JPH051628B2 - - Google Patents

Info

Publication number
JPH051628B2
JPH051628B2 JP58124478A JP12447883A JPH051628B2 JP H051628 B2 JPH051628 B2 JP H051628B2 JP 58124478 A JP58124478 A JP 58124478A JP 12447883 A JP12447883 A JP 12447883A JP H051628 B2 JPH051628 B2 JP H051628B2
Authority
JP
Japan
Prior art keywords
layer
semiconductor layer
inp
ingaas
band width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58124478A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6016474A (ja
Inventor
Kenshin Taguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP58124478A priority Critical patent/JPS6016474A/ja
Priority to DE8484304608T priority patent/DE3471551D1/de
Priority to EP84304608A priority patent/EP0131437B1/en
Priority to CA000458281A priority patent/CA1244121A/en
Priority to US06/629,292 priority patent/US4684969A/en
Publication of JPS6016474A publication Critical patent/JPS6016474A/ja
Publication of JPH051628B2 publication Critical patent/JPH051628B2/ja
Granted legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/222—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PN heterojunction
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/225—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • H10F30/2255—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes in which the active layers form heterostructures, e.g. SAM structures
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • H10F77/146—Superlattices; Multiple quantum well structures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Light Receiving Elements (AREA)
JP58124478A 1983-07-08 1983-07-08 ヘテロ多重接合型光検出器 Granted JPS6016474A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP58124478A JPS6016474A (ja) 1983-07-08 1983-07-08 ヘテロ多重接合型光検出器
DE8484304608T DE3471551D1 (en) 1983-07-08 1984-07-05 Heterojunction avalanche photodiode
EP84304608A EP0131437B1 (en) 1983-07-08 1984-07-05 Heterojunction avalanche photodiode
CA000458281A CA1244121A (en) 1983-07-08 1984-07-06 Heterojunction avalanche photodiode
US06/629,292 US4684969A (en) 1983-07-08 1984-07-09 Heterojunction avalanche photodiode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58124478A JPS6016474A (ja) 1983-07-08 1983-07-08 ヘテロ多重接合型光検出器

Publications (2)

Publication Number Publication Date
JPS6016474A JPS6016474A (ja) 1985-01-28
JPH051628B2 true JPH051628B2 (OSRAM) 1993-01-08

Family

ID=14886506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58124478A Granted JPS6016474A (ja) 1983-07-08 1983-07-08 ヘテロ多重接合型光検出器

Country Status (5)

Country Link
US (1) US4684969A (OSRAM)
EP (1) EP0131437B1 (OSRAM)
JP (1) JPS6016474A (OSRAM)
CA (1) CA1244121A (OSRAM)
DE (1) DE3471551D1 (OSRAM)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6049681A (ja) * 1983-08-29 1985-03-18 Fujitsu Ltd 半導体受光装置
US4885620A (en) * 1984-04-25 1989-12-05 Josef Kemmer Semiconductor element
EP0205899B1 (en) * 1985-05-20 1991-03-27 Nec Corporation Planar heterojunction avalanche photodiode
FR2583577B1 (fr) * 1985-06-18 1987-08-07 Thomson Csf Procede de realisation d'un dispositif photodetecteur semi-conducteur a avalanche et dispositif ainsi realise
CA1282671C (en) * 1985-11-18 1991-04-09 John Condon Bean Device having strain induced region
JPS62259481A (ja) * 1986-04-15 1987-11-11 Fujitsu Ltd 半導体受光装置
FR2618221B1 (fr) * 1987-07-17 1991-07-19 Thomson Csf Detecteur d'onde electromagnetique et analyseur d'image comportant un tel detecteur.
EP0304048B1 (en) * 1987-08-19 1997-05-28 Nec Corporation A planar type heterostructure avalanche photodiode
US4839702A (en) * 1987-11-20 1989-06-13 Bell Communications Research, Inc. Semiconductor device based on charge emission from a quantum well
US4857982A (en) * 1988-01-06 1989-08-15 University Of Southern California Avalanche photodiode with floating guard ring
US4876209A (en) * 1988-01-06 1989-10-24 U.S.C. Method of making avalanche photodiode
JPH0821727B2 (ja) * 1988-11-18 1996-03-04 日本電気株式会社 アバランシェフォトダイオード
JP2942285B2 (ja) * 1989-08-24 1999-08-30 三菱電機株式会社 半導体受光素子
JP2934294B2 (ja) * 1990-04-09 1999-08-16 日本電信電話株式会社 アバランシェフォトダイオード
JP2937404B2 (ja) * 1990-04-18 1999-08-23 日本電気株式会社 半導体受光素子
JPH07123170B2 (ja) * 1990-08-07 1995-12-25 光計測技術開発株式会社 受光素子
JPH04125977A (ja) * 1990-09-17 1992-04-27 Nec Corp ヘテロ多重構造アバランシ・フォトダイオード
JP2682253B2 (ja) * 1991-04-18 1997-11-26 三菱電機株式会社 アバランシェ・フォトダイオード及びその製造方法
KR960001467B1 (ko) * 1992-12-22 1996-01-30 한국 전기통신공사 초격자구조(superlattice)의 증폭층을 갖는 애벌란체 포토다이오드(APD:Avalanche Photodiode)
FR2719417B1 (fr) * 1994-04-28 1996-07-19 Person Henri Le Composant à hétérostructure semi-conductrice, commande par la lumière pour la génération d'oscillations hyperfréquences.
US5610416A (en) * 1995-02-16 1997-03-11 Hewlett-Packard Company Avalanche photodiode with epitaxially regrown guard rings
JPH08274366A (ja) * 1995-03-31 1996-10-18 Nec Corp 半導体受光素子
US5866936A (en) * 1997-04-01 1999-02-02 Hewlett-Packard Company Mesa-structure avalanche photodiode having a buried epitaxial junction
KR100366046B1 (ko) * 2000-06-29 2002-12-27 삼성전자 주식회사 에벌란치 포토다이오드 제조방법
JP4956944B2 (ja) * 2005-09-12 2012-06-20 三菱電機株式会社 アバランシェフォトダイオード
US7755079B2 (en) * 2007-08-17 2010-07-13 Sandia Corporation Strained-layer superlattice focal plane array having a planar structure
US11769782B2 (en) * 2018-05-02 2023-09-26 Sony Semiconductor Solutions Corporation Solid-state imaging element and imaging apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5580375A (en) * 1978-12-13 1980-06-17 Nippon Telegr & Teleph Corp <Ntt> Compound semiconductor photoreceptor
US4383269A (en) * 1980-09-19 1983-05-10 Bell Telephone Laboratories, Incorporated Graded bandgap photodetector
JPS5861679A (ja) * 1981-10-07 1983-04-12 Kokusai Denshin Denwa Co Ltd <Kdd> 量子井戸層付アバランシ・ホトダイオ−ド
US4476477A (en) * 1982-02-23 1984-10-09 At&T Bell Laboratories Graded bandgap multilayer avalanche photodetector with energy step backs
JPS5984589A (ja) * 1982-11-08 1984-05-16 Fujitsu Ltd アバランシフオトダイオード

Also Published As

Publication number Publication date
US4684969A (en) 1987-08-04
EP0131437A3 (en) 1985-10-30
CA1244121A (en) 1988-11-01
EP0131437A2 (en) 1985-01-16
DE3471551D1 (en) 1988-06-30
JPS6016474A (ja) 1985-01-28
EP0131437B1 (en) 1988-05-25

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