは、 i.一対の容量型トランスデューサと、前記各トランスデューサは独立した ドライブ・プレート及び共有ピックアップ・プレートを有し、前記共有ピックア ップ・プレートは複数の独立したドライブ・プレート間に配置されていることと 、 ii.遠位の位置及びピックアップ・プレート間で力を伝達する手段と を有することと、 b.ピックアップ・プレートを制御する手段と、前記ピックアップ・プレート を制御する手段はドライブ・プレートに対するピックアップ・プレートの位置を 制御する手段と、力を遠位の物体に伝達すべくピックアップ・プレートを制御す る手段とを有すること を含むトランスデューサ・システム。 22.a.前記一対のドライブ・プレートに対して信号を入力する手段と、 b.ドライブ・プレートに対するピックアップ・プレートの位置に比例したピ ックアップ・プレートからの出力信号を監視する手段と を含む請求項21に記載のトランスデューサ。 23.前記ピックアップ・プレートの位置を制御する手段は静電駆動を有する請 求項21に記載のトランスデューサ。 24.前記ピックアップ・プレートの位置を制御する手段は静電コントローラを 有する請求項21に記載のトランスデューサ。 25.前記静電コントローラは電圧を複数のドライブ・プレートのうちの1つに 対して選択的に印加する選択的に変更可能な電源を含む請求項24に記載のトラ ンスデューサ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/337,741 US5576483A (en) | 1993-10-01 | 1994-11-14 | Capacitive transducer with electrostatic actuation |
US337,741 | 1994-11-14 | ||
PCT/US1995/014325 WO1996015423A1 (en) | 1994-11-14 | 1995-11-02 | Capacitive transducer with electrostatic actuation |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH10508944A true JPH10508944A (ja) | 1998-09-02 |
JP4095669B2 JP4095669B2 (ja) | 2008-06-04 |
Family
ID=23321793
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51614496A Expired - Lifetime JP4095669B2 (ja) | 1994-11-14 | 1995-11-02 | 静電駆動式容量型トランスデューサ |
Country Status (6)
Country | Link |
---|---|
US (1) | US5576483A (ja) |
EP (1) | EP0792437B1 (ja) |
JP (1) | JP4095669B2 (ja) |
AU (1) | AU4102496A (ja) |
DE (1) | DE69530784T2 (ja) |
WO (1) | WO1996015423A1 (ja) |
Cited By (2)
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JP2003505675A (ja) * | 1999-07-15 | 2003-02-12 | オートモーティブ システムズ ラボラトリー インコーポレーテッド | 近接センサ |
JP2016502667A (ja) * | 2012-11-28 | 2016-01-28 | ハイジトロン・インコーポレーテッドHysitron Incorporated | 定量的ナノインデンテーション用マイクロ加工櫛形駆動機構 |
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US6820493B1 (en) * | 1999-10-06 | 2004-11-23 | Wayne Bonin | Precision multi-dimensional capacitive transducer |
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-
1994
- 1994-11-14 US US08/337,741 patent/US5576483A/en not_active Expired - Lifetime
-
1995
- 1995-11-02 AU AU41024/96A patent/AU4102496A/en not_active Abandoned
- 1995-11-02 JP JP51614496A patent/JP4095669B2/ja not_active Expired - Lifetime
- 1995-11-02 EP EP95939061A patent/EP0792437B1/en not_active Expired - Lifetime
- 1995-11-02 WO PCT/US1995/014325 patent/WO1996015423A1/en active IP Right Grant
- 1995-11-02 DE DE69530784T patent/DE69530784T2/de not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003505675A (ja) * | 1999-07-15 | 2003-02-12 | オートモーティブ システムズ ラボラトリー インコーポレーテッド | 近接センサ |
JP2016502667A (ja) * | 2012-11-28 | 2016-01-28 | ハイジトロン・インコーポレーテッドHysitron Incorporated | 定量的ナノインデンテーション用マイクロ加工櫛形駆動機構 |
Also Published As
Publication number | Publication date |
---|---|
EP0792437A4 (en) | 1998-11-18 |
DE69530784D1 (de) | 2003-06-18 |
WO1996015423A1 (en) | 1996-05-23 |
AU4102496A (en) | 1996-06-06 |
EP0792437B1 (en) | 2003-05-14 |
DE69530784T2 (de) | 2004-01-29 |
US5576483A (en) | 1996-11-19 |
EP0792437A1 (en) | 1997-09-03 |
JP4095669B2 (ja) | 2008-06-04 |
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