JPH0461311B2 - - Google Patents

Info

Publication number
JPH0461311B2
JPH0461311B2 JP58076583A JP7658383A JPH0461311B2 JP H0461311 B2 JPH0461311 B2 JP H0461311B2 JP 58076583 A JP58076583 A JP 58076583A JP 7658383 A JP7658383 A JP 7658383A JP H0461311 B2 JPH0461311 B2 JP H0461311B2
Authority
JP
Japan
Prior art keywords
terminal
switch
power supply
amplifier
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58076583A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59202080A (ja
Inventor
Akira Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP58076583A priority Critical patent/JPS59202080A/ja
Publication of JPS59202080A publication Critical patent/JPS59202080A/ja
Publication of JPH0461311B2 publication Critical patent/JPH0461311B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58076583A 1983-04-30 1983-04-30 論理回路試験装置 Granted JPS59202080A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58076583A JPS59202080A (ja) 1983-04-30 1983-04-30 論理回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58076583A JPS59202080A (ja) 1983-04-30 1983-04-30 論理回路試験装置

Publications (2)

Publication Number Publication Date
JPS59202080A JPS59202080A (ja) 1984-11-15
JPH0461311B2 true JPH0461311B2 (en:Method) 1992-09-30

Family

ID=13609300

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58076583A Granted JPS59202080A (ja) 1983-04-30 1983-04-30 論理回路試験装置

Country Status (1)

Country Link
JP (1) JPS59202080A (en:Method)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3599989B2 (ja) * 1997-12-09 2004-12-08 日立ハイテク電子エンジニアリング株式会社 電子デバイスへの負荷電流出力回路およびｉｃテスタ

Also Published As

Publication number Publication date
JPS59202080A (ja) 1984-11-15

Similar Documents

Publication Publication Date Title
JPH0461311B2 (en:Method)
US7026822B1 (en) High voltage switching matrix for electrical safety compliance test equipment
JP3239864B2 (ja) 電源／ｇｎｄ端子導通試験用テストボード
JPH03277983A (ja) Ｄｂ型ａｓによるｄｕｔ負荷切換回路
KR20020005360A (ko) 액정표시기의 검사용 신호분배 장치
JP3433568B2 (ja) 終端回路
JP3495545B2 (ja) 溶存酸素またはｐＨを測定する装置
JPS6125078A (ja) プリント板検査装置
US7271600B2 (en) Semiconductor switch circuit
JPH0442784Y2 (en:Method)
KR100215837B1 (ko) 핀 일렉트로닉스
JP3461258B2 (ja) 導電率またはｐＨを測定する装置
JPH0329512A (ja) 半導体アナログスイッチ回路
JPS5876906A (ja) 制御装置の自動試験方法
JPH0547876U (ja) Ｉｃテスタに使用されるｄｃ測定ユニットの自己診断回路
JPS6060572A (ja) Ｉｃテスタ
SU578628A1 (ru) Устройство дл контрол разобщенных цепей электрического монтажа
JPH0126082B2 (en:Method)
JPH0329752Y2 (en:Method)
JPH05157793A (ja) ショートチェック付き電源回路
GB2169087A (en) Testing electronic circuit assemblies including crystal oscillators
JP2579883Y2 (ja) Ｉｃ搬送装置用試験装置
JPH0436208Y2 (en:Method)
SU1661029A1 (ru) Устройство дл контрол работоспособности релейных блоков
SU1684744A1 (ru) Имитатор коротких замыканий