JPH10320810A - 半導体レーザ装置および光ピックアップ装置 - Google Patents

半導体レーザ装置および光ピックアップ装置

Info

Publication number
JPH10320810A
JPH10320810A JP9131970A JP13197097A JPH10320810A JP H10320810 A JPH10320810 A JP H10320810A JP 9131970 A JP9131970 A JP 9131970A JP 13197097 A JP13197097 A JP 13197097A JP H10320810 A JPH10320810 A JP H10320810A
Authority
JP
Japan
Prior art keywords
light
semiconductor laser
prism
semiconductor substrate
light receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9131970A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10320810A5 (enExample
Inventor
Kazuo Higashiura
一雄 東浦
Yoshio Hayashi
善雄 林
Tadashi Takeda
正 武田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Instruments Corp
Original Assignee
Sankyo Seiki Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sankyo Seiki Manufacturing Co Ltd filed Critical Sankyo Seiki Manufacturing Co Ltd
Priority to JP9131970A priority Critical patent/JPH10320810A/ja
Priority to US09/082,385 priority patent/US6184512B1/en
Priority to CNB981092233A priority patent/CN1154989C/zh
Publication of JPH10320810A publication Critical patent/JPH10320810A/ja
Publication of JPH10320810A5 publication Critical patent/JPH10320810A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0477—Prisms, wedges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Optical Head (AREA)
JP9131970A 1997-05-22 1997-05-22 半導体レーザ装置および光ピックアップ装置 Pending JPH10320810A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP9131970A JPH10320810A (ja) 1997-05-22 1997-05-22 半導体レーザ装置および光ピックアップ装置
US09/082,385 US6184512B1 (en) 1997-05-22 1998-05-20 Semiconductor laser apparatus and optical pickup apparatus
CNB981092233A CN1154989C (zh) 1997-05-22 1998-05-22 半导体激光装置和光拾取装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9131970A JPH10320810A (ja) 1997-05-22 1997-05-22 半導体レーザ装置および光ピックアップ装置

Publications (2)

Publication Number Publication Date
JPH10320810A true JPH10320810A (ja) 1998-12-04
JPH10320810A5 JPH10320810A5 (enExample) 2005-03-03

Family

ID=15070491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9131970A Pending JPH10320810A (ja) 1997-05-22 1997-05-22 半導体レーザ装置および光ピックアップ装置

Country Status (3)

Country Link
US (1) US6184512B1 (enExample)
JP (1) JPH10320810A (enExample)
CN (1) CN1154989C (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004064051A1 (ja) * 2003-01-14 2004-07-29 Sony Corporation 半導体集積装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6657927B1 (en) * 1998-08-04 2003-12-02 Hitachi Maxell, Ltd. Optical head and apparatus provided therewith
SG108878A1 (en) * 2001-10-30 2005-02-28 Semiconductor Energy Lab Laser irradiation method and laser irradiation apparatus, and method for fabricating semiconductor device
JP6790364B2 (ja) * 2016-01-25 2020-11-25 三菱電機株式会社 光半導体装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5804814A (en) * 1994-05-20 1998-09-08 Musha; Toru Optical pick-up head and integrated type optical unit for use in optical pick-up head
JPH01273238A (ja) * 1988-04-25 1989-11-01 Sony Corp 光学ヘッド装置
JP3140085B2 (ja) 1991-05-28 2001-03-05 松下電子工業株式会社 半導体レーザ装置
US5350917A (en) * 1991-12-27 1994-09-27 Sony Corporation Opto-magnetic recording polarization optical apparatus including a laser diode and a light absorbing film
US5727111A (en) * 1995-06-19 1998-03-10 Sony Corporation Optical pick-up and light detecting cover therefor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004064051A1 (ja) * 2003-01-14 2004-07-29 Sony Corporation 半導体集積装置
US7525895B2 (en) 2003-01-14 2009-04-28 Sony Corporation Semiconductor integrated device

Also Published As

Publication number Publication date
CN1154989C (zh) 2004-06-23
US6184512B1 (en) 2001-02-06
CN1202694A (zh) 1998-12-23

Similar Documents

Publication Publication Date Title
US6747939B2 (en) Semiconductor laser device and optical pickup device using the same
KR100370790B1 (ko) 광헤드장치
KR100831138B1 (ko) 광학적 정보 기록 재생장치
JP2000030288A (ja) 光ピックアップ素子
JP2001338432A (ja) 光ピックアップ装置
JPH10320810A (ja) 半導体レーザ装置および光ピックアップ装置
JP2877044B2 (ja) 光ヘッド装置
US7426172B2 (en) Optical module and optical pickup including the same
JPH01149237A (ja) ホログラム光ヘッド
JPH097191A (ja) 光ピックアップ装置
JP3162167B2 (ja) 光ヘッド
JPH1027374A (ja) 半導体レーザモジュール
JP2000076690A (ja) 光学ヘッド装置
JP3366527B2 (ja) 光学ヘッド装置
KR19990049998A (ko) 광량조절형 액정판 듀얼 포커스 광픽업장치
JPH10269613A (ja) 光ヘッド装置
JPH11242828A (ja) 光学装置および光学ピックアップ装置
JPH11354889A (ja) 光学装置
JPH0512770B2 (enExample)
KR19990049993A (ko) 광량조절을 이용한 듀얼 포커스 광픽업장치
KR20030000104A (ko) 광디스크 판별 방법 및 그를 적용한 광디스크 시스템
JPH11203707A (ja) 半導体集積発光装置および光学ピックアップ装置
JPH10208284A (ja) 光ヘッド
JPH11312334A (ja) 光学ユニットおよびこれを用いる光学ピックアップ装置
KR19990050001A (ko) 광투과반사를 이용한 듀얼 포커스 광픽업장치

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040329

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040329

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20041104

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20041112

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050111

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20060629