CN1154989C - 半导体激光装置和光拾取装置 - Google Patents

半导体激光装置和光拾取装置 Download PDF

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Publication number
CN1154989C
CN1154989C CNB981092233A CN98109223A CN1154989C CN 1154989 C CN1154989 C CN 1154989C CN B981092233 A CNB981092233 A CN B981092233A CN 98109223 A CN98109223 A CN 98109223A CN 1154989 C CN1154989 C CN 1154989C
Authority
CN
China
Prior art keywords
light
photodetector
prism
semiconductor chip
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB981092233A
Other languages
English (en)
Chinese (zh)
Other versions
CN1202694A (zh
Inventor
东浦一雄
林善雄
武田正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Instruments Corp
Original Assignee
Sankyo Seiki Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sankyo Seiki Manufacturing Co Ltd filed Critical Sankyo Seiki Manufacturing Co Ltd
Publication of CN1202694A publication Critical patent/CN1202694A/zh
Application granted granted Critical
Publication of CN1154989C publication Critical patent/CN1154989C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0477—Prisms, wedges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Optical Head (AREA)
CNB981092233A 1997-05-22 1998-05-22 半导体激光装置和光拾取装置 Expired - Fee Related CN1154989C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP131970/97 1997-05-22
JP9131970A JPH10320810A (ja) 1997-05-22 1997-05-22 半導体レーザ装置および光ピックアップ装置
JP131970/1997 1997-05-22

Publications (2)

Publication Number Publication Date
CN1202694A CN1202694A (zh) 1998-12-23
CN1154989C true CN1154989C (zh) 2004-06-23

Family

ID=15070491

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB981092233A Expired - Fee Related CN1154989C (zh) 1997-05-22 1998-05-22 半导体激光装置和光拾取装置

Country Status (3)

Country Link
US (1) US6184512B1 (enExample)
JP (1) JPH10320810A (enExample)
CN (1) CN1154989C (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6657927B1 (en) * 1998-08-04 2003-12-02 Hitachi Maxell, Ltd. Optical head and apparatus provided therewith
SG108878A1 (en) * 2001-10-30 2005-02-28 Semiconductor Energy Lab Laser irradiation method and laser irradiation apparatus, and method for fabricating semiconductor device
JP4196266B2 (ja) * 2003-01-14 2008-12-17 ソニー株式会社 半導体集積装置
JP6790364B2 (ja) * 2016-01-25 2020-11-25 三菱電機株式会社 光半導体装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5804814A (en) * 1994-05-20 1998-09-08 Musha; Toru Optical pick-up head and integrated type optical unit for use in optical pick-up head
JPH01273238A (ja) * 1988-04-25 1989-11-01 Sony Corp 光学ヘッド装置
JP3140085B2 (ja) 1991-05-28 2001-03-05 松下電子工業株式会社 半導体レーザ装置
US5350917A (en) * 1991-12-27 1994-09-27 Sony Corporation Opto-magnetic recording polarization optical apparatus including a laser diode and a light absorbing film
US5727111A (en) * 1995-06-19 1998-03-10 Sony Corporation Optical pick-up and light detecting cover therefor

Also Published As

Publication number Publication date
US6184512B1 (en) 2001-02-06
JPH10320810A (ja) 1998-12-04
CN1202694A (zh) 1998-12-23

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Legal Events

Date Code Title Description
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: NIDEC SANKYO CORP.

Free format text: FORMER NAME OR ADDRESS: SANKYO SEIKI MFG. SEISAKUSHO K.K.

CP01 Change in the name or title of a patent holder

Address after: Nagano

Patentee after: Sankyo Seiki Seisakusho KK

Address before: Nagano

Patentee before: Sankyo Seiki Manufacturing Co., Ltd.

C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20040623