JPH0725723Y2 - 試験回路内蔵型ｌｓｉ - Google Patents

試験回路内蔵型ｌｓｉ

Info

Publication number
JPH0725723Y2
JPH0725723Y2 JP1987048874U JP4887487U JPH0725723Y2 JP H0725723 Y2 JPH0725723 Y2 JP H0725723Y2 JP 1987048874 U JP1987048874 U JP 1987048874U JP 4887487 U JP4887487 U JP 4887487U JP H0725723 Y2 JPH0725723 Y2 JP H0725723Y2
Authority
JP
Japan
Prior art keywords
terminal
test
lsi
state value
built
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987048874U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63156084U (enrdf_load_html_response
Inventor
博樹 越智
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1987048874U priority Critical patent/JPH0725723Y2/ja
Publication of JPS63156084U publication Critical patent/JPS63156084U/ja
Application granted granted Critical
Publication of JPH0725723Y2 publication Critical patent/JPH0725723Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1987048874U 1987-03-31 1987-03-31 試験回路内蔵型ｌｓｉ Expired - Lifetime JPH0725723Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987048874U JPH0725723Y2 (ja) 1987-03-31 1987-03-31 試験回路内蔵型ｌｓｉ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987048874U JPH0725723Y2 (ja) 1987-03-31 1987-03-31 試験回路内蔵型ｌｓｉ

Publications (2)

Publication Number Publication Date
JPS63156084U JPS63156084U (enrdf_load_html_response) 1988-10-13
JPH0725723Y2 true JPH0725723Y2 (ja) 1995-06-07

Family

ID=30870815

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987048874U Expired - Lifetime JPH0725723Y2 (ja) 1987-03-31 1987-03-31 試験回路内蔵型ｌｓｉ

Country Status (1)

Country Link
JP (1) JPH0725723Y2 (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2671817B2 (ja) * 1994-08-26 1997-11-05 日本電気株式会社 半導体集積回路の検査方法

Also Published As

Publication number Publication date
JPS63156084U (enrdf_load_html_response) 1988-10-13

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