JPH10277899A - End face polishing machine - Google Patents

End face polishing machine

Info

Publication number
JPH10277899A
JPH10277899A JP9081237A JP8123797A JPH10277899A JP H10277899 A JPH10277899 A JP H10277899A JP 9081237 A JP9081237 A JP 9081237A JP 8123797 A JP8123797 A JP 8123797A JP H10277899 A JPH10277899 A JP H10277899A
Authority
JP
Japan
Prior art keywords
glass substrate
polishing
rotating shaft
cassette type
face
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9081237A
Other languages
Japanese (ja)
Other versions
JP3011129B2 (en
Inventor
Hitoshi Yoshida
仁 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP9081237A priority Critical patent/JP3011129B2/en
Priority to KR1019980011241A priority patent/KR100304782B1/en
Publication of JPH10277899A publication Critical patent/JPH10277899A/en
Application granted granted Critical
Publication of JP3011129B2 publication Critical patent/JP3011129B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

Abstract

PROBLEM TO BE SOLVED: To treat plural sheets of glass boards in a lump by installing a grinding wheel part multistageably installed with plural concave grinding wheels, having the central part of a polishing surface sunken so as to contact with each face of these plural glass substrates held by a cassette type stage. SOLUTION: Those of width adjustments of a cassette type stage 2 and position adjustments of a turning shaft 9 are carried out according to the size of a glass substrate 1 and the stock removal of face polishing. In addition, a position is altered to a polishing position by a turning shaft positioning part 5 and thereby the positioned turning shaft 9 is rotated at a rotational speed adjusted to grinding wheel polishing conditions. Four sheets of the glass substrate 1 are mounted on the cassette type stage 2 and, after holding by suction is carried out, the cassette type stage 2 is moved at an optional speed in space between two grinding wheel parts 4, and thus a polishing process takes place. At the time of a size alteration of the glass substrate 1, width of the cassette type stage 2 and a position of the turning shaft 9 are automatically adjusted each.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、例えばカラー液晶
パネル等に用いられるガラス基板の端面を研磨する端面
研磨機に関し、特に多段に配置された凹型砥石およびカ
セット型ステージに載置された複数のガラス基板の端面
を一括して研磨処理する機構を用いた端面研磨機に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an end face polishing machine for polishing an end face of a glass substrate used for, for example, a color liquid crystal panel or the like, and more particularly to a plurality of concave grindstones arranged in multiple stages and a plurality of cassettes mounted on a cassette type stage. The present invention relates to an end face polishing machine using a mechanism for simultaneously polishing end faces of a glass substrate.

【0002】[0002]

【従来の技術】端面研磨機による研磨が必要な背景とし
て、第1に、カラー液晶パネル製造工程において、パタ
ーニングされたガラス基板に配向処理等を行う前にガラ
ス基板を分断する場合がある。分断後のガラス基板端面
は鋭利になっており、ガラス基板搬送時に用いられる搬
送ガイド等を傷つけ、発塵し、ガラス基板に載ると配向
不良等を発生させる場合がある。また、鋭利なガラス基
板端面より欠けが発生しても同様な不良が発生すること
が考えられる。第2に、ガラス基板外形で位置決めを行
う際、ガラス基板外形が高精度に整形されていないと位
置決め不良が発生する恐れがある。
2. Description of the Related Art First, there is a case where a glass substrate is divided before a patterned glass substrate is subjected to an alignment treatment or the like in a color liquid crystal panel manufacturing process as a background that requires polishing by an end face polishing machine. The end face of the glass substrate after the cutting is sharp, which may damage a transfer guide or the like used in transferring the glass substrate, generate dust, and cause poor alignment or the like when placed on the glass substrate. Further, it is conceivable that similar defects occur even if chipping occurs from the sharp glass substrate end face. Second, when positioning is performed using the outer shape of the glass substrate, poor positioning may occur if the outer shape of the glass substrate is not accurately shaped.

【0003】ここで、従来のガラス基板の端面研磨機の
例を図5、図6を用いて説明する。この端面研磨機は、
図5に示すように、ガラス基板1を載置して2つのカッ
プ型砥石20間に搬送するステージ19と、端面研磨後
のテーパ面とカップ型砥石20底面の研磨面が平行にな
るように4個所に取り付けられたカップ型砥石20と、
カップ型砥石20をテーパ面と水平に回転させるための
回転機構15を備えている。
Here, an example of a conventional glass substrate end face polishing machine will be described with reference to FIGS. 5 and 6. FIG. This end face polishing machine
As shown in FIG. 5, a stage 19 on which the glass substrate 1 is placed and transported between two cup-shaped grindstones 20 is set so that the tapered surface after the end face polishing and the polished surface of the bottom surface of the cup-shaped grindstone 20 are parallel. A cup-shaped whetstone 20 attached to four places,
A rotation mechanism 15 for rotating the cup-type grindstone 20 horizontally with the tapered surface is provided.

【0004】この端面研磨機の第1の欠点は、枚葉で研
磨処理が行われるため、研磨処理に時間を要し、大量の
ガラス基板を処理する場合には装置を複数台設置しなけ
ればならない場合がある、という点である。また、第2
の欠点は、ガラス基板のサイズが変わった場合、ガラス
基板1のサイズに合わせてステージ19を交換する必要
があり、ステージ交換および交換後の研磨量調整等の作
業によって装置の稼働率が低下する点である。また、第
3の欠点は、カップ型砥石の底面を使用して研磨を行う
ため、ガラス基板端面の研磨形状が図6に示すような台
形状(C面取り)の加工しか行うことができず、切断面
17の加工および円弧形状(R面取り)加工を行うこと
ができない点である。このため、研磨後の外形形成が行
えず、切断時のテーパ形状を補正することができない。
また、面取り量がガラス基板の厚さに対して多くなった
場合、研磨後、ガラス基板の端面形状が図6に示すよう
に鋭利になり、ガラス基板端部が割れやすくなり、割れ
が発生した場合、装置の稼動に悪影響を及ぼす場合があ
る。
[0004] The first disadvantage of this end face polishing machine is that since the polishing process is performed on a single wafer, it takes a long time for the polishing process. When processing a large number of glass substrates, it is necessary to install a plurality of apparatuses. The point is that it may not be. Also, the second
The disadvantage of this is that when the size of the glass substrate changes, the stage 19 needs to be replaced in accordance with the size of the glass substrate 1, and the operation rate of the apparatus is reduced by operations such as stage replacement and adjustment of the polishing amount after the replacement. Is a point. The third disadvantage is that since the polishing is performed using the bottom surface of the cup-shaped grindstone, the polishing shape of the end surface of the glass substrate can be processed only in a trapezoidal shape (C chamfering) as shown in FIG. The point is that machining of the cut surface 17 and arc shape (R chamfering) machining cannot be performed. Therefore, the outer shape cannot be formed after polishing, and the tapered shape at the time of cutting cannot be corrected.
In addition, when the chamfer amount became large with respect to the thickness of the glass substrate, after polishing, the end surface shape of the glass substrate became sharp as shown in FIG. In this case, the operation of the device may be adversely affected.

