AU4102496A - Capacitive transducer with electrostatic actuation - Google Patents

Capacitive transducer with electrostatic actuation

Info

Publication number
AU4102496A
AU4102496A AU41024/96A AU4102496A AU4102496A AU 4102496 A AU4102496 A AU 4102496A AU 41024/96 A AU41024/96 A AU 41024/96A AU 4102496 A AU4102496 A AU 4102496A AU 4102496 A AU4102496 A AU 4102496A
Authority
AU
Australia
Prior art keywords
capacitive transducer
electrostatic actuation
actuation
electrostatic
capacitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU41024/96A
Inventor
Wayne A Bonin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bruker Nano Inc
Original Assignee
Hysitron Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hysitron Inc filed Critical Hysitron Inc
Publication of AU4102496A publication Critical patent/AU4102496A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/22—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
    • G01D5/241—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes
    • G01D5/2417—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes by varying separation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G7/00—Weighing apparatus wherein the balancing is effected by magnetic, electromagnetic, or electrostatic action, or by means not provided for in the preceding groups
    • G01G7/06—Weighing apparatus wherein the balancing is effected by magnetic, electromagnetic, or electrostatic action, or by means not provided for in the preceding groups by electrostatic action
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • G01L1/144—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors with associated circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/36—DC mode
    • G01Q60/366—Nanoindenters, i.e. wherein the indenting force is measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/005—Electromagnetic means
    • G01N2203/0051—Piezoelectric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647—Image analysis
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/872—Positioner

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
AU41024/96A 1994-11-14 1995-11-02 Capacitive transducer with electrostatic actuation Abandoned AU4102496A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/337,741 US5576483A (en) 1993-10-01 1994-11-14 Capacitive transducer with electrostatic actuation
PCT/US1995/014325 WO1996015423A1 (en) 1994-11-14 1995-11-02 Capacitive transducer with electrostatic actuation
US337741 1999-06-22

Publications (1)

Publication Number Publication Date
AU4102496A true AU4102496A (en) 1996-06-06

Family

ID=23321793

Family Applications (1)

Application Number Title Priority Date Filing Date
AU41024/96A Abandoned AU4102496A (en) 1994-11-14 1995-11-02 Capacitive transducer with electrostatic actuation

Country Status (6)

Country Link
US (1) US5576483A (en)
EP (1) EP0792437B1 (en)
JP (1) JP4095669B2 (en)
AU (1) AU4102496A (en)
DE (1) DE69530784T2 (en)
WO (1) WO1996015423A1 (en)

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US5661235A (en) * 1993-10-01 1997-08-26 Hysitron Incorporated Multi-dimensional capacitive transducer
US6026677A (en) * 1993-10-01 2000-02-22 Hysitron, Incorporated Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system
US5777226A (en) * 1994-03-28 1998-07-07 I/O Sensors, Inc. Sensor structure with L-shaped spring legs
US5801472A (en) * 1995-08-18 1998-09-01 Hitchi, Ltd. Micro-fabricated device with integrated electrostatic actuator
CA2207354C (en) * 1996-10-07 2004-09-28 Board Of Control Of Michigan Technological University Apparatus and method for determining the dynamic indentation hardness of materials
US5907102A (en) * 1997-04-15 1999-05-25 Florida State University System and method for performing tensile stress-strain and fatigue tests
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US6664126B1 (en) * 1999-09-03 2003-12-16 University Of Maryland, College Park Process for fabrication of 3-dimensional micromechanisms
US6820493B1 (en) * 1999-10-06 2004-11-23 Wayne Bonin Precision multi-dimensional capacitive transducer
DE60011031T2 (en) * 2000-02-01 2005-06-23 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Optical column for particle beam device
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KR100746768B1 (en) * 2002-03-19 2007-08-06 주식회사 엘지이아이 Apparatus for writing and reading data by using cantilever
US7046497B1 (en) 2003-05-15 2006-05-16 Wayne Bonin Multi-layer capacitive transducer
US8189300B1 (en) * 2003-05-15 2012-05-29 Wayne Allen Bonin Multi-layer capacitive transducer with mult-dimension operation
US7277267B1 (en) 2004-05-17 2007-10-02 Wayne Allen Bonin Multi-layer capacitive transducer
EP2040265B1 (en) 2004-04-14 2014-11-05 Bruker Nano, Inc. Method and apparatus for obtaining quantitative measurements using a probe based instrument
US7107694B2 (en) * 2004-06-29 2006-09-19 Hysitron, Incorporated Method for observation of microstructural surface features in heterogeneous materials
DE102005003830B4 (en) 2005-01-25 2013-02-14 Asmec Advanced Surface Mechanics Gmbh Device for highly accurate generation and measurement of forces and displacements
US8220318B2 (en) * 2005-06-17 2012-07-17 Georgia Tech Research Corporation Fast microscale actuators for probe microscopy
US7798011B2 (en) * 2006-02-08 2010-09-21 Hysitron, Inc. Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy
US7685869B2 (en) 2006-03-13 2010-03-30 Asylum Research Corporation Nanoindenter
US7607342B2 (en) * 2006-04-26 2009-10-27 Vecco Instruments, Inc. Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument
US8266969B2 (en) * 2006-06-07 2012-09-18 Case Western Reserve University Method and system for measuring properties of microstructures and nanostructures
US7898266B2 (en) * 2008-06-04 2011-03-01 Seagate Technology Llc Probe with electrostatic actuation and capacitive sensor
US9335240B2 (en) 2008-07-03 2016-05-10 Hysitron Incorporated Method of measuring an interaction force
US8161803B2 (en) * 2008-07-03 2012-04-24 Hysitron Incorporated Micromachined comb drive for quantitative nanoindentation
KR101739242B1 (en) * 2008-07-14 2017-05-23 애브리 데니슨 코포레이션 Apparatus and process for cutting adhesive labels
US8798956B2 (en) * 2008-09-30 2014-08-05 Apple Inc. Method and apparatus for surface sensing input device
US8186221B2 (en) * 2009-03-24 2012-05-29 Freescale Semiconductor, Inc. Vertically integrated MEMS acceleration transducer
US9194727B2 (en) 2010-11-24 2015-11-24 Hysitron, Inc. Mechanical testing instruments including onboard data
US8800371B2 (en) 2012-03-08 2014-08-12 Industrial Technology Research Institute Electrostatic force generator and force measurement system and accelerometer having the same
US20150075264A1 (en) * 2012-03-27 2015-03-19 Hysitron, Inc. Microscope objective mechanical testing instrument
US8984950B2 (en) * 2012-04-20 2015-03-24 Rosemount Aerospace Inc. Separation mode capacitors for sensors
EP2926111B1 (en) * 2012-11-28 2022-07-27 Bruker Nano, Inc. Micromachined comb drive for quantitative nanoindentation
CN104020040A (en) * 2014-06-23 2014-09-03 成都东华卓越科技有限公司 Pressurizing plate
US9752900B2 (en) * 2015-07-10 2017-09-05 Wyrobek International, Inc. Multi-plate capacitive transducer
DE102016111909B4 (en) * 2016-06-29 2020-08-13 Infineon Technologies Ag Micromechanical structure and method of making it
RU2723971C1 (en) * 2020-01-28 2020-06-18 Общество С Ограниченной Ответственностью "Конструкторское Бюро "Дорс" (Ооо "Кб "Дорс") Electrostatic sensor for controlling a movable thin object
WO2022258085A1 (en) 2021-07-13 2022-12-15 Ceske Vysoke Uceni Technicke V Praze A method of examining a sample in a microscope equipped with at least one scanning tunneling tip

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Also Published As

Publication number Publication date
JP4095669B2 (en) 2008-06-04
DE69530784T2 (en) 2004-01-29
DE69530784D1 (en) 2003-06-18
EP0792437A1 (en) 1997-09-03
EP0792437A4 (en) 1998-11-18
WO1996015423A1 (en) 1996-05-23
EP0792437B1 (en) 2003-05-14
US5576483A (en) 1996-11-19
JPH10508944A (en) 1998-09-02

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