JPH0581876B2 - - Google Patents
Info
- Publication number
- JPH0581876B2 JPH0581876B2 JP59051300A JP5130084A JPH0581876B2 JP H0581876 B2 JPH0581876 B2 JP H0581876B2 JP 59051300 A JP59051300 A JP 59051300A JP 5130084 A JP5130084 A JP 5130084A JP H0581876 B2 JPH0581876 B2 JP H0581876B2
- Authority
- JP
- Japan
- Prior art keywords
- green sheet
- sheet
- particles
- head
- lifting head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geophysics And Detection Of Objects (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Devices For Post-Treatments, Processing, Supply, Discharge, And Other Processes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US502057 | 1983-06-07 | ||
| US06/502,057 US4513613A (en) | 1983-06-07 | 1983-06-07 | Particle detection system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS603576A JPS603576A (ja) | 1985-01-09 |
| JPH0581876B2 true JPH0581876B2 (show.php) | 1993-11-16 |
Family
ID=23996154
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59051300A Granted JPS603576A (ja) | 1983-06-07 | 1984-03-19 | 粒子検出システム |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4513613A (show.php) |
| EP (1) | EP0133879B1 (show.php) |
| JP (1) | JPS603576A (show.php) |
| DE (1) | DE3468737D1 (show.php) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0750173B2 (ja) * | 1986-09-17 | 1995-05-31 | 株式会社日立製作所 | 磁気デイスクの突起検出方法 |
| DE3705201A1 (de) * | 1987-02-19 | 1988-09-01 | Schoeller F Jun Gmbh Co Kg | Vorrichtung zur messung kleiner dickenprofilaenderungen in bandfoermigem material, insbesondere fotografischem basispapier |
| GB8717118D0 (en) * | 1987-07-20 | 1987-08-26 | Wiggins Teape Group Ltd | Determining propensity of paper/board to dust |
| DE3807488C1 (show.php) * | 1988-03-08 | 1989-08-10 | Robert Bosch Gmbh, 7000 Stuttgart, De | |
| JPH0272273A (ja) * | 1988-09-07 | 1990-03-12 | Shohei Senda | 薬液注入装置におけるバルブ装置 |
| US5131753A (en) * | 1990-07-23 | 1992-07-21 | Motorola, Inc. | Robotic placement device using compliant imaging surface |
| US5271284A (en) * | 1991-10-08 | 1993-12-21 | Bridgestone/Firestone, Inc. | Lap splice width monitor |
| US6044695A (en) * | 1997-09-02 | 2000-04-04 | Datacard Corporation | Apparatus and method for detecting contaminants on the surface of a card |
| US20030080757A1 (en) * | 2001-11-01 | 2003-05-01 | Groover Thomas A. | Proximity sensor |
| JP4889441B2 (ja) * | 2006-10-24 | 2012-03-07 | Ntn株式会社 | 破片検出センサ |
| JP4889424B2 (ja) * | 2006-09-26 | 2012-03-07 | Ntn株式会社 | 破片検出センサ |
| JP4716965B2 (ja) * | 2006-09-26 | 2011-07-06 | Ntn株式会社 | 破片検出センサ |
| EP2071364B1 (en) * | 2006-09-26 | 2013-03-27 | NTN Corporation | Broken piece detecting sensor |
| US20140069463A1 (en) * | 2012-09-07 | 2014-03-13 | International Business Machines Corporation | Particle detection and cleaning system |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1178612B (de) * | 1957-02-25 | 1964-09-24 | Armco Steel Corp | Verfahren und Einrichtung zur Messung der Ab-weichung der Flachheit eines Koerpers von einem vorgegebenen Wert |
| US3037381A (en) * | 1959-05-13 | 1962-06-05 | Warren S D Co | Bump detector |
| NL277561A (show.php) * | 1961-05-03 | |||
| GB1088871A (en) * | 1964-01-24 | 1967-10-25 | Licentia Gmbh | A device for detecting creases,protuberances or the like in the surface of travelling webs or sheets of material |
| DE1573912A1 (de) * | 1965-05-24 | 1970-06-04 | Laszlo Urmenyi | Verfahren zum Erkennen von Oberflaechenerhoehungen im Papier und anderem plattenfoermigen Material und Einrichtung zur Ausuebung des Verfahrens |
| DE1994156U (de) * | 1965-07-07 | 1968-09-19 | Buchtal Gmbh | Vorrichtung zum fortlaufenden messen der verwindung oder kruemmung keramischer platten, insbesondere spaltplatten, sowie zum sortieren solcher platten. |
| GB1199328A (en) * | 1966-09-07 | 1970-07-22 | Yawata Iron & Steel Co | Method of Measuring the Surface Waviness of Sheet or Strip Material |
| US3541843A (en) * | 1967-12-29 | 1970-11-24 | Procter & Gamble | Method and apparatus for measuring fabric softness |
| US3502827A (en) * | 1968-08-02 | 1970-03-24 | Du Pont | Apparatus for detecting foreign objects in or on moving sheets |
| DE2058101A1 (de) * | 1970-11-26 | 1972-06-22 | Paul Lippke | Einrichtung zum Pruefen von bewegten Bahnen auf Papier u.dgl. auf Fehler wie Verfaerbungen,Loecher,Verdickungen und aehnliche Fehlstellen |
| DE2060696B2 (de) * | 1970-12-10 | 1972-12-07 | Lippke, Paul, 5450 Neuwied | Einrichtung zum pruefen von bewegten bahnen aus papier o dgl auf falten, knoten und aehnlichen fehlstellen |
| DE2130025B1 (de) * | 1971-06-18 | 1972-05-25 | Nordlabor Gmbh Fuer Bautechnis | Verfahren zur Bestimmung der Oberflaechenrauhigkeit insbesondere von Strassenbelaegen |
| CH610017A5 (show.php) * | 1975-09-30 | 1979-03-30 | Rieter Ag Maschf | |
| JPS5936202B2 (ja) * | 1976-11-30 | 1984-09-03 | 日本電気株式会社 | 基板のそり測定装置 |
| JPS588458B2 (ja) * | 1977-03-30 | 1983-02-16 | 株式会社日立製作所 | 形状検出装置 |
| DE2911649C3 (de) * | 1979-03-24 | 1982-05-27 | Feldmühle AG, 4000 Düsseldorf | Verfahren und Vorrichtung zur Prüfung des Durchschlagverhaltens von Beschichtungsmassen und Beschichtungsträgern |
| US4271699A (en) * | 1979-12-07 | 1981-06-09 | Williamson Harry L | Sheet thickness monitoring system and method |
| DD154037C2 (de) * | 1980-11-03 | 1986-07-02 | Gerd Schuchardt | Anordnung zur gerad- und ebenheitsmessung |
| US4347735A (en) * | 1980-12-15 | 1982-09-07 | International Business Machines Corporation | Process for monitoring solvent content of green ceramic sheet, and apparatus therefor |
| JPS57112237U (show.php) * | 1980-12-27 | 1982-07-12 | ||
| US4443278A (en) * | 1981-05-26 | 1984-04-17 | International Business Machines Corporation | Inspection of multilayer ceramic circuit modules by electrical inspection of green specimens |
| JPS58195539A (ja) * | 1982-05-11 | 1983-11-14 | キヤノン株式会社 | 眼底カメラ装置 |
-
1983
- 1983-06-07 US US06/502,057 patent/US4513613A/en not_active Expired - Fee Related
-
1984
- 1984-03-19 JP JP59051300A patent/JPS603576A/ja active Granted
- 1984-06-05 DE DE8484106377T patent/DE3468737D1/de not_active Expired
- 1984-06-05 EP EP84106377A patent/EP0133879B1/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| EP0133879A1 (de) | 1985-03-13 |
| DE3468737D1 (en) | 1988-02-18 |
| JPS603576A (ja) | 1985-01-09 |
| EP0133879B1 (de) | 1988-01-13 |
| US4513613A (en) | 1985-04-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6019663A (en) | System for cleaning semiconductor device probe | |
| JPH0581876B2 (show.php) | ||
| KR101678898B1 (ko) | 프로브 카드에의 기판 접촉 방법 | |
| JP5543352B2 (ja) | ウエハー反り測定の配置構造及び反り測定方法 | |
| KR20030096400A (ko) | 기판 결함 검출 장치 및 방법 | |
| JPH0325738B2 (show.php) | ||
| US20250123326A1 (en) | Probe card and inspection system | |
| US7034930B1 (en) | System and method for defect identification and location using an optical indicia device | |
| JP3105201B2 (ja) | ウェーハの搬送保持機構 | |
| US6596552B2 (en) | Test photomask and method for investigating ESD-induced reticle defects | |
| JP3112512B2 (ja) | チャックテーブルの表面状態検査方法 | |
| JP4218093B2 (ja) | 試料の保持方法,試料の保持装置、および荷電粒子線装置 | |
| KR102181497B1 (ko) | 반도체 소자 이송 장치의 검사 방법 | |
| JPH0566989U (ja) | プロービング装置用半導体ウエハステージ | |
| KR20170089783A (ko) | 전기적 연속성을 사용하여 엔드 이펙터 평탄도 검증 | |
| EP4679482A1 (en) | Module, apparatus, and method of using the module | |
| KR100810435B1 (ko) | 웨이퍼 슬립 방지수단을 구비한 센터링 가이드 | |
| KR102236824B1 (ko) | Plp 패널 뒤틀림 검출장치 및 검출방법 | |
| US20140069463A1 (en) | Particle detection and cleaning system | |
| JP2001249162A (ja) | ベアチップ検査装置及びベアチップ検査方法 | |
| KR100748731B1 (ko) | 반도체 제조용 웨이퍼 인스펙션 장치 및 인터락 방법 | |
| JP2000164649A (ja) | プローバの触針クリーニング機構 | |
| JPS6239822B2 (show.php) | ||
| JPS61162737A (ja) | 異物検査装置の性能チエツク方法 | |
| JP2025022047A (ja) | 搬送アームの位置設定方法 |