JPH0477270B2 - - Google Patents
Info
- Publication number
- JPH0477270B2 JPH0477270B2 JP20455887A JP20455887A JPH0477270B2 JP H0477270 B2 JPH0477270 B2 JP H0477270B2 JP 20455887 A JP20455887 A JP 20455887A JP 20455887 A JP20455887 A JP 20455887A JP H0477270 B2 JPH0477270 B2 JP H0477270B2
- Authority
- JP
- Japan
- Prior art keywords
- pair
- section
- rotary table
- measurement electrodes
- workpiece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 42
- 238000007689 inspection Methods 0.000 claims description 29
- 239000003082 abrasive agent Substances 0.000 claims description 17
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 229910000679 solder Inorganic materials 0.000 description 7
- 238000007599 discharging Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20455887A JPS6447964A (en) | 1987-08-18 | 1987-08-18 | Inspecting machine for electronic component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20455887A JPS6447964A (en) | 1987-08-18 | 1987-08-18 | Inspecting machine for electronic component |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6447964A JPS6447964A (en) | 1989-02-22 |
| JPH0477270B2 true JPH0477270B2 (ko) | 1992-12-07 |
Family
ID=16492469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20455887A Granted JPS6447964A (en) | 1987-08-18 | 1987-08-18 | Inspecting machine for electronic component |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6447964A (ko) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101451499B1 (ko) * | 2013-02-07 | 2014-10-17 | 삼성전기주식회사 | 전자부품 검사장치 |
-
1987
- 1987-08-18 JP JP20455887A patent/JPS6447964A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6447964A (en) | 1989-02-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term | ||
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20071207 Year of fee payment: 15 |