JPH055371B2 - - Google Patents
Info
- Publication number
- JPH055371B2 JPH055371B2 JP60227184A JP22718485A JPH055371B2 JP H055371 B2 JPH055371 B2 JP H055371B2 JP 60227184 A JP60227184 A JP 60227184A JP 22718485 A JP22718485 A JP 22718485A JP H055371 B2 JPH055371 B2 JP H055371B2
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- emitter
- region
- base
- resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Bipolar Transistors (AREA)
- Semiconductor Integrated Circuits (AREA)
- Bipolar Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60227184A JPS6286757A (ja) | 1985-10-11 | 1985-10-11 | トランジスタ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60227184A JPS6286757A (ja) | 1985-10-11 | 1985-10-11 | トランジスタ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6286757A JPS6286757A (ja) | 1987-04-21 |
| JPH055371B2 true JPH055371B2 (enExample) | 1993-01-22 |
Family
ID=16856803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60227184A Granted JPS6286757A (ja) | 1985-10-11 | 1985-10-11 | トランジスタ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6286757A (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0643205A (ja) * | 1992-07-22 | 1994-02-18 | Mitsubishi Electric Corp | コレクタ・エミッタ間電圧モニタ回路 |
| JP3239849B2 (ja) | 1998-07-16 | 2001-12-17 | 日本電気株式会社 | バイポーラトランジスタのコレクタ・エミッタ間耐圧の測定方法 |
-
1985
- 1985-10-11 JP JP60227184A patent/JPS6286757A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6286757A (ja) | 1987-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4225878A (en) | Integrated circuit on chip trimming | |
| JP3353388B2 (ja) | 電力用半導体装置 | |
| JP3239849B2 (ja) | バイポーラトランジスタのコレクタ・エミッタ間耐圧の測定方法 | |
| JPH055371B2 (enExample) | ||
| US5355082A (en) | Automatic transistor checker | |
| JPH0245339B2 (ja) | Handotaishusekikairosochi | |
| JPS60147154A (ja) | 抵抗構造体 | |
| JPH0782165B2 (ja) | 液晶表示装置の製造方法 | |
| JP3101364B2 (ja) | 絶縁ゲートバイポーラトランジスタのテストデバイス | |
| JPS5871655A (ja) | 半導体装置 | |
| JPH0590481A (ja) | 半導体集積回路 | |
| JP3101365B2 (ja) | 絶縁ゲートバイポーラトランジスタのテストデバイス | |
| JPH01196858A (ja) | トランジスタ | |
| JP3135666B2 (ja) | 半導体集積回路の入力保護回路 | |
| JP2630138B2 (ja) | 半導体集積回路 | |
| JP2512073B2 (ja) | サ―ジ防御回路の検査方法 | |
| JP3067188B2 (ja) | 半導体集積回路 | |
| JPH0357314A (ja) | 半導体装置 | |
| US5138418A (en) | Transistor structure for testing emitter-base junction | |
| JP2973709B2 (ja) | 半導体素子の製造方法 | |
| JPH07106385A (ja) | 半導体装置 | |
| JPS61204969A (ja) | 半導体装置 | |
| JPH0365018B2 (enExample) | ||
| JPH0714902A (ja) | 半導体装置 | |
| JPS6235530A (ja) | 半導体素子の測定方法 |