JPH0451917B2 - - Google Patents

Info

Publication number
JPH0451917B2
JPH0451917B2 JP9569185A JP9569185A JPH0451917B2 JP H0451917 B2 JPH0451917 B2 JP H0451917B2 JP 9569185 A JP9569185 A JP 9569185A JP 9569185 A JP9569185 A JP 9569185A JP H0451917 B2 JPH0451917 B2 JP H0451917B2
Authority
JP
Japan
Prior art keywords
memory
memory cell
bit line
transistor
injector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9569185A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60246099A (ja
Inventor
Gyuntaa Adamu Furitsutsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Micronas GmbH
Original Assignee
Deutsche ITT Industries GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsche ITT Industries GmbH filed Critical Deutsche ITT Industries GmbH
Publication of JPS60246099A publication Critical patent/JPS60246099A/ja
Publication of JPH0451917B2 publication Critical patent/JPH0451917B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Static Random-Access Memory (AREA)
JP60095691A 1984-05-07 1985-05-07 半導体フローテイングゲートメモリセル Granted JPS60246099A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP84105116A EP0160720B1 (de) 1984-05-07 1984-05-07 Halbleiterspeicherzelle mit einem potentialmässig schwebenden Speichergate
EP84105116,2 1984-05-07

Publications (2)

Publication Number Publication Date
JPS60246099A JPS60246099A (ja) 1985-12-05
JPH0451917B2 true JPH0451917B2 (en, 2012) 1992-08-20

Family

ID=8191928

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60095691A Granted JPS60246099A (ja) 1984-05-07 1985-05-07 半導体フローテイングゲートメモリセル

Country Status (5)

Country Link
US (1) US4580247A (en, 2012)
EP (1) EP0160720B1 (en, 2012)
JP (1) JPS60246099A (en, 2012)
AU (1) AU4171085A (en, 2012)
DE (1) DE3468592D1 (en, 2012)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4787047A (en) * 1985-03-22 1988-11-22 Intersil Electrically erasable fused programmable logic array
US4933904A (en) * 1985-11-29 1990-06-12 General Electric Company Dense EPROM having serially coupled floating gate transistors
US4758988A (en) * 1985-12-12 1988-07-19 Motorola, Inc. Dual array EEPROM for high endurance capability
US5245566A (en) * 1987-04-24 1993-09-14 Fujio Masuoka Programmable semiconductor
US5313420A (en) 1987-04-24 1994-05-17 Kabushiki Kaisha Toshiba Programmable semiconductor memory
US5719805A (en) * 1987-04-24 1998-02-17 Kabushiki Kaisha Toshiba Electrically programmable non-volatile semiconductor memory including series connected memory cells and decoder circuitry for applying a ground voltage to non-selected circuit units
US5008856A (en) * 1987-06-29 1991-04-16 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with NAND cell structure
US5448517A (en) * 1987-06-29 1995-09-05 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with NAND cell structure
US6034899A (en) * 1987-06-29 2000-03-07 Kabushiki Kaisha Toshiba Memory cell of nonvolatile semiconductor memory device
US6545913B2 (en) 1987-06-29 2003-04-08 Kabushiki Kaisha Toshiba Memory cell of nonvolatile semiconductor memory device
US5877981A (en) * 1987-06-29 1999-03-02 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device having a matrix of memory cells
US5270969A (en) * 1987-06-29 1993-12-14 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with nand cell structure
JP2856395B2 (ja) * 1987-11-09 1999-02-10 日本電気アイシーマイコンシステム株式会社 半導体集積回路
US4939690A (en) * 1987-12-28 1990-07-03 Kabushiki Kaisha Toshiba Electrically erasable programmable read-only memory with NAND cell structure that suppresses memory cell threshold voltage variation
US4845538A (en) * 1988-02-05 1989-07-04 Emanuel Hazani E2 prom cell including isolated control diffusion
US4855955A (en) * 1988-04-08 1989-08-08 Seeq Technology, Inc. Three transistor high endurance eeprom cell
JPH01273350A (ja) * 1988-04-25 1989-11-01 Nec Corp 不揮発性半導体記憶装置
US5005155A (en) * 1988-06-15 1991-04-02 Advanced Micro Devices, Inc. Optimized electrically erasable PLA cell for minimum read disturb
US5295096A (en) * 1988-07-11 1994-03-15 Mitsubishi Denki Kabushiki Kaisha NAND type EEPROM and operating method therefor
KR910007434B1 (ko) * 1988-12-15 1991-09-26 삼성전자 주식회사 전기적으로 소거 및 프로그램 가능한 반도체 메모리장치 및 그 소거 및 프로그램 방법
KR910004166B1 (ko) * 1988-12-27 1991-06-22 삼성전자주식회사 낸드쎌들을 가지는 전기적으로 소거 및 프로그램 가능한 반도체 메모리장치
JP2580752B2 (ja) * 1988-12-27 1997-02-12 日本電気株式会社 不揮発性半導体記憶装置
JP3060680B2 (ja) * 1990-11-30 2000-07-10 日本電気株式会社 不揮発性半導体記憶装置
JP3342730B2 (ja) * 1993-03-17 2002-11-11 富士通株式会社 不揮発性半導体記憶装置
DE69326154T2 (de) * 1993-11-30 2000-02-24 Stmicroelectronics S.R.L., Agrate Brianza Integrierte Schaltung für die Programmierung einer Speicherzelle eines nicht flüchtigen Speicherregisters
JP3450467B2 (ja) * 1993-12-27 2003-09-22 株式会社東芝 不揮発性半導体記憶装置及びその製造方法
US5889410A (en) * 1996-05-22 1999-03-30 International Business Machines Corporation Floating gate interlevel defect monitor and method
US7450433B2 (en) * 2004-12-29 2008-11-11 Sandisk Corporation Word line compensation in non-volatile memory erase operations
US7522457B2 (en) * 2005-03-31 2009-04-21 Sandisk Corporation Systems for erase voltage manipulation in non-volatile memory for controlled shifts in threshold voltage
US7408804B2 (en) 2005-03-31 2008-08-05 Sandisk Corporation Systems for soft programming non-volatile memory utilizing individual verification and additional soft programming of subsets of memory cells
US7457166B2 (en) * 2005-03-31 2008-11-25 Sandisk Corporation Erase voltage manipulation in non-volatile memory for controlled shifts in threshold voltage
US7535766B2 (en) * 2006-10-13 2009-05-19 Sandisk Corporation Systems for partitioned soft programming in non-volatile memory
US7499317B2 (en) * 2006-10-13 2009-03-03 Sandisk Corporation System for partitioned erase and erase verification in a non-volatile memory to compensate for capacitive coupling
US7495954B2 (en) * 2006-10-13 2009-02-24 Sandisk Corporation Method for partitioned erase and erase verification to compensate for capacitive coupling effects in non-volatile memory
US7499338B2 (en) * 2006-10-13 2009-03-03 Sandisk Corporation Partitioned soft programming in non-volatile memory
JP5467761B2 (ja) * 2008-12-01 2014-04-09 ローム株式会社 Ｅｅｐｒｏｍ
JP5301020B2 (ja) * 2012-07-24 2013-09-25 ルネサスエレクトロニクス株式会社 半導体装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0053075B1 (en) * 1980-11-26 1988-04-20 Fujitsu Limited Nonvolatile memory
JPS57130298A (en) * 1981-02-06 1982-08-12 Hitachi Ltd Semiconductor integrated circuit memory and relieving method for its fault

Also Published As

Publication number Publication date
DE3468592D1 (en) 1988-02-11
AU4171085A (en) 1985-11-14
JPS60246099A (ja) 1985-12-05
EP0160720B1 (de) 1988-01-07
EP0160720A1 (de) 1985-11-13
US4580247A (en) 1986-04-01

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Legal Events

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LAPS Cancellation because of no payment of annual fees