【0005】次に、従来のガラス基板の切断面取り機の
例として、特開昭62−100440号公報に開示され
た装置を図7、図8を参照して説明する。この装置は、
図7に示すように、ガラス基板1を載置し凸型砥石14
上に搬送する支持台12と、支持台12の上下に配置し
た切断線となる切り込み加工および面取り加工を行うV
字状の凸部を有した凸型砥石14と、凸型砥石14を垂
直に回転させるための回転機構15、上下の凸型砥石1
4を切断線13と同一垂直面上に位置決めを行い凸型砥
石14をガラス基板1に接触させるための調節機構16
を備えており、研磨後に切断線13に曲げ応力を加え、
切断を行う。通常、曲げ応力は人手により加えられる。
Next, as an example of a conventional glass substrate cutting and chamfering machine, an apparatus disclosed in Japanese Patent Application Laid-Open No. Sho 62-100440 will be described with reference to FIGS. This device is
As shown in FIG. 7, the glass substrate 1 is placed and the convex whetstone 14
The support table 12 to be transported upward, and a V for performing a cutting process and a chamfering process as cutting lines arranged above and below the support table 12.
Convex whetstone 14 having a character-shaped convex portion, a rotation mechanism 15 for rotating the convex whetstone 14 vertically, and an upper and lower convex whetstone 1
4 is positioned on the same vertical plane as the cutting line 13 and an adjusting mechanism 16 for bringing the convex grindstone 14 into contact with the glass substrate 1
And apply bending stress to the cutting line 13 after polishing,
Make a cut. Usually, bending stress is applied manually.

【0006】ガラス基板1の切断研磨は、ガラス基板1
の切断線13に合わせて位置調整を行った凸型砥石14
間へガラス基板1を載置した支持台12を切断線13上
に凸型砥石14が接触するように移動させ、ガラス基板
1にV溝を対向形成し、V溝に曲げ応力を加えて分断す
る。分断されたガラス基板1は、V溝の中心部から切断
され、V溝のテーパ部分が面取り形状となる。この装置
を利用した場合、面取り部となるV溝と切断線13が一
括処理されるため、わずかながら切断研磨処理時間を短
縮することができると考えられる。
The cutting and polishing of the glass substrate 1 is performed by
Convex whetstone 14 whose position has been adjusted to the cutting line 13
The support 12 on which the glass substrate 1 is placed is moved so that the convex grindstone 14 is in contact with the cutting line 13, a V-groove is formed on the glass substrate 1, and a bending stress is applied to the V-groove to divide it. I do. The divided glass substrate 1 is cut from the center of the V groove, and the tapered portion of the V groove has a chamfered shape. When this apparatus is used, it is considered that the V-groove serving as a chamfered portion and the cutting line 13 are collectively processed, so that the cutting and polishing processing time can be slightly reduced.

【0007】しかしながら、以下のような欠点も考えら
れる。この装置の第1の欠点は、枚葉処理を行うため、
切断研磨処理に長時間を要し、大量に処理する場合、装
置を複数台設置しなければならないということである。
また、第2の欠点として、研磨処理によるV溝を切断線
13として分割するため、切断のためのクラックの進行
が少なく、切断時の曲げ応力のバラツキが発生した場
合、切断不良となり、装置の稼動および製品の品質に悪
影響を及ぼす場合があるという点である。第3の欠点と
して、研磨処理を行った後に切断を行うため、図8に示
す切断面17の研磨が行われない。このため、図8に示
すように、切断時に発生する微小クラック18によりガ
ラス剥がれが発生し、ガラス基板搬送時のトラブルの原
因となる場合がある。また、上下の凸型砥石14の位置
がずれた場合、切断面17が図8に示すようにテーパ状
になるが、切断面17の研磨処理も行われないため、ガ
ラス基板1端面形状を補正することができず、製品の品
質に悪影響を及ぼす場合がある。
However, the following disadvantages are also considered. The first disadvantage of this device is that it performs single-wafer processing,
This means that a long time is required for the cutting and polishing process, and when a large amount of processing is performed, a plurality of apparatuses must be installed.
Further, as a second disadvantage, since the V-groove formed by the polishing process is divided as the cutting line 13, cracks for cutting are less likely to progress, and if the bending stress at the time of cutting varies, a cutting failure occurs, and the device becomes defective. The point is that operation and product quality may be adversely affected. As a third disadvantage, since the cutting is performed after the polishing process, the cut surface 17 shown in FIG. 8 is not polished. For this reason, as shown in FIG. 8, glass peeling may occur due to minute cracks 18 generated at the time of cutting, which may cause a trouble during glass substrate transfer. When the position of the upper and lower convex grindstones 14 is shifted, the cut surface 17 is tapered as shown in FIG. 8, but the polishing of the cut surface 17 is not performed, so that the shape of the end surface of the glass substrate 1 is corrected. And may adversely affect product quality.

【0008】[0008]

【発明が解決しようとする課題】上記従来の端面研磨機
に関する第1の課題は、研磨処理に時間が必要となるこ
とである。この理由として、カップ型砥石を使用した処
理では研磨面に対して斜め上下方向よりカップ型砥石の
底面が接触するため、一辺の研磨に2軸が必要であり、
ガラス基板を複数枚多段に重ねるバッチ処理を行うこと
ができないためである。
A first problem with the conventional end face polishing machine is that the polishing process requires time. For this reason, in the processing using the cup-type grindstone, since the bottom surface of the cup-type grindstone comes in contact with the polishing surface obliquely from above and below, two axes are required for polishing one side,
This is because batch processing in which a plurality of glass substrates are stacked in multiple stages cannot be performed.

【0009】第2の課題は、ステージにガラス基板を載
置してガラス基板を処理する際、ガラス基板のサイズ変
更によりステージ交換および装置調整が必要となること
である。この理由として、ステージの幅が固定であるた
め、ガラス基板のサイズによっては安定的な支持ができ
ず、加工困難となるためである。
A second problem is that when a glass substrate is processed by placing the glass substrate on a stage, the stage needs to be replaced and the apparatus adjusted by changing the size of the glass substrate. The reason for this is that, since the width of the stage is fixed, stable support is not possible depending on the size of the glass substrate, which makes processing difficult.

【0010】第3の課題は、ガラス基板の端面形状が台
形状の研磨形態しか処理ができず、研磨後の形状が鋭利
になる場合がある点である。この理由として、研磨用に
カップ型砥石を使用し、その底辺部の平坦な面を研磨用
として回転させて研磨処理を行うため、ガラス基板の端
面処理が行われず、研磨面自体も平坦な形状にしか加工
できないためである。
A third problem is that the polishing can be performed only in a polishing mode in which the end face of the glass substrate is trapezoidal, and the shape after polishing may be sharp. The reason for this is that a cup-shaped grindstone is used for polishing, and the flat surface at the bottom is rotated for polishing to perform the polishing process. Therefore, the end surface processing of the glass substrate is not performed, and the polished surface itself has a flat shape. This is because it can only be processed.

【0011】本発明は、上記の課題を解決するためにな
されたものであって、複数枚のガラス基板の一括処理が
行え、異なるサイズのガラス基板にも容易に対応するこ
とで生産性が向上するとともに、良好な端面研磨形状を
得ることができる端面研磨機を提供することを目的とす
る。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and can perform a batch processing of a plurality of glass substrates, and can improve productivity by easily coping with glass substrates of different sizes. It is another object of the present invention to provide an end face polishing machine capable of obtaining a good end face polishing shape.

【0012】[0012]

【課題を解決するための手段】上記の目的を達成するた
めに、本発明の端面研磨機は、矩形のガラス基板を保持
する基板受け部の幅がガラス基板のサイズに合わせて自
動調節可能とされ、複数の基板受け部によって複数枚の
ガラス基板を多段に収納するカセット型ステージと、こ
のカセット型ステージに保持された複数枚のガラス基板
の端面と接触するように研磨面の中央部が窪んだ複数の
凹型砥石が多段に設けられた砥石部と、この砥石部が取
り付けられ、ガラス基板の2辺を処理するためにカセッ
ト型ステージの両側に配置された第1の回転軸と、ガラ
ス基板の幅と研磨量に合わせて第1の回転軸を自動的に
移動させ、位置固定させる回転軸位置決め部を具備した
ことを特徴とするものである。
In order to achieve the above object, an end face polishing machine according to the present invention is characterized in that the width of a substrate receiving portion for holding a rectangular glass substrate can be automatically adjusted according to the size of the glass substrate. A cassette type stage in which a plurality of glass substrates are stored in multiple stages by a plurality of substrate receiving portions, and a central portion of the polishing surface is depressed so as to be in contact with end surfaces of the plurality of glass substrates held by the cassette type stage. A plurality of concave grindstones provided in multiple stages, a first rotating shaft to which the grindstones are attached and arranged on both sides of a cassette type stage for processing two sides of the glass substrate; And a rotating shaft positioning portion for automatically moving the first rotating shaft in accordance with the width and the amount of polishing to fix the position.

【0013】また、上記の構成に加えて、前記砥石部の
前段に前記凹型砥石の形状よりガラス基板端面との接触
量を軽減した形状とされ、砥石部で使用するものよりも
粗い材料で作成された複数の補助研磨用凹型砥石が多段
に設けられた補助研磨砥石部と、この補助研磨砥石部が
取り付けられ、ガラス基板の2辺を処理するためにカセ
ット型ステージの両側に配置された第2の回転軸と、ガ
ラス基板の幅と研磨量に合わせて第1および第2の回転
軸を自動的に移動させ、位置固定させる回転軸位置決め
部を具備してもよい。
[0013] In addition to the above-mentioned structure, a shape in which the amount of contact with the end face of the glass substrate is smaller than that of the shape of the concave grindstone at the preceding stage of the grindstone portion, and is made of a material coarser than that used in the grindstone portion. Auxiliary polishing grindstone part provided with a plurality of concave grinding wheels for auxiliary polishing provided in multiple stages, and the auxiliary polishing grindstone part is mounted, and the second polishing grindstone part is disposed on both sides of the cassette type stage to process two sides of the glass substrate. A second rotating shaft, and a rotating shaft positioning unit that automatically moves and fixes the position of the first and second rotating shafts according to the width and the polishing amount of the glass substrate may be provided.

【0014】あるいは、前記砥石部に、前記凹型砥石の
形状よりガラス基板端面との接触量を軽減した形状とさ
れ、前記砥石部で使用するものよりも粗い材料で作成さ
れた複数の補助研磨用凹型砥石と前記凹型砥石が交互に
多段に設けられ、ガラス基板の幅と研磨量に合わせて第
1の回転軸を自動的に移動させ、位置固定させるととも
に、第1の回転軸の高さを調整する回転軸位置決め部を
具備してもよい。
[0014] Alternatively, a plurality of auxiliary polishing members made of a material coarser than that used in the grindstone portion may have a shape in which the amount of contact with the end face of the glass substrate is smaller than that of the concave grindstone portion. The concave grindstone and the concave grindstone are provided in multiple stages alternately, the first rotating shaft is automatically moved according to the width and the polishing amount of the glass substrate, the position is fixed, and the height of the first rotating shaft is adjusted. A rotating shaft positioning unit for adjusting may be provided.

【0015】本発明の端面研磨機によれば、カセット型
ステージに複数枚のガラス基板が多段に保持され、複数
の凹型砥石が多段に設けられた砥石部によってガラス基
板端面の研磨が行われるので、ガラス基板の一括研磨処
理が可能となり、装置の処理能力を向上することができ
る。
According to the edge polishing machine of the present invention, a plurality of glass substrates are held in multiple stages on the cassette type stage, and the edge of the glass substrate is polished by a grindstone portion provided with a plurality of concave grindstones in multiple stages. As a result, the glass substrate can be collectively polished, and the processing capability of the apparatus can be improved.

【0016】また、幅が調節可能な基板受け部を有する
カセット型ステージを持ち、砥石部を回転させる回転軸
もその位置が移動可能であるため、多様なサイズのガラ
ス基板に対応することができ、ガラス基板のサイズ変更
時にカセット型ステージの幅および回転軸の位置が自動
的に変化するため、ガラス基板のサイズ変更によって装
置の稼働率が低下するようなことがない。
In addition, the apparatus has a cassette type stage having a substrate receiving portion whose width can be adjusted, and the position of a rotating shaft for rotating the grindstone portion is movable, so that it is possible to cope with glass substrates of various sizes. Since the width of the cassette type stage and the position of the rotation axis automatically change when the size of the glass substrate is changed, the operation rate of the apparatus does not decrease due to the change in the size of the glass substrate.

【0017】さらに、砥石形状が自由に製作できる凹型
砥石を用いることにより、ガラス基板端部の円弧形状の
研磨、切断後の外形寸法補正等が可能になり、ガラス基
板端部からの発塵および外形不良による搬送トラブルを
防止することができる。
Further, by using a concave grindstone in which the shape of a grindstone can be freely manufactured, it becomes possible to polish the arc shape of the end portion of the glass substrate, to correct the outer dimensions after cutting, and to generate dust and dust from the end portion of the glass substrate. It is possible to prevent a transport trouble due to a defective outer shape.

【0018】[0018]

【発明の実施の形態】以下、本発明の第1の実施の形態
を図1および図2を参照して説明する。図1は本実施の
形態の端面研磨機を示す正面図、図2は同側面図であ
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the present invention will be described below with reference to FIGS. FIG. 1 is a front view showing an end face polishing machine of the present embodiment, and FIG. 2 is a side view thereof.

【0019】図1および図2に示すように、本実施の形
態の端面研磨機は、研磨されるガラス基板1の幅に合わ
せて基板受け部6の位置が自動的に変化し、4枚のガラ
ス基板1を多段に載置して搬送するカセット型ステージ
2、ガラス基板1の端面形状に合わせて凹部が形成され
た凹型砥石3が4枚のガラス基板1の端面に均一に接触
するように多段に配置された砥石部4、各ガラス基板1
の端面に接触した砥石部4を回転させガラス基板1の端
面を任意の凹形状に研磨処理する回転軸9(第1の回転
軸)、ガラス基板1の幅および研磨量に合わせて回転軸
9の間隔を自動調整する回転軸位置決め部5、等を有し
ている。砥石部4、回転軸9、回転軸位置決め部5は、
ガラス基板1の2辺が処理できるようにカセット型ステ
ージ2の両側に配置されている。
As shown in FIGS. 1 and 2, the end face polisher of the present embodiment automatically changes the position of the substrate receiving portion 6 in accordance with the width of the glass substrate 1 to be polished. A cassette type stage 2 for mounting and transporting the glass substrates 1 in multiple stages, and a concave grinding wheel 3 having a concave portion formed in accordance with the shape of the end surface of the glass substrate 1 so as to uniformly contact the end surfaces of the four glass substrates 1. Whetstone parts 4 arranged in multiple stages, each glass substrate 1
A rotating shaft 9 (first rotating shaft) for rotating the grinding stone portion 4 in contact with the end surface of the glass substrate 1 to polish the end surface of the glass substrate 1 into an arbitrary concave shape, and the rotating shaft 9 according to the width and the polishing amount of the glass substrate 1. And the like. The grinding wheel unit 4, the rotating shaft 9, and the rotating shaft positioning unit 5
The glass substrate 1 is disposed on both sides of the cassette type stage 2 so that two sides of the glass substrate 1 can be processed.

【0020】また、回転軸9は、回転軸位置決め部5の
作動によりガラス基板1の幅方向には移動するが、前後
方向には移動できないようになっており、その位置で回
転するようになっている。そして、カセット型ステージ
2側が図示しない前後移動機構によって前後方向に移動
する構成となっており、各ガラス基板1の側部の端面が
凹型砥石3の回転する研磨面と摺動することで研磨が行
われるようになっている。
The rotation shaft 9 is moved in the width direction of the glass substrate 1 by the operation of the rotation shaft positioning portion 5, but is not moved in the front-back direction, and rotates at that position. ing. Then, the cassette type stage 2 is configured to move in the front-rear direction by a front-rear movement mechanism (not shown), and polishing is performed by sliding the end surface of the side portion of each glass substrate 1 with the rotating polishing surface of the concave grindstone 3. Is being done.

【0021】次に、ガラス基板1を多段に載置するカセ
ット型ステージ2の構成について説明する。ガラス基板
1の幅を予め測定しておき、ガラス基板1を研磨機に移
載する際に研磨加工するガラス基板1のサイズを設定す
る。すると、設定されたガラス基板1のサイズに合わ
せ、カセット型ステージ2の基板受け部6がガイド7a
を用いて開閉され、ガラス基板1のサイズに調整され
る。基板受け部6には、ガラス基板1を吸着保持するた
めの吸着機構8が備えられており、研磨時にガラス基板
1が動かないようになっている。なお、中心部に基板受
け部6を設けることによって、ガラス基板1を載置した
際に撓みが生じにくくすることも可能である。
Next, the configuration of the cassette type stage 2 on which the glass substrates 1 are mounted in multiple stages will be described. The width of the glass substrate 1 is measured in advance, and the size of the glass substrate 1 to be polished when the glass substrate 1 is transferred to a polishing machine is set. Then, according to the set size of the glass substrate 1, the substrate receiving portion 6 of the cassette type stage 2 is moved to the guide 7a.
And is adjusted to the size of the glass substrate 1. The substrate receiving portion 6 is provided with an adsorption mechanism 8 for adsorbing and holding the glass substrate 1, so that the glass substrate 1 does not move during polishing. By providing the substrate receiving portion 6 at the center, it is possible to make it difficult for the glass substrate 1 to bend when the glass substrate 1 is placed.

【0022】次に、端面研磨機の砥石部4、回転軸9、
回転軸位置決め部5について説明する。砥石部4には、
研磨処理後に必要とされる凹型形状とされた、例えば研
磨面の中央部が滑らかに丸く窪んだ複数の凹型砥石3が
備えられ、カセット型ステージ2に4枚載置されたガラ
ス基板1端面に接触する位置に凹部が位置決めされるよ
うに、高さ調整がなされ、組み合わせ構成されている。
また、回転軸9には、砥石条件、研磨形状、研磨時の負
荷および周速等により仕様を決定したモータ10が備え
られ、砥石部4が取り付けられている。また、回転軸位
置決め部5は、ガラス基板1のサイズおよび研磨量に合
わせたガイド7b上の位置に回転軸9を移動させ、保持
するようになっている。
Next, the grinding wheel 4 of the end face polishing machine, the rotating shaft 9,
The rotating shaft positioning unit 5 will be described. In the whetstone part 4,
A plurality of concave grindstones 3 having a concave shape required after the polishing process, for example, the center of the polishing surface is smoothly rounded and concaved, are provided. The height is adjusted and the combination is configured so that the concave portion is positioned at the contact position.
The rotating shaft 9 is provided with a motor 10 whose specifications are determined according to grinding conditions, grinding shape, grinding load, peripheral speed, and the like. The rotating shaft positioning section 5 moves and holds the rotating shaft 9 to a position on the guide 7b according to the size and the polishing amount of the glass substrate 1.

【0023】以下、上記構成の端面研磨機の研磨方法を
説明する。最初に、ガラス基板1のサイズおよび端面研
磨の研磨量に合わせて、カセット型ステージ2の幅調整
および回転軸9の位置調整を行う。そして、回転軸位置
決め部5によって研磨位置に位置が変更され位置決めさ
れた回転軸9が、砥石研磨条件に合わせた回転数で回転
する。
Hereinafter, a polishing method of the end face polishing machine having the above configuration will be described. First, the width of the cassette type stage 2 and the position of the rotating shaft 9 are adjusted according to the size of the glass substrate 1 and the polishing amount of the end surface polishing. Then, the rotating shaft 9 whose position has been changed to the polishing position by the rotating shaft positioning unit 5 and positioned, rotates at a rotation speed that matches the grinding wheel polishing conditions.

