JPH10163097A5 - - Google Patents

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Publication number
JPH10163097A5
JPH10163097A5 JP1996332844A JP33284496A JPH10163097A5 JP H10163097 A5 JPH10163097 A5 JP H10163097A5 JP 1996332844 A JP1996332844 A JP 1996332844A JP 33284496 A JP33284496 A JP 33284496A JP H10163097 A5 JPH10163097 A5 JP H10163097A5
Authority
JP
Japan
Prior art keywords
stage
substrate
sensitive substrate
sensitive
stages
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1996332844A
Other languages
English (en)
Japanese (ja)
Other versions
JP4029180B2 (ja
JPH10163097A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP33284496A external-priority patent/JP4029180B2/ja
Priority to JP33284496A priority Critical patent/JP4029180B2/ja
Priority to SG200103142A priority patent/SG88824A1/en
Priority to EP08005700A priority patent/EP1944654A3/en
Priority to CNB011176660A priority patent/CN1244019C/zh
Priority to CNB011176652A priority patent/CN1244018C/zh
Priority to AT97913467T priority patent/ATE404906T1/de
Priority to AU50678/98A priority patent/AU5067898A/en
Priority to SG200103143A priority patent/SG102627A1/en
Priority to KR1020017006773A priority patent/KR20030096435A/ko
Priority to CNB011216425A priority patent/CN1244020C/zh
Priority to SG200103141A priority patent/SG88823A1/en
Priority to HK00103393.7A priority patent/HK1024104B/xx
Priority to PCT/JP1997/004350 priority patent/WO1998024115A1/ja
Priority to CNB011216433A priority patent/CN1244021C/zh
Priority to EP97913467A priority patent/EP0951054B1/en
Priority to DE69738910T priority patent/DE69738910D1/de
Priority to SG200005339A priority patent/SG93267A1/en
Priority to CNB971811172A priority patent/CN1144263C/zh
Priority to IL13013797A priority patent/IL130137A/xx
Publication of JPH10163097A publication Critical patent/JPH10163097A/ja
Priority to KR1019997004747A priority patent/KR100315249B1/ko
Priority to KR1019997004939A priority patent/KR100314557B1/ko
Priority to US09/666,407 priority patent/US6400441B1/en
Priority to US09/714,620 priority patent/US6549269B1/en
Priority to US09/714,943 priority patent/US6341007B1/en
Priority to US09/716,405 priority patent/US6590634B1/en
Priority to KR1020017006772A priority patent/KR100315251B1/ko
Priority to KR1020017006771A priority patent/KR100315250B1/ko
Priority to US10/024,147 priority patent/US6798491B2/en
Priority to KR1020020072335A priority patent/KR20060086496A/ko
Priority to KR1020020072333A priority patent/KR20060086495A/ko
Priority to US10/879,144 priority patent/US7177008B2/en
Publication of JPH10163097A5 publication Critical patent/JPH10163097A5/ja
Priority to US11/647,492 priority patent/US7256869B2/en
Publication of JP4029180B2 publication Critical patent/JP4029180B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP33284496A 1996-11-28 1996-11-28 投影露光装置及び投影露光方法 Expired - Lifetime JP4029180B2 (ja)

Priority Applications (32)

