JPS59155769A - 電子デイバイスの検査装置 - Google Patents

電子デイバイスの検査装置

Info

Publication number
JPS59155769A
JPS59155769A JP58030256A JP3025683A JPS59155769A JP S59155769 A JPS59155769 A JP S59155769A JP 58030256 A JP58030256 A JP 58030256A JP 3025683 A JP3025683 A JP 3025683A JP S59155769 A JPS59155769 A JP S59155769A
Authority
JP
Japan
Prior art keywords
liquid crystal
crystal display
conductive pattern
flexible film
electrode terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58030256A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0542633B2 (enrdf_load_stackoverflow
Inventor
Tadashi Miyasaka
正 宮坂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP58030256A priority Critical patent/JPS59155769A/ja
Publication of JPS59155769A publication Critical patent/JPS59155769A/ja
Publication of JPH0542633B2 publication Critical patent/JPH0542633B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP58030256A 1983-02-25 1983-02-25 電子デイバイスの検査装置 Granted JPS59155769A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58030256A JPS59155769A (ja) 1983-02-25 1983-02-25 電子デイバイスの検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58030256A JPS59155769A (ja) 1983-02-25 1983-02-25 電子デイバイスの検査装置

Publications (2)

Publication Number Publication Date
JPS59155769A true JPS59155769A (ja) 1984-09-04
JPH0542633B2 JPH0542633B2 (enrdf_load_stackoverflow) 1993-06-29

Family

ID=12298622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58030256A Granted JPS59155769A (ja) 1983-02-25 1983-02-25 電子デイバイスの検査装置

Country Status (1)

Country Link
JP (1) JPS59155769A (enrdf_load_stackoverflow)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62233775A (ja) * 1986-04-03 1987-10-14 Matsushita Electric Ind Co Ltd 回路基板の検査方法
JPS62233774A (ja) * 1986-04-03 1987-10-14 Matsushita Electric Ind Co Ltd 回路基板の検査方法
JPS6370433A (ja) * 1986-09-11 1988-03-30 Tokyo Electron Ltd プロ−ブ装置
JPS63206671A (ja) * 1987-02-24 1988-08-25 Tokyo Electron Ltd 検査装置
JPS6473392A (en) * 1987-09-14 1989-03-17 Tokyo Electron Ltd Probe
JPH01245536A (ja) * 1988-03-28 1989-09-29 Tokyo Electron Ltd 液晶表示体プローブ装置
JPH0264473A (ja) * 1988-08-31 1990-03-05 Matsushita Electric Ind Co Ltd 液晶表示パネル検査装置
JPH06194385A (ja) * 1992-09-29 1994-07-15 Sony Tektronix Corp プローブ・アダプタ

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5367878A (en) * 1976-11-29 1978-06-16 Fujitsu Ltd Device for inspecting electrode
JPS56112680U (enrdf_load_stackoverflow) * 1980-01-29 1981-08-31

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5367878A (en) * 1976-11-29 1978-06-16 Fujitsu Ltd Device for inspecting electrode
JPS56112680U (enrdf_load_stackoverflow) * 1980-01-29 1981-08-31

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62233775A (ja) * 1986-04-03 1987-10-14 Matsushita Electric Ind Co Ltd 回路基板の検査方法
JPS62233774A (ja) * 1986-04-03 1987-10-14 Matsushita Electric Ind Co Ltd 回路基板の検査方法
JPS6370433A (ja) * 1986-09-11 1988-03-30 Tokyo Electron Ltd プロ−ブ装置
JPS63206671A (ja) * 1987-02-24 1988-08-25 Tokyo Electron Ltd 検査装置
JPS6473392A (en) * 1987-09-14 1989-03-17 Tokyo Electron Ltd Probe
JPH01245536A (ja) * 1988-03-28 1989-09-29 Tokyo Electron Ltd 液晶表示体プローブ装置
JPH0264473A (ja) * 1988-08-31 1990-03-05 Matsushita Electric Ind Co Ltd 液晶表示パネル検査装置
JPH06194385A (ja) * 1992-09-29 1994-07-15 Sony Tektronix Corp プローブ・アダプタ

Also Published As

Publication number Publication date
JPH0542633B2 (enrdf_load_stackoverflow) 1993-06-29

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