【0024】次に、幅をガラス基板1のサイズに合わせ
たカセット型ステージ2に位置決めしたガラス基板1を
4枚載置する。ガラス基板1を載置する際には、カセッ
ト型ステージ2の側面から一括載置するか、1枚ずつ枚
葉で載置する。また、位置決めは研磨時の精度に合わせ
た方法を採用すればよい。例えば、精密な研磨が必要で
ある場合、位置決めを枚葉で行い、カセット型ステージ
2の上段から順に載置し、吸着保持するとよい。
Next, four glass substrates 1 positioned on a cassette type stage 2 having a width corresponding to the size of the glass substrate 1 are placed. When the glass substrates 1 are placed, they are placed at once from the side surface of the cassette type stage 2 or one by one. Further, the positioning may be performed by a method according to the precision at the time of polishing. For example, when precise polishing is required, the positioning may be performed on a single wafer, and the cassette-type stage 2 may be placed in order from the top and suction-held.

【0025】そして、カセット型ステージ2に4枚のガ
ラス基板を載置し、吸着保持を行った後、カセット型ス
テージ2を2つの砥石部4間で任意の速度で移動させ、
研磨処理を行う。そして、研磨処理後、カセット型ステ
ージ2からガラス基板1を排出する。
After the four glass substrates are placed on the cassette type stage 2 and suction holding is performed, the cassette type stage 2 is moved between the two grindstone portions 4 at an arbitrary speed.
A polishing process is performed. After the polishing process, the glass substrate 1 is discharged from the cassette type stage 2.

【0026】本実施の形態の端面研磨機によれば、カセ
ット型ステージ2に4枚のガラス基板1が保持され、4
個の凹型砥石3を有する砥石部4によってガラス基板1
端面の研磨が行われるので、ガラス基板1の一括研磨処
理が可能となり、装置の処理能力を向上することができ
る。また、幅が調節可能な基板受け部6を有するカセッ
ト型ステージ2を持ち、砥石部4を回転させる回転軸9
もその位置が移動可能であるため、多様なサイズのガラ
ス基板1に対応することができ、ガラス基板1のサイズ
変更時にカセット型ステージ2の幅および回転軸9の位
置が自動調整されるため、ガラス基板1のサイズ変更に
よって装置の稼働率が低下するようなことがない。さら
に、砥石形状が自由に製作できる凹型砥石3を用いるこ
とにより、ガラス基板1端部の円弧形状の研磨、切断後
の外形寸法補正等が可能になり、ガラス基板1端部から
の発塵および外形不良による搬送トラブルを防止するこ
とができる。
According to the edge polishing machine of the present embodiment, the four glass substrates 1 are
The glass substrate 1 is formed by a grindstone portion 4 having a plurality of concave grindstones 3.
Since the end face is polished, the glass substrate 1 can be collectively polished, and the processing capability of the apparatus can be improved. A rotating shaft 9 having a cassette type stage 2 having a substrate receiving portion 6 having an adjustable width and rotating the grinding wheel portion 4;
Since the position of the glass substrate 1 is also movable, it can correspond to glass substrates 1 of various sizes, and when the size of the glass substrate 1 is changed, the width of the cassette type stage 2 and the position of the rotating shaft 9 are automatically adjusted. The operation rate of the apparatus does not decrease due to the change in the size of the glass substrate 1. Further, by using the concave whetstone 3 whose grinding wheel shape can be freely manufactured, it becomes possible to polish the arc shape of the end portion of the glass substrate 1 and to correct the external dimensions after cutting, and to generate dust and dust from the end portion of the glass substrate 1. It is possible to prevent a transport trouble due to a defective outer shape.

【0027】以下、本発明の第2の実施の形態を図3を
参照して説明する。図1は本実施の形態の端面研磨機を
示す側面図であるが、本実施の形態が第1の実施の形態
と異なる点は補助研磨砥石部を有する点である。したが
って、その他の共通部分に関しては図3において図1、
図2と同一の符号を付し、詳細な説明を省略する。
Hereinafter, a second embodiment of the present invention will be described with reference to FIG. FIG. 1 is a side view showing an end face polishing machine according to the present embodiment, but the present embodiment differs from the first embodiment in that it has an auxiliary polishing grindstone portion. Therefore, regarding the other common parts, FIG.
The same reference numerals as in FIG. 2 are assigned, and the detailed description is omitted.

【0028】本実施の形態の端面研磨機における補助研
磨砥石部11と砥石部4は、図3に示すように、カセッ
ト型ステージ2に4枚載置されたガラス基板1の端面に
接触する位置に各々の凹部が位置決めされるように高さ
調整がなされ、組み合わされた4つずつの凹型砥石3
a、3bで構成され、別個の回転軸9にそれぞれ取り付
けられている。
As shown in FIG. 3, the auxiliary polishing grindstone portion 11 and the grindstone portion 4 in the end face polishing machine of the present embodiment come into contact with the end faces of the four glass substrates 1 mounted on the cassette type stage 2. The height is adjusted so that each of the concave portions is positioned, and the combined four concave grindstones 3 are formed.
a, 3b and are attached to separate rotating shafts 9 respectively.

【0029】補助研磨砥石部11は、砥石部4の加工負
荷低減のために、砥石部4で使用する砥石形状よりガラ
ス基板1の端面との接触量を軽減した形状とされ、砥石
部4で使用するものよりも粗い材料で作成された補助研
磨用凹型砥石3bを備えている。例えば、砥石部4の凹
型砥石3aの形状が中央部が丸く窪んだものとすれば、
補助研磨砥石部11の凹型砥石3bの形状は中央部がV
字状に切り込まれた形状となっている。
The auxiliary grinding wheel portion 11 has a shape in which the amount of contact with the end face of the glass substrate 1 is smaller than the shape of the grinding wheel used in the wheel portion 4 in order to reduce the processing load on the wheel portion 4. A concave grinding wheel 3b for auxiliary polishing made of a material coarser than that used is provided. For example, assuming that the shape of the concave grindstone 3a of the grindstone portion 4 is a concave portion with a round central portion,
The shape of the concave grinding wheel 3b of the auxiliary grinding wheel part 11 is V at the center.
It is shaped like a letter.

【0030】一方、砥石部4には、研磨処理後に必要と
される凹型形状とされた凹型砥石3aが備えられてい
る。また、各回転軸9には砥石条件、研磨形状、研磨時
の負荷および周速等により仕様を決定したモータ10が
備えられ、補助研磨砥石部11および砥石部4が取り付
けられている。また、回転軸位置決め部5は、ガラス基
板1のサイズおよび研磨量に合わせた位置に各回転軸9
を移動させ、保持するようになっている。
On the other hand, the grindstone portion 4 is provided with a concave grindstone 3a having a concave shape required after the polishing process. Each rotary shaft 9 is provided with a motor 10 whose specifications are determined according to grinding conditions, polishing shape, load during polishing, peripheral speed, etc., and an auxiliary grinding wheel unit 11 and a grinding wheel unit 4 are attached. Further, the rotating shaft positioning section 5 is provided with each rotating shaft 9 at a position corresponding to the size and the polishing amount of the glass substrate 1.
Is moved and held.

【0031】以下、上記構成の端面研磨機の研磨方法を
説明する。最初に、ガラス基板1のサイズおよび端面研
磨の研磨量に合わせて、カセット型ステージ2の幅調整
および回転軸9の位置調整を行う。そして、回転軸位置
決め部5によって研磨位置に位置が変更され位置決めさ
れた回転軸9が、砥石研磨条件に合わせた回転数で回転
する。
Hereinafter, a polishing method of the end face polishing machine having the above configuration will be described. First, the width of the cassette type stage 2 and the position of the rotating shaft 9 are adjusted according to the size of the glass substrate 1 and the polishing amount of the end surface polishing. Then, the rotating shaft 9 whose position has been changed to the polishing position by the rotating shaft positioning unit 5 and positioned, rotates at a rotation speed that matches the grinding wheel polishing conditions.

【0032】次に、幅をガラス基板1のサイズに合わせ
たカセット型ステージ2に位置決めしたガラス基板1を
4枚載置し、吸着保持を行った後、カセット型ステージ
2を補助研磨砥石部11、砥石部4の間で任意の速度で
順に移動させ、粗研磨処理、本研磨処理を連続的に行
う。そして、本研磨処理後、カセット型ステージ2から
ガラス基板1を排出する。
Next, four glass substrates 1 positioned on a cassette type stage 2 having a width corresponding to the size of the glass substrate 1 are placed thereon, and after holding by suction, the cassette type stage 2 is moved to the auxiliary polishing grindstone 11. The rough polishing process and the main polishing process are successively performed by moving the grindstone portion 4 in sequence at an arbitrary speed. After the main polishing process, the glass substrate 1 is discharged from the cassette type stage 2.

【0033】本実施の形態の端面研磨機においても、第
1の実施の形態と同様の効果を奏することができる。さ
らに、本実施の形態の場合、最終的な研磨を行う砥石部
4の前段に予備的な粗研磨を行うための補助研磨砥石部
11が設けられているため、砥石部4の加工負荷が軽減
され、凹型砥石3aの寿命を延長することができ、全体
としての加工時間の短縮や加工精度の向上を図ることも
できる。
The same effects as those of the first embodiment can be obtained in the end face polishing machine of the present embodiment. Further, in the case of the present embodiment, since the auxiliary polishing grindstone portion 11 for performing preliminary rough polishing is provided at a stage preceding the grindstone portion 4 for performing final polishing, the processing load on the grindstone portion 4 is reduced. Thus, the life of the concave grinding wheel 3a can be extended, and the processing time as a whole and the processing accuracy can be improved.

【0034】以下、本発明の第3の実施の形態を図4を
参照して説明する。図4は本実施の形態の端面研磨機を
示す側面図である。本実施の形態も第2の実施の形態と
同様、補助研磨砥石部を有するものであるが、補助研磨
用の凹型砥石と本研磨用の凹型砥石を組み合わせて一つ
の砥石部とした点で、第2の実施の形態の構成とは異な
っている。
Hereinafter, a third embodiment of the present invention will be described with reference to FIG. FIG. 4 is a side view showing the end face polishing machine of the present embodiment. As in the second embodiment, the present embodiment also has an auxiliary polishing grindstone portion, but in that a concave grindstone for auxiliary polishing and a concave grindstone for main polishing are combined into one grindstone portion, This is different from the configuration of the second embodiment.

【0035】本実施の形態の端面研磨機における砥石部
4は、図4に示すように、カセット型ステージ2に4枚
載置されたガラス基板1の端面に接触する位置に各々の
凹部が位置決めされるように高さ調整がなされ、組み合
わされた本研磨用の凹型砥石3aと補助研磨用の凹型砥
石3bが交互に全部で8段積み重ねられ、回転軸9に取
り付けられている。
As shown in FIG. 4, each of the concave portions of the grindstone portion 4 of the end face polishing machine according to the present embodiment is positioned at a position in contact with the end faces of the four glass substrates 1 mounted on the cassette type stage 2. The height is adjusted so that the concave grindstones 3a for main polishing and the concave grindstones 3b for auxiliary polishing are alternately stacked in a total of eight stages, and attached to the rotating shaft 9.

【0036】そして、補助研磨用凹型砥石3bは、凹型
砥石3aの加工負荷低減のために、凹型砥石3aよりガ
ラス基板1の端面との接触量を軽減した形状とされ、凹
型砥石3aよりも粗い材料で作成されている。例えば、
凹型砥石3aの形状が中央部が丸く窪んだものとすれ
ば、補助研磨用凹型砥石3bの形状は中央部がV字状に
切り込まれた形状となっている。
The concave grinding wheel 3b for auxiliary polishing has a shape in which the amount of contact with the end surface of the glass substrate 1 is smaller than that of the concave grinding wheel 3a in order to reduce the processing load of the concave grinding wheel 3a, and is rougher than the concave grinding wheel 3a. Made of materials. For example,
Assuming that the shape of the concave grindstone 3a is round and concave at the center, the shape of the concave grindstone 3b for auxiliary polishing is a V-shaped cut at the center.

【0037】また、回転軸9には砥石条件、研磨形状、
研磨時の負荷および周速等により仕様を決定したモータ
10が備えられ、砥石部4が取り付けられている。ま
た、回転軸位置決め部5は、ガラス基板1のサイズおよ
び研磨量に合わせた位置に回転軸9を移動させ、保持す
るようになっている。さらに、本実施の形態の場合、回
転軸位置決め部5は、回転軸9を任意の高さに移動可能
な構成とされている。
The rotating shaft 9 has a grinding wheel condition, a polishing shape,
A motor 10 whose specifications are determined according to a load and a peripheral speed at the time of polishing is provided, and a grindstone unit 4 is attached. Further, the rotating shaft positioning unit 5 moves and holds the rotating shaft 9 to a position corresponding to the size and the polishing amount of the glass substrate 1. Further, in the case of the present embodiment, the rotating shaft positioning section 5 is configured to be able to move the rotating shaft 9 to an arbitrary height.

【0038】以下、上記構成の端面研磨機の研磨方法を
説明する。最初に、ガラス基板1のサイズおよび端面研
磨の研磨量に合わせて、カセット型ステージ2の幅調整
および回転軸9の位置調整を行う。また、回転軸位置決
め部5は、まず、ガラス基板1の端面に補助研磨用凹型
砥石3bが接触する位置に回転軸9、すなわち砥石部4
の高さを調整する。そして、回転軸位置決め部5によっ
て研磨位置に位置が変更され位置決めされた回転軸9
が、砥石研磨条件に合わせた回転数で回転する。
Hereinafter, a polishing method of the end face polishing machine having the above configuration will be described. First, the width of the cassette type stage 2 and the position of the rotating shaft 9 are adjusted according to the size of the glass substrate 1 and the polishing amount of the end surface polishing. In addition, first, the rotating shaft positioning unit 5 places the rotating shaft 9, that is, the grinding wheel unit 4, at the position where the auxiliary polishing concave grinding wheel 3 b contacts the end surface of the glass substrate 1.
Adjust the height of the. The rotating shaft 9 whose position has been changed to the polishing position and positioned by the rotating shaft positioning unit 5.
However, it rotates at the number of rotations according to the grinding stone polishing conditions.

【0039】次に、幅をガラス基板1のサイズに合わせ
たカセット型ステージ2に位置決めしたガラス基板1を
4枚載置し、吸着保持を行った後、カセット型ステージ
2を砥石部4の間で任意の速度で移動させ、凹型砥石3
bにより粗研磨処理を行う。
Next, four glass substrates 1 positioned on a cassette type stage 2 having a width corresponding to the size of the glass substrate 1 are placed, and after suction holding, the cassette type stage 2 is moved between the grindstone portions 4. Move at any speed with
The rough polishing process is performed by b.

【0040】次に、カセット型ステージ2が砥石部4の
間を通過した後、回転軸位置決め部5が、今度はガラス
基板1の端面に本研磨用凹型砥石3aが接触する位置に
回転軸9、すなわち砥石部4の高さを変更する。そし
て、再度、カセット型ステージ2を砥石部4の間で前回
と逆方向に移動させ、凹型砥石3aによって本研磨処理
を行う。本研磨処理後、カセット型ステージ2からガラ
ス基板1を排出する。
Next, after the cassette type stage 2 has passed between the grindstone portions 4, the rotating shaft positioning portion 5 moves the rotating shaft 9 to a position where the main polishing concave grindstone 3a comes into contact with the end surface of the glass substrate 1 this time. That is, the height of the grindstone portion 4 is changed. Then, the cassette type stage 2 is again moved between the grindstone portions 4 in the direction opposite to the previous direction, and the main polishing process is performed by the concave grindstone 3a. After the main polishing process, the glass substrate 1 is discharged from the cassette type stage 2.

【0041】なお、本発明の技術範囲は上記実施の形態
に限定されるものではなく、本発明の趣旨を逸脱しない
範囲において種々の変更を加えることが可能である。例
えばカセット型ステージに搭載し得るガラス基板の数、
および凹型砥石の数や形状等については上記実施の形態
に限らず、適宜設計変更が可能である。
The technical scope of the present invention is not limited to the above embodiment, and various changes can be made without departing from the spirit of the present invention. For example, the number of glass substrates that can be mounted on a cassette type stage,
The number and shape of the concave grindstones are not limited to those in the above embodiment, and the design can be changed as appropriate.

【0042】[0042]

【発明の効果】以上、詳細に説明したように、本発明の
端面研磨機によれば、以下のような効果を奏することが
できる。第1の効果は、一括研磨処理により装置の処理
能力を向上できることである。その理由は、カセット型
ステージにガラス基板を多数枚保持し、多段に配置され
た凹型砥石により研磨処理を行うことができるからであ
る。また、一括研磨処理を行うため、バッチ内の加工バ
ラツキが少なく、製品の品質を向上することができる。
As described above, according to the edge polishing machine of the present invention, the following effects can be obtained. The first effect is that the processing capability of the apparatus can be improved by the batch polishing process. The reason is that a large number of glass substrates can be held on the cassette type stage and the polishing process can be performed by the concave grindstones arranged in multiple stages. Further, since the batch polishing is performed, there is little processing variation in the batch, and the quality of the product can be improved.

【0043】第2の効果は、ガラス基板のサイズが変化
してもステージの交換を行う必要がないということであ
る。その理由は、幅を自動調整可能としたカセット型ス
テージと回転軸を用いることにより、ガラス基板のサイ
ズ変更時にカセット型ステージの幅および回転軸の位置
が自動的に変化するため、従来の装置のようなステージ
の交換が不要となるからである。
The second effect is that it is not necessary to change the stage even if the size of the glass substrate changes. The reason is that by using a cassette type stage and a rotation axis whose width can be automatically adjusted, the width of the cassette type stage and the position of the rotation axis automatically change when the size of the glass substrate is changed. This is because such stage exchange becomes unnecessary.

【0044】第3の効果は、ガラス基板端面の研磨が可
能で、ガラス基板端面の形状を自由に選択することがで
き、ガラス基板端面からの発塵を抑制できることであ
る。その理由は、砥石形状が自由に加工製造できる凹型
砥石を用いることにより、ガラス基板端面の所望の加工
形状に合わせた砥石形状にすることができるからであ
る。
The third effect is that the end face of the glass substrate can be polished, the shape of the end face of the glass substrate can be freely selected, and the generation of dust from the end face of the glass substrate can be suppressed. The reason is that the use of a concave grindstone capable of freely processing and manufacturing the shape of a grindstone enables the shape of the grindstone to match the desired shape of the end face of the glass substrate.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の第1の実施の形態である端面研磨機
の概略構成を示す正面図である。
FIG. 1 is a front view showing a schematic configuration of an end face polishing machine according to a first embodiment of the present invention.

【図2】 同、側面図である。FIG. 2 is a side view of the same.

【図3】 本発明の第2の実施の形態である端面研磨機
の概略構成を示す側面図である。
FIG. 3 is a side view illustrating a schematic configuration of an end face polishing machine according to a second embodiment of the present invention.

【図4】 本発明の第3の実施の形態である端面研磨機
の概略構成を示す側面図である。
FIG. 4 is a side view showing a schematic configuration of an end face polishing machine according to a third embodiment of the present invention.

【図5】 従来の一例である端面研磨機の概略構成を示
す正面図である。
FIG. 5 is a front view showing a schematic configuration of an end face polishing machine as an example of the related art.

【図6】 同、端面研磨機による研磨処理後のガラス基
板の端面を示す斜視図である。
FIG. 6 is a perspective view showing an end face of the glass substrate after a polishing process by the end face polishing machine.

【図7】 従来の一例であるガラス基板の切断面取り機
の概略構成を示す正面図である。
FIG. 7 is a front view showing a schematic configuration of a conventional glass substrate cutting and chamfering machine.

【図8】 同、切断面取り機による研磨処理後のガラス
基板の端面を示す斜視図である。
FIG. 8 is a perspective view showing an end surface of the glass substrate after the polishing process by the cutting chamfering machine.

【符号の説明】[Explanation of symbols]

1 ガラス基板 2 カセット型ステージ 3,3a,3b 凹型砥石 4 砥石部 5 回転軸位置決め部 6 基板受け部 7a,7b ガイド 8 吸着機構 9 回転軸 10 モータ 11 補助研磨砥石部 12 支持台 13 切断線 14 凸型砥石 15 回転機構 16 調節機構 17 切断面 18 微小クラック 19 ステージ 20 カップ型砥石 DESCRIPTION OF SYMBOLS 1 Glass substrate 2 Cassette type stage 3, 3a, 3b Concave grindstone 4 Grindstone part 5 Rotation axis positioning part 6 Substrate receiving part 7a, 7b Guide 8 Suction mechanism 9 Rotation axis 10 Motor 11 Auxiliary grinding stone part 12 Support stand 13 Cutting line 14 Convex whetstone 15 Rotation mechanism 16 Adjustment mechanism 17 Cutting surface 18 Micro crack 19 Stage 20 Cup type whetstone

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 矩形のガラス基板を保持する基板受け部
の幅がガラス基板のサイズに合わせて自動調節可能とさ
れ、複数の基板受け部によって複数枚のガラス基板を多
段に収納するカセット型ステージと、 このカセット型ステージに保持された複数枚のガラス基
板の端面と接触するように、研磨面の中央部が窪んだ複
数の凹型砥石が多段に設けられた砥石部と、 この砥石部が取り付けられ、ガラス基板の2辺を処理す
るために前記カセット型ステージの両側に配置された第
1の回転軸と、 ガラス基板の幅と研磨量に合わせて前記第1の回転軸を
自動的に移動させ、位置固定させる回転軸位置決め部を
具備したことを特徴とする端面研磨機。
1. A cassette type stage in which a width of a substrate receiving portion for holding a rectangular glass substrate can be automatically adjusted according to the size of the glass substrate, and a plurality of glass substrates are stored in multiple stages by a plurality of substrate receiving portions. A plurality of concave grindstones in which the central part of the polishing surface is depressed so as to be in contact with the end faces of the plurality of glass substrates held by the cassette type stage; A first rotating shaft disposed on both sides of the cassette type stage for processing two sides of the glass substrate; and automatically moving the first rotating shaft in accordance with the width and polishing amount of the glass substrate. An end face polishing machine, comprising: a rotary shaft positioning part for causing the position to be fixed.
【請求項2】 請求項1に記載の端面研磨機において、 前記砥石部の前段に、前記凹型砥石の形状よりガラス基
板端面との接触量を軽減した形状とされ、前記砥石部で
使用するものよりも粗い材料で作成された複数の補助研
磨用凹型砥石が多段に設けられた補助研磨砥石部と、 この補助研磨砥石部が取り付けられ、ガラス基板の2辺
を処理するために前記カセット型ステージの両側に配置
された第2の回転軸と、 ガラス基板の幅と研磨量に合わせて前記第1および第2
の回転軸を自動的に移動させ、位置固定させる回転軸位
置決め部を具備したことを特徴とする端面研磨機。
2. The end face polishing machine according to claim 1, wherein a shape in which the amount of contact with a glass substrate end face is smaller than that of the shape of the concave whetstone before the whetstone part, and which is used in the whetstone part. A plurality of auxiliary polishing grindstones made of a coarser material and provided in multiple stages, and an auxiliary polishing grindstone portion attached to the cassette type stage for processing two sides of a glass substrate. A second rotating shaft disposed on both sides of the first and second substrates according to the width of the glass substrate and the polishing amount.
An end face polishing machine comprising a rotating shaft positioning section for automatically moving and rotating the rotating shaft.
【請求項3】 請求項1に記載の端面研磨機において、 前記砥石部に、前記凹型砥石の形状よりガラス基板端面
との接触量を軽減した形状とされ、前記砥石部で使用す
るものよりも粗い材料で作成された複数の補助研磨用凹
型砥石と前記凹型砥石が交互に多段に設けられ、 ガラス基板の幅と研磨量に合わせて前記第1の回転軸を
自動的に移動させ、位置固定させるとともに、前記第1
の回転軸の高さを調整する回転軸位置決め部を具備した
ことを特徴とする端面研磨機。
3. The end face polishing machine according to claim 1, wherein the grindstone has a shape in which the amount of contact with the glass substrate end face is smaller than the shape of the concave grindstone, and is smaller than that used in the grindstone. A plurality of concave grindstones for auxiliary polishing made of a coarse material and the concave grindstones are alternately provided in multiple stages, and the first rotating shaft is automatically moved and fixed in position according to the width of the glass substrate and the polishing amount. And the first
An end face polishing machine comprising a rotating shaft positioning portion for adjusting the height of the rotating shaft.
JP9081237A 1997-03-31 1997-03-31 Glass substrate edge polishing machine and edge polishing method Expired - Fee Related JP3011129B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP9081237A JP3011129B2 (en) 1997-03-31 1997-03-31 Glass substrate edge polishing machine and edge polishing method
KR1019980011241A KR100304782B1 (en) 1997-03-31 1998-03-31 End surface abrading apparatus and method of abrading an end surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9081237A JP3011129B2 (en) 1997-03-31 1997-03-31 Glass substrate edge polishing machine and edge polishing method

Publications (2)

Publication Number Publication Date
JPH10277899A true JPH10277899A (en) 1998-10-20
JP3011129B2 JP3011129B2 (en) 2000-02-21

Family

ID=13740838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9081237A Expired - Fee Related JP3011129B2 (en) 1997-03-31 1997-03-31 Glass substrate edge polishing machine and edge polishing method

Country Status (2)

Country Link
JP (1) JP3011129B2 (en)
KR (1) KR100304782B1 (en)

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WO2003072516A1 (en) * 2002-01-16 2003-09-04 Mitsuboshi Diamond Industrial Co., Ltd. Fragile material substrate scriber, fragile material substrate processing machine, fragile material substrate polishing device, and fragile material substrate parting system
JP2011011323A (en) * 2009-07-06 2011-01-20 Nakamura Tome Precision Ind Co Ltd Method and device for chamfering hard brittle plate
CN102049714A (en) * 2009-07-24 2011-05-11 康宁股份有限公司 Method for processing edge of glass plate
CN104551982A (en) * 2015-01-05 2015-04-29 夏云美 Jewelry grinding head
WO2017015205A1 (en) * 2015-07-21 2017-01-26 Corning Incorporated Methods and apparatuses for edge finishing glass substrates
CN109176215A (en) * 2018-08-31 2019-01-11 巫溪县碧玉石材有限公司 Stone sander
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CN109702620A (en) * 2019-02-15 2019-05-03 天津联汇智造科技有限公司 Circuit board polishing equipment
CN111070005A (en) * 2020-01-02 2020-04-28 崔如祥 Refined edging treatment process for manufacturing and processing toughened glass
CN111070005B (en) * 2020-01-02 2021-12-17 江门市江海区远强安全玻璃有限公司 Refined edging treatment process for manufacturing and processing toughened glass
CN113510566A (en) * 2021-09-14 2021-10-19 江苏兰蒂斯生物质复合材料研究院有限公司 Edging device is used in wood-based plate production and processing
CN113510566B (en) * 2021-09-14 2021-12-10 江苏兰蒂斯生物质复合材料研究院有限公司 Edging device is used in wood-based plate production and processing
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Also Published As

Publication number Publication date
KR19980080936A (en) 1998-11-25
JP3011129B2 (en) 2000-02-21
KR100304782B1 (en) 2002-04-17

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