Application Number Priority Date Filing Date Title
JP33284496A JP4029180B2 (ja) 1996-11-28 1996-11-28 投影露光装置及び投影露光方法
IL13013797A IL130137A (en) 1996-11-28 1997-11-28 Exposure apparatus and an exposure method
AU50678/98A AU5067898A (en) 1996-11-28 1997-11-28 Aligner and method for exposure
CNB011176660A CN1244019C (zh) 1996-11-28 1997-11-28 曝光装置以及曝光方法
CNB011176652A CN1244018C (zh) 1996-11-28 1997-11-28 曝光方法和曝光装置
AT97913467T ATE404906T1 (de) 1996-11-28 1997-11-28 Ausrichtvorrichtung und belichtungsverfahren
EP97913467A EP0951054B1 (en) 1996-11-28 1997-11-28 Aligner and method for exposure
SG200103143A SG102627A1 (en) 1996-11-28 1997-11-28 Lithographic device
KR1020017006773A KR20030096435A (ko) 1996-11-28 1997-11-28 노광장치 및 노광방법
CNB011216425A CN1244020C (zh) 1996-11-28 1997-11-28 曝光装置
SG200103141A SG88823A1 (en) 1996-11-28 1997-11-28 Projection exposure apparatus
HK00103393.7A HK1024104B (en) 1996-11-28 1997-11-28 Aligner and method for exposure
PCT/JP1997/004350 WO1998024115A1 (fr) 1996-11-28 1997-11-28 Dispositif d'alignement et procede d'exposition
CNB011216433A CN1244021C (zh) 1996-11-28 1997-11-28 光刻装置和曝光方法
EP08005700A EP1944654A3 (en) 1996-11-28 1997-11-28 An exposure apparatus and an exposure method
DE69738910T DE69738910D1 (de) 1996-11-28 1997-11-28 Ausrichtvorrichtung und belichtungsverfahren
SG200005339A SG93267A1 (en) 1996-11-28 1997-11-28 An exposure apparatus and an exposure method
CNB971811172A CN1144263C (zh) 1996-11-28 1997-11-28 曝光装置以及曝光方法
SG200103142A SG88824A1 (en) 1996-11-28 1997-11-28 Projection exposure method
KR1019997004747A KR100315249B1 (ko) 1996-11-28 1999-05-28 노광장치 및 노광방법
KR1019997004939A KR100314557B1 (ko) 1996-11-28 1999-06-03 노광장치 및 노광방법
US09/666,407 US6400441B1 (en) 1996-11-28 2000-09-20 Projection exposure apparatus and method
US09/714,620 US6549269B1 (en) 1996-11-28 2000-11-17 Exposure apparatus and an exposure method
US09/714,943 US6341007B1 (en) 1996-11-28 2000-11-20 Exposure apparatus and method
US09/716,405 US6590634B1 (en) 1996-11-28 2000-11-21 Exposure apparatus and method
KR1020017006772A KR100315251B1 (ko) 1996-11-28 2001-05-30 노광장치 및 노광방법
KR1020017006771A KR100315250B1 (ko) 1996-11-28 2001-05-30 노광장치 및 노광방법
US10/024,147 US6798491B2 (en) 1996-11-28 2001-12-21 Exposure apparatus and an exposure method
KR1020020072335A KR20060086496A (ko) 1996-11-28 2002-11-20 노광장치 및 노광방법
KR1020020072333A KR20060086495A (ko) 1996-11-28 2002-11-20 노광장치 및 노광방법
US10/879,144 US7177008B2 (en) 1996-11-28 2004-06-30 Exposure apparatus and method
US11/647,492 US7256869B2 (en) 1996-11-28 2006-12-29 Exposure apparatus and an exposure method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33284496A JP4029180B2 (ja) 1996-11-28 1996-11-28 投影露光装置及び投影露光方法

Publications (3)

Publication Number Publication Date
JPH10163097A JPH10163097A (ja) 1998-06-19
JPH10163097A5 true JPH10163097A5 (enrdf_load_html_response) 2005-08-11
JP4029180B2 JP4029180B2 (ja) 2008-01-09

Family

ID=18259430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33284496A Expired - Lifetime JP4029180B2 (ja) 1996-11-28 1996-11-28 投影露光装置及び投影露光方法

Country Status (1)

