JPH0558143B2 - - Google Patents
Info
- Publication number
- JPH0558143B2 JPH0558143B2 JP60111613A JP11161385A JPH0558143B2 JP H0558143 B2 JPH0558143 B2 JP H0558143B2 JP 60111613 A JP60111613 A JP 60111613A JP 11161385 A JP11161385 A JP 11161385A JP H0558143 B2 JPH0558143 B2 JP H0558143B2
- Authority
- JP
- Japan
- Prior art keywords
- test
- circuit
- signal generation
- clock signal
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 18
- 238000010586 diagram Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60111613A JPS61270676A (ja) | 1985-05-24 | 1985-05-24 | 集積回路試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60111613A JPS61270676A (ja) | 1985-05-24 | 1985-05-24 | 集積回路試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61270676A JPS61270676A (ja) | 1986-11-29 |
JPH0558143B2 true JPH0558143B2 (ko) | 1993-08-25 |
Family
ID=14565772
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60111613A Granted JPS61270676A (ja) | 1985-05-24 | 1985-05-24 | 集積回路試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61270676A (ko) |
-
1985
- 1985-05-24 JP JP60111613A patent/JPS61270676A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61270676A (ja) | 1986-11-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6823485B1 (en) | Semiconductor storage device and test system | |
JPH08320360A (ja) | Icテスタのタイミング発生器 | |
JPH0558143B2 (ko) | ||
JP2965049B2 (ja) | タイミング発生装置 | |
JP2000090693A (ja) | メモリ試験装置 | |
JPS6096023A (ja) | タイミング信号発生器 | |
JP4119015B2 (ja) | 半導体試験装置 | |
JPH03261881A (ja) | 波形形成装置 | |
JPS59215099A (ja) | 半導体メモリの検査方法 | |
JP2964985B2 (ja) | 半導体試験装置の波形整形回路 | |
JP2556918Y2 (ja) | Ic試験装置の波形制御回路 | |
JPH0391195A (ja) | メモリ回路 | |
SU658509A1 (ru) | Устройство дл контрол логических блоков | |
JP2508357Y2 (ja) | Icテスタ用タイミング発生器 | |
JP2598580Y2 (ja) | Ic試験装置 | |
JPH0625058Y2 (ja) | 波形ホーマッタ | |
JPH10239401A (ja) | 半導体集積回路装置 | |
JPH04265872A (ja) | Icテスターのタイミング発生回路 | |
JPH0391199A (ja) | メモリ回路 | |
JPS6273171A (ja) | 論理波形生成回路 | |
JPS6027970Y2 (ja) | Ic試験装置用タイミング発生装置 | |
JPH04147069A (ja) | テスト波形生成器 | |
JPH0434703B2 (ko) | ||
JPS5920198B2 (ja) | 電子部品の試験方法 | |
JPH01267473A (ja) | 集積回路試験回路 |