DE3404192C2 - - Google Patents
Info
- Publication number
- DE3404192C2 DE3404192C2 DE3404192A DE3404192A DE3404192C2 DE 3404192 C2 DE3404192 C2 DE 3404192C2 DE 3404192 A DE3404192 A DE 3404192A DE 3404192 A DE3404192 A DE 3404192A DE 3404192 C2 DE3404192 C2 DE 3404192C2
- Authority
- DE
- Germany
- Prior art keywords
- voltage
- tested
- dut
- component
- circuit component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims description 15
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims 1
- 238000012360 testing method Methods 0.000 description 22
- 238000005259 measurement Methods 0.000 description 18
- 238000004364 calculation method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/464,796 US4547724A (en) | 1983-02-07 | 1983-02-07 | Method and apparatus for detection of non-linear electrical devices |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3404192A1 DE3404192A1 (de) | 1984-08-30 |
| DE3404192C2 true DE3404192C2 (OSRAM) | 1987-11-19 |
Family
ID=23845257
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19843404192 Granted DE3404192A1 (de) | 1983-02-07 | 1984-02-07 | Verfahren und anordnung zur identifizierung der elektrischen charakteristik einer komponente als nicht-linear |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4547724A (OSRAM) |
| JP (1) | JPS59171869A (OSRAM) |
| DE (1) | DE3404192A1 (OSRAM) |
| FR (1) | FR2540634B1 (OSRAM) |
| GB (1) | GB2135066B (OSRAM) |
| NL (1) | NL188481C (OSRAM) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0785096B2 (ja) * | 1986-10-08 | 1995-09-13 | 横河・ヒユ−レツト・パツカ−ド株式会社 | セトリング特性測定方法 |
| GB9002811D0 (en) * | 1990-02-08 | 1990-04-04 | Du Pont Uk | Inductance and resistance measuring circuit |
| JPH0716838U (ja) * | 1993-08-31 | 1995-03-20 | 株式会社長谷川工業所 | 雨樋吊り固定具 |
| JP2715927B2 (ja) * | 1994-09-02 | 1998-02-18 | 日本電気株式会社 | プリスケーラｉｃテスト方法及びプリスケーラｉｃテスト装置 |
| JP4752264B2 (ja) * | 2004-12-21 | 2011-08-17 | Ｊｆｅスチール株式会社 | 溶鉱炉内の溶融物レベル計測方法及び装置 |
| US7808226B1 (en) | 2005-10-26 | 2010-10-05 | Research Electronics International | Line tracing method and apparatus utilizing non-linear junction detecting locator probe |
| US7212008B1 (en) | 2005-11-03 | 2007-05-01 | Barsumian Bruce R | Surveillance device detection utilizing non linear junction detection and reflectometry |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1201477B (de) * | 1963-06-10 | 1965-09-23 | Intermetall | Schaltung zum Ermitteln des Spannungsabfalles an einem Pruefling mit nichtlinearer Stromspannungskennlinie bei einem vorgegebenen konstanten Strom |
| US3443215A (en) * | 1965-09-15 | 1969-05-06 | Frank R Bradley | Impedance measuring bridge with voltage divider providing constant source impedance to bridge |
| CA997481A (en) * | 1972-12-29 | 1976-09-21 | International Business Machines Corporation | Dc testing of integrated circuits and a novel integrated circuit structure to facilitate such testing |
| SE433782B (sv) * | 1977-10-31 | 1984-06-12 | Western Electric Co | Forfarande och anordning for testning av elektriska ledarelement |
| JPS55130222A (en) * | 1979-03-30 | 1980-10-08 | Takayoshi Hirata | Generator of composite pulse for distortion measurement |
| DE2915491A1 (de) * | 1979-04-17 | 1980-10-23 | Siemens Ag | Schaltungsanordnung zum messen von widerstaenden oder leitwerten |
-
1983
- 1983-02-07 US US06/464,796 patent/US4547724A/en not_active Expired - Lifetime
-
1984
- 1984-01-27 GB GB08402220A patent/GB2135066B/en not_active Expired
- 1984-02-07 JP JP59020705A patent/JPS59171869A/ja active Granted
- 1984-02-07 FR FR8401900A patent/FR2540634B1/fr not_active Expired
- 1984-02-07 DE DE19843404192 patent/DE3404192A1/de active Granted
- 1984-02-07 NL NLAANVRAGE8400387,A patent/NL188481C/xx not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| GB2135066A (en) | 1984-08-22 |
| JPH0452901B2 (OSRAM) | 1992-08-25 |
| JPS59171869A (ja) | 1984-09-28 |
| NL188481C (nl) | 1992-07-01 |
| GB2135066B (en) | 1986-09-24 |
| NL8400387A (nl) | 1984-09-03 |
| FR2540634B1 (fr) | 1987-08-28 |
| US4547724A (en) | 1985-10-15 |
| FR2540634A1 (fr) | 1984-08-10 |
| NL188481B (nl) | 1992-02-03 |
| DE3404192A1 (de) | 1984-08-30 |
| GB8402220D0 (en) | 1984-02-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8181 | Inventor (new situation) |
Free format text: BEAZLEY, TODD M., ALOHA, OREG., US DILLER, CALVIN D., BEAVERTON, OREG., US |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition |