JPH0452901B2 - - Google Patents

Info

Publication number
JPH0452901B2
JPH0452901B2 JP59020705A JP2070584A JPH0452901B2 JP H0452901 B2 JPH0452901 B2 JP H0452901B2 JP 59020705 A JP59020705 A JP 59020705A JP 2070584 A JP2070584 A JP 2070584A JP H0452901 B2 JPH0452901 B2 JP H0452901B2
Authority
JP
Japan
Prior art keywords
voltage
dut
value
under test
diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59020705A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59171869A (ja
Inventor
Emu Biizurii Totsudo
Deiin Deiraa Karubin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS59171869A publication Critical patent/JPS59171869A/ja
Publication of JPH0452901B2 publication Critical patent/JPH0452901B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP59020705A 1983-02-07 1984-02-07 電気素子の直線性及び非直線性の検出方法 Granted JPS59171869A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/464,796 US4547724A (en) 1983-02-07 1983-02-07 Method and apparatus for detection of non-linear electrical devices
US464796 1990-01-16

Publications (2)

Publication Number Publication Date
JPS59171869A JPS59171869A (ja) 1984-09-28
JPH0452901B2 true JPH0452901B2 (OSRAM) 1992-08-25

Family

ID=23845257

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59020705A Granted JPS59171869A (ja) 1983-02-07 1984-02-07 電気素子の直線性及び非直線性の検出方法

Country Status (6)

Country Link
US (1) US4547724A (OSRAM)
JP (1) JPS59171869A (OSRAM)
DE (1) DE3404192A1 (OSRAM)
FR (1) FR2540634B1 (OSRAM)
GB (1) GB2135066B (OSRAM)
NL (1) NL188481C (OSRAM)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0785096B2 (ja) * 1986-10-08 1995-09-13 横河・ヒユ−レツト・パツカ−ド株式会社 セトリング特性測定方法
GB9002811D0 (en) * 1990-02-08 1990-04-04 Du Pont Uk Inductance and resistance measuring circuit
JPH0716838U (ja) * 1993-08-31 1995-03-20 株式会社長谷川工業所 雨樋吊り固定具
JP2715927B2 (ja) * 1994-09-02 1998-02-18 日本電気株式会社 プリスケーラｉｃテスト方法及びプリスケーラｉｃテスト装置
JP4752264B2 (ja) * 2004-12-21 2011-08-17 Ｊｆｅスチール株式会社 溶鉱炉内の溶融物レベル計測方法及び装置
US7808226B1 (en) 2005-10-26 2010-10-05 Research Electronics International Line tracing method and apparatus utilizing non-linear junction detecting locator probe
US7212008B1 (en) 2005-11-03 2007-05-01 Barsumian Bruce R Surveillance device detection utilizing non linear junction detection and reflectometry

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1201477B (de) * 1963-06-10 1965-09-23 Intermetall Schaltung zum Ermitteln des Spannungsabfalles an einem Pruefling mit nichtlinearer Stromspannungskennlinie bei einem vorgegebenen konstanten Strom
US3443215A (en) * 1965-09-15 1969-05-06 Frank R Bradley Impedance measuring bridge with voltage divider providing constant source impedance to bridge
CA997481A (en) * 1972-12-29 1976-09-21 International Business Machines Corporation Dc testing of integrated circuits and a novel integrated circuit structure to facilitate such testing
SE433782B (sv) * 1977-10-31 1984-06-12 Western Electric Co Forfarande och anordning for testning av elektriska ledarelement
JPS55130222A (en) * 1979-03-30 1980-10-08 Takayoshi Hirata Generator of composite pulse for distortion measurement
DE2915491A1 (de) * 1979-04-17 1980-10-23 Siemens Ag Schaltungsanordnung zum messen von widerstaenden oder leitwerten

Also Published As

Publication number Publication date
GB2135066A (en) 1984-08-22
JPS59171869A (ja) 1984-09-28
NL188481C (nl) 1992-07-01
GB2135066B (en) 1986-09-24
NL8400387A (nl) 1984-09-03
FR2540634B1 (fr) 1987-08-28
US4547724A (en) 1985-10-15
FR2540634A1 (fr) 1984-08-10
NL188481B (nl) 1992-02-03
DE3404192C2 (OSRAM) 1987-11-19
DE3404192A1 (de) 1984-08-30
GB8402220D0 (en) 1984-02-29

Similar Documents

Publication Publication Date Title
US6356086B1 (en) Method and apparatus for the in-circuit testing of a capacitor
US6914435B2 (en) Circuit for measurement of electrical pollution on power line
KR930700855A (ko) 전자 소자 테스트및 리드 검사를 동시에 실행하는 시스템 및 그 방법
JPH0452901B2 (OSRAM)
JPH071289B2 (ja) 分極の影響を除去した導電率測定方法及び装置
EP0706663B2 (en) Electrical test instrument
US3448378A (en) Impedance measuring instrument having a voltage divider comprising a pair of amplifiers
JPH01165973A (ja) 直流回路の絶縁抵抗測定装置
US4129826A (en) Circuit test apparatus
US4259631A (en) Method and arrangement for measuring the attenuation-versus-frequency characteristics of two-ports
JP4126895B2 (ja) コンデンサのスクリーニング方法
WO2023085057A1 (ja) 測定装置および測定方法
RU2240571C1 (ru) Устройство контроля технического состояния обмоток трансформатора
JP3545886B2 (ja) 絶縁抵抗測定装置
JP4674005B2 (ja) 電源装置、及び試験装置
GB2337337A (en) Method and means for determining the polarity of a capacitor
JPH04109174A (ja) インピーダンス測定装置
SU1580288A1 (ru) Способ определени полного сопротивлени двухполюсника
JP3255817B2 (ja) イオン濃度測定装置
Liu et al. Application of discrete fourier transform to electronic measurements
SU1705771A1 (ru) Устройство дл проверки электрических схем
JP3389528B2 (ja) インピーダンス／電圧変換装置
SU1122983A1 (ru) Устройство дл измерени коэффициента усилени по току транзисторов
KR100316944B1 (ko) 임피던스 모드 측정장치 및 방법
US4820969A (en) Polarity compensated apparatus for measuring the impedance of a polar device

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees