JPH0550016B2 - - Google Patents
Info
- Publication number
- JPH0550016B2 JPH0550016B2 JP1004783A JP478389A JPH0550016B2 JP H0550016 B2 JPH0550016 B2 JP H0550016B2 JP 1004783 A JP1004783 A JP 1004783A JP 478389 A JP478389 A JP 478389A JP H0550016 B2 JPH0550016 B2 JP H0550016B2
- Authority
- JP
- Japan
- Prior art keywords
- debugging
- rom
- program
- asic
- microcomputer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004891 communication Methods 0.000 claims description 16
- 230000006870 function Effects 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 238000013461 design Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000000523 sample Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 2
- 102100021624 Acid-sensing ion channel 1 Human genes 0.000 description 1
- 101710099904 Acid-sensing ion channel 1 Proteins 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3664—Environments for testing or debugging software
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Microcomputers (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1004783A JPH02186448A (ja) | 1989-01-13 | 1989-01-13 | デバッグ環境を備えた集積回路 |
DE1990618273 DE69018273T2 (de) | 1989-01-13 | 1990-01-13 | Integrierte Schaltung mit einer Austestumgebung. |
EP19900100664 EP0378242B1 (en) | 1989-01-13 | 1990-01-13 | Integrated circuit with a debug environment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1004783A JPH02186448A (ja) | 1989-01-13 | 1989-01-13 | デバッグ環境を備えた集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02186448A JPH02186448A (ja) | 1990-07-20 |
JPH0550016B2 true JPH0550016B2 (US20030037225A1-20030220-P00001.png) | 1993-07-27 |
Family
ID=11593409
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1004783A Granted JPH02186448A (ja) | 1989-01-13 | 1989-01-13 | デバッグ環境を備えた集積回路 |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0378242B1 (US20030037225A1-20030220-P00001.png) |
JP (1) | JPH02186448A (US20030037225A1-20030220-P00001.png) |
DE (1) | DE69018273T2 (US20030037225A1-20030220-P00001.png) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU649476B2 (en) * | 1991-09-18 | 1994-05-26 | Alcatel N.V. | Integrated circuit comprising a standard cell, an application cell and a test cell |
JP3671667B2 (ja) | 1998-03-31 | 2005-07-13 | セイコーエプソン株式会社 | マイクロコンピュータ、電子機器及びデバッグシステム |
US6938244B1 (en) * | 1999-05-11 | 2005-08-30 | Microsoft Corp. | Interlaced protocol for smart card application development |
JP2002202900A (ja) | 2000-12-28 | 2002-07-19 | Seiko Epson Corp | デバッグ装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58105366A (ja) * | 1981-12-16 | 1983-06-23 | Fujitsu Ltd | デバツグ機能を持つマイクロコンピユ−タ |
JPS58129559A (ja) * | 1982-01-26 | 1983-08-02 | Nec Corp | デバツガ |
JPS58129557A (ja) * | 1982-01-27 | 1983-08-02 | Hitachi Ltd | デ−タ処理システムにおけるプログラムのデバツグ用デ−タ収集処理方法 |
JPS59186448A (ja) * | 1983-04-08 | 1984-10-23 | Fujitsu Ltd | 計算機網における状態情報管理制御方式 |
JPS6041140A (ja) * | 1983-08-16 | 1985-03-04 | Nec Corp | 半導体集積回路内蔵romのデバツグ装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4527234A (en) * | 1982-08-02 | 1985-07-02 | Texas Instruments Incorporated | Emulator device including a semiconductor substrate having the emulated device embodied in the same semiconductor substrate |
US4796258A (en) * | 1986-06-23 | 1989-01-03 | Tektronix, Inc. | Microprocessor system debug tool |
-
1989
- 1989-01-13 JP JP1004783A patent/JPH02186448A/ja active Granted
-
1990
- 1990-01-13 DE DE1990618273 patent/DE69018273T2/de not_active Expired - Lifetime
- 1990-01-13 EP EP19900100664 patent/EP0378242B1/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58105366A (ja) * | 1981-12-16 | 1983-06-23 | Fujitsu Ltd | デバツグ機能を持つマイクロコンピユ−タ |
JPS58129559A (ja) * | 1982-01-26 | 1983-08-02 | Nec Corp | デバツガ |
JPS58129557A (ja) * | 1982-01-27 | 1983-08-02 | Hitachi Ltd | デ−タ処理システムにおけるプログラムのデバツグ用デ−タ収集処理方法 |
JPS59186448A (ja) * | 1983-04-08 | 1984-10-23 | Fujitsu Ltd | 計算機網における状態情報管理制御方式 |
JPS6041140A (ja) * | 1983-08-16 | 1985-03-04 | Nec Corp | 半導体集積回路内蔵romのデバツグ装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0378242A3 (en) | 1991-07-24 |
DE69018273D1 (de) | 1995-05-11 |
EP0378242B1 (en) | 1995-04-05 |
JPH02186448A (ja) | 1990-07-20 |
DE69018273T2 (de) | 1995-12-21 |
EP0378242A2 (en) | 1990-07-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |