JPH0464454B2 - - Google Patents

Info

Publication number
JPH0464454B2
JPH0464454B2 JP511085A JP511085A JPH0464454B2 JP H0464454 B2 JPH0464454 B2 JP H0464454B2 JP 511085 A JP511085 A JP 511085A JP 511085 A JP511085 A JP 511085A JP H0464454 B2 JPH0464454 B2 JP H0464454B2
Authority
JP
Japan
Prior art keywords
radial
mask
wafer
diaphragm
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP511085A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60164324A (ja
Inventor
Jei Shidooru Gurahamu
Guren Iiton Suteiibun
Bii Kuruugaa Jeimuzu
Ei Gyaretsutoson Gyaretsuto
Pii Noikerumanzu Aaman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPS60164324A publication Critical patent/JPS60164324A/ja
Publication of JPH0464454B2 publication Critical patent/JPH0464454B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G03F7/70433—Layout for increasing efficiency or for compensating imaging errors, e.g. layout of exposure fields for reducing focus errors; Use of mask features for increasing efficiency or for compensating imaging errors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP60005110A 1984-01-24 1985-01-17 回転リピートリソグラフ処理のための装置及び方法 Granted JPS60164324A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/573,524 US4613981A (en) 1984-01-24 1984-01-24 Method and apparatus for lithographic rotate and repeat processing
US573524 1984-01-24

Publications (2)

Publication Number Publication Date
JPS60164324A JPS60164324A (ja) 1985-08-27
JPH0464454B2 true JPH0464454B2 (show.php) 1992-10-15

Family

ID=24292336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60005110A Granted JPS60164324A (ja) 1984-01-24 1985-01-17 回転リピートリソグラフ処理のための装置及び方法

Country Status (4)

Country Link
US (1) US4613981A (show.php)
EP (1) EP0150129B1 (show.php)
JP (1) JPS60164324A (show.php)
DE (1) DE3563392D1 (show.php)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2155201B (en) * 1984-02-24 1988-07-13 Canon Kk An x-ray exposure apparatus
US4760265A (en) * 1986-01-18 1988-07-26 Kabushiki Kaisha Toyoda Jidoshokki Seisakusho Method and device for detecting defects of patterns in microelectronic devices
US4870668A (en) * 1987-12-30 1989-09-26 Hampshire Instruments, Inc. Gap sensing/adjustment apparatus and method for a lithography machine
US5416821A (en) * 1993-05-10 1995-05-16 Trw Inc. Grid formed with a silicon substrate
GB2277998A (en) * 1993-05-13 1994-11-16 Marconi Gec Ltd Mask and apparatus for producing microlenses
JP3100842B2 (ja) * 1994-09-05 2000-10-23 キヤノン株式会社 半導体露光装置及び露光方法
US5434424A (en) * 1994-09-21 1995-07-18 International Business Machines Corporation Spinning reticle scanning projection lithography exposure system and method
JPH08115872A (ja) * 1994-10-13 1996-05-07 Nikon Corp 露光装置
JP3950518B2 (ja) * 1997-06-27 2007-08-01 キヤノン株式会社 回折光学素子の製造方法
CN1318914C (zh) * 2003-09-22 2007-05-30 南亚科技股份有限公司 制作晶圆试片的方法及评估掩膜图案间迭对位准的方法
US20100012855A1 (en) * 2005-06-03 2010-01-21 Rudolph Technologies, Inc Wafer Scanning
CN100478789C (zh) * 2005-09-28 2009-04-15 中国科学院自动化研究所 掩模传输系统四象限对准装置
US8815013B2 (en) * 2006-07-19 2014-08-26 Intermolecular, Inc. Method and system for isolated and discretized process sequence integration
EP2044623A4 (en) * 2006-07-19 2012-10-03 Intermolecular Inc METHOD AND SYSTEM FOR INTEGRATING ISOLATED AND DISCRETED PROCESSES
US8299446B2 (en) * 2009-08-12 2012-10-30 Ultratech, Inc. Sub-field enhanced global alignment
WO2014060149A1 (en) * 2012-10-17 2014-04-24 Asml Netherlands B.V. Sensor system for lithography

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3181419A (en) * 1961-09-15 1965-05-04 Gen Motors Corp Method and apparatus for producing dials
US3875416A (en) * 1970-06-30 1975-04-01 Texas Instruments Inc Methods and apparatus for the production of semiconductor devices by electron-beam patterning and devices produced thereby
US4260670A (en) * 1979-07-12 1981-04-07 Western Electric Company, Inc. X-ray mask
US4385238A (en) * 1981-03-03 1983-05-24 Veeco Instruments Incorporated Reregistration system for a charged particle beam exposure system
US4430571A (en) * 1981-04-16 1984-02-07 Control Data Corporation Method and apparatus for exposing multi-level registered patterns interchangeably between stations of a multi-station electron-beam array lithography (EBAL) system

Also Published As

Publication number Publication date
EP0150129A2 (en) 1985-07-31
EP0150129B1 (en) 1988-06-15
US4613981A (en) 1986-09-23
EP0150129A3 (en) 1985-08-21
JPS60164324A (ja) 1985-08-27
DE3563392D1 (en) 1988-07-21

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