Country Link
JP (1) JP4029180B2 (enrdf_load_html_response)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6549277B1 (en) 1999-09-28 2003-04-15 Nikon Corporation Illuminance meter, illuminance measuring method and exposure apparatus
WO2001023933A1 (fr) 1999-09-29 2001-04-05 Nikon Corporation Systeme optique de projection
WO2001023935A1 (fr) 1999-09-29 2001-04-05 Nikon Corporation Procede et dispositif d'exposition par projection, et systeme optique de projection
US7301605B2 (en) 2000-03-03 2007-11-27 Nikon Corporation Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices
JP2002270494A (ja) * 2001-03-13 2002-09-20 Sony Corp 位置検出方法および露光方法
JP2002287023A (ja) 2001-03-27 2002-10-03 Nikon Corp 投影光学系、該投影光学系を備えた投影露光装置及び投影露光方法
US7589822B2 (en) * 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
WO2005096354A1 (ja) * 2004-03-30 2005-10-13 Nikon Corporation 露光装置、露光方法及びデバイス製造方法、並びに面形状検出装置
JPWO2007055237A1 (ja) * 2005-11-09 2009-04-30 株式会社ニコン 露光装置及び露光方法、並びにデバイス製造方法
JP2007318069A (ja) * 2005-12-06 2007-12-06 Nikon Corp 露光装置及び露光方法、並びにデバイス製造方法、投影光学系
CN101326617B (zh) 2005-12-28 2012-06-20 株式会社尼康 图案形成方法及图案形成装置、以及元件制造方法
WO2007097380A1 (ja) * 2006-02-21 2007-08-30 Nikon Corporation パターン形成装置及びパターン形成方法、移動体駆動システム及び移動体駆動方法、露光装置及び露光方法、並びにデバイス製造方法
US8675171B2 (en) * 2006-08-31 2014-03-18 Nikon Corporation Movable body drive system and movable body drive method, pattern formation apparatus and method, exposure apparatus and method, device manufacturing method, and decision-making method
JP2007293376A (ja) * 2007-08-14 2007-11-08 Hitachi High-Technologies Corp 露光装置及び基板製造方法
JP2007306034A (ja) * 2007-08-14 2007-11-22 Hitachi High-Technologies Corp 露光装置及び基板製造方法
US20090153824A1 (en) * 2007-12-17 2009-06-18 Kla-Tencor Corporation Multiple chuck scanning stage
TWI602033B (zh) * 2007-12-28 2017-10-11 Nippon Kogaku Kk Exposure apparatus, moving body driving system, pattern forming apparatus, exposure method, and device manufacturing method
JP4312247B2 (ja) * 2008-02-06 2009-08-12 株式会社日立ハイテクノロジーズ プロキシミティ露光装置及び基板製造方法
JP2008122996A (ja) * 2008-02-06 2008-05-29 Hitachi High-Technologies Corp プロキシミティ露光装置及び基板製造方法
JP2008146098A (ja) * 2008-02-06 2008-06-26 Hitachi High-Technologies Corp プロキシミティ露光装置及び基板製造方法
JP4312248B2 (ja) * 2008-02-06 2009-08-12 株式会社日立ハイテクノロジーズ プロキシミティ露光装置及び基板製造方法
US8773635B2 (en) * 2008-12-19 2014-07-08 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
CN102754035B (zh) * 2010-02-19 2014-12-10 Asml荷兰有限公司 光刻设备和器件制造方法
JP2011222726A (ja) 2010-04-08 2011-11-04 Elpida Memory Inc 半導体装置の製造方法、ウェハ処理システム及びプログラム
KR101104267B1 (ko) * 2010-08-06 2012-01-11 오에프티 주식회사 스테이지 모듈 반송형 노광 장치 및 스테이지 모듈의 기판 정렬 및 이송 제어 방법
WO2013132081A2 (en) * 2012-03-08 2013-09-12 Mapper Lithography Ip B.V. Lithography system and method for processing a target, such as a wafer
CN107221509B (zh) * 2017-06-20 2020-10-13 南京矽邦半导体有限公司 一种识别单颗产品在qfn框架上位置信息的方法

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