JPH0729637Y2 - 半導体素子測定用治具 - Google Patents
半導体素子測定用治具Info
- Publication number
- JPH0729637Y2 JPH0729637Y2 JP1987069228U JP6922887U JPH0729637Y2 JP H0729637 Y2 JPH0729637 Y2 JP H0729637Y2 JP 1987069228 U JP1987069228 U JP 1987069228U JP 6922887 U JP6922887 U JP 6922887U JP H0729637 Y2 JPH0729637 Y2 JP H0729637Y2
- Authority
- JP
- Japan
- Prior art keywords
- tape
- chip
- wafer ring
- wafer
- attached
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987069228U JPH0729637Y2 (ja) | 1987-05-09 | 1987-05-09 | 半導体素子測定用治具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987069228U JPH0729637Y2 (ja) | 1987-05-09 | 1987-05-09 | 半導体素子測定用治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63178333U JPS63178333U (es) | 1988-11-18 |
JPH0729637Y2 true JPH0729637Y2 (ja) | 1995-07-05 |
Family
ID=30909767
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987069228U Expired - Lifetime JPH0729637Y2 (ja) | 1987-05-09 | 1987-05-09 | 半導体素子測定用治具 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0729637Y2 (es) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5243101B2 (ja) * | 2008-05-14 | 2013-07-24 | 株式会社ディスコ | 破断装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5378173A (en) * | 1976-12-22 | 1978-07-11 | Toshiba Corp | Manufacture of semiconductor device |
JPS5478080A (en) * | 1977-12-05 | 1979-06-21 | Toshiba Corp | Production of semiconductor element |
JPS5483774A (en) * | 1977-12-16 | 1979-07-04 | Nec Corp | Manufacture of semiconductor device |
JPS59130437A (ja) * | 1983-01-17 | 1984-07-27 | Nec Home Electronics Ltd | 半導体装置の選別方法 |
JPS61187247A (ja) * | 1985-02-14 | 1986-08-20 | Nec Kansai Ltd | 半導体装置の製造方法 |
-
1987
- 1987-05-09 JP JP1987069228U patent/JPH0729637Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS63178333U (es) | 1988-11-18 |
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