JPH0542633B2 - - Google Patents

Info

Publication number
JPH0542633B2
JPH0542633B2 JP58030256A JP3025683A JPH0542633B2 JP H0542633 B2 JPH0542633 B2 JP H0542633B2 JP 58030256 A JP58030256 A JP 58030256A JP 3025683 A JP3025683 A JP 3025683A JP H0542633 B2 JPH0542633 B2 JP H0542633B2
Authority
JP
Japan
Prior art keywords
liquid crystal
crystal display
conductive pattern
electrode terminal
flexible film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58030256A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59155769A (ja
Inventor
Tadashi Myasaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP58030256A priority Critical patent/JPS59155769A/ja
Publication of JPS59155769A publication Critical patent/JPS59155769A/ja
Publication of JPH0542633B2 publication Critical patent/JPH0542633B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP58030256A 1983-02-25 1983-02-25 電子デイバイスの検査装置 Granted JPS59155769A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58030256A JPS59155769A (ja) 1983-02-25 1983-02-25 電子デイバイスの検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58030256A JPS59155769A (ja) 1983-02-25 1983-02-25 電子デイバイスの検査装置

Publications (2)

Publication Number Publication Date
JPS59155769A JPS59155769A (ja) 1984-09-04
JPH0542633B2 true JPH0542633B2 (enrdf_load_stackoverflow) 1993-06-29

Family

ID=12298622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58030256A Granted JPS59155769A (ja) 1983-02-25 1983-02-25 電子デイバイスの検査装置

Country Status (1)

Country Link
JP (1) JPS59155769A (enrdf_load_stackoverflow)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62233774A (ja) * 1986-04-03 1987-10-14 Matsushita Electric Ind Co Ltd 回路基板の検査方法
JPS62233775A (ja) * 1986-04-03 1987-10-14 Matsushita Electric Ind Co Ltd 回路基板の検査方法
JP2517243B2 (ja) * 1986-09-11 1996-07-24 東京エレクトロン株式会社 プロ−ブ装置
JPH0810234B2 (ja) * 1987-02-24 1996-01-31 東京エレクトロン株式会社 検査装置
JPH0785196B2 (ja) * 1987-09-14 1995-09-13 東京エレクトロン株式会社 プローブ装置
JPH0719823B2 (ja) * 1988-03-28 1995-03-06 東京エレクトロン株式会社 液晶表示体プローブ装置
JPH0264473A (ja) * 1988-08-31 1990-03-05 Matsushita Electric Ind Co Ltd 液晶表示パネル検査装置
DE9314259U1 (de) * 1992-09-29 1994-02-10 Tektronix, Inc., Wilsonville, Oreg. Sondenadapter für elektonische Bauelemente

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6020917B2 (ja) * 1976-11-29 1985-05-24 富士通株式会社 電極検査装置
JPS56112680U (enrdf_load_stackoverflow) * 1980-01-29 1981-08-31

Also Published As

Publication number Publication date
JPS59155769A (ja) 1984-09-04

Similar Documents

Publication Publication Date Title
KR100548902B1 (ko) 프로브 카드 및 그 제조 방법
JP5016892B2 (ja) 検査装置及び検査方法
KR100373155B1 (ko) 고주파용의프린트배선판,프로우브카드및프로우브장치
JPH0542633B2 (enrdf_load_stackoverflow)
JPH0529406A (ja) 半導体検査装置
JP3624570B2 (ja) 液晶表示パネルの検査装置、液晶表示パネルの検査方法及び集積回路の実装方法
US6566899B2 (en) Tester for semiconductor device
JPH0810234B2 (ja) 検査装置
JPH11154694A (ja) ウェハ一括型測定検査用アライメント方法およびプローブカードの製造方法
JPH0664086B2 (ja) プローブカード
JPH02221881A (ja) 集積回路装置試験用プローブ
KR20020011286A (ko) 반도체 프로브 장치 및 이를 이용한 반도체 프로브 칩과그의 제조방법
JPH07288271A (ja) 集積回路用測定電極
JPH09159694A (ja) Ｌｓｉテストプローブ装置
JPH1194910A (ja) プローブ検査装置
KR100914916B1 (ko) 프로브 장치 및 이의 제조방법
JPH01108738A (ja) 測定装置
JPH03218473A (ja) 表示パネル用プローブ
JPH08111438A (ja) 集積回路素子用プローバ
JP2534091Y2 (ja) 半導体装置の検査装置
JPH06230032A (ja) プローブ基板
JPH09211048A (ja) 液晶表示パネル検査装置
JPS6377129A (ja) プロ−ブカ−ド
JPS6225433A (ja) 半導体素子特性測定装置
JPH11121553A (ja) ウェハ一括型測定検査のためプローブカードおよびそのプローブカードを用いた半導体装置の検査方法