JPH0575271B2 - - Google Patents
Info
- Publication number
- JPH0575271B2 JPH0575271B2 JP12838786A JP12838786A JPH0575271B2 JP H0575271 B2 JPH0575271 B2 JP H0575271B2 JP 12838786 A JP12838786 A JP 12838786A JP 12838786 A JP12838786 A JP 12838786A JP H0575271 B2 JPH0575271 B2 JP H0575271B2
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- signal
- jitter
- frequency
- converter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001228 spectrum Methods 0.000 claims description 39
- 238000006243 chemical reaction Methods 0.000 claims description 10
- 238000012952 Resampling Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000008676 import Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Analogue/Digital Conversion (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12838786A JPS62284268A (ja) | 1986-06-02 | 1986-06-02 | 時間間隔分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12838786A JPS62284268A (ja) | 1986-06-02 | 1986-06-02 | 時間間隔分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62284268A JPS62284268A (ja) | 1987-12-10 |
| JPH0575271B2 true JPH0575271B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-10-20 |
Family
ID=14983553
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12838786A Granted JPS62284268A (ja) | 1986-06-02 | 1986-06-02 | 時間間隔分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62284268A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05107287A (ja) * | 1991-10-18 | 1993-04-27 | Advantest Corp | ジツタ解析装置 |
| US5402443A (en) * | 1992-12-15 | 1995-03-28 | National Semiconductor Corp. | Device and method for measuring the jitter of a recovered clock signal |
| US6460001B1 (en) * | 2000-03-29 | 2002-10-01 | Advantest Corporation | Apparatus for and method of measuring a peak jitter |
-
1986
- 1986-06-02 JP JP12838786A patent/JPS62284268A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62284268A (ja) | 1987-12-10 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |