JPH0444211B2 - - Google Patents
Info
- Publication number
- JPH0444211B2 JPH0444211B2 JP61191532A JP19153286A JPH0444211B2 JP H0444211 B2 JPH0444211 B2 JP H0444211B2 JP 61191532 A JP61191532 A JP 61191532A JP 19153286 A JP19153286 A JP 19153286A JP H0444211 B2 JPH0444211 B2 JP H0444211B2
- Authority
- JP
- Japan
- Prior art keywords
- grating
- pitch
- scale
- main scale
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
- Automatic Control Of Machine Tools (AREA)
Priority Applications (11)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19153286A JPS6347615A (ja) | 1986-08-15 | 1986-08-15 | 光学式変位検出器 |
| US07/082,593 US4912322A (en) | 1986-08-15 | 1987-08-07 | Optical type displacement detecting device |
| IN615/CAL/87A IN168444B (enEXAMPLES) | 1986-08-15 | 1987-08-07 | |
| DE3727188A DE3727188C2 (de) | 1986-08-15 | 1987-08-14 | Optische Verschiebungserfassungseinrichtung |
| GB8719257A GB2194044B (en) | 1986-08-15 | 1987-08-14 | Optical type displacement detecting device |
| CN87106274.7A CN1013705B (zh) | 1986-08-15 | 1987-08-15 | 光学式位移检测装置 |
| GB9004757A GB2228320B (en) | 1986-08-15 | 1990-03-02 | Optical type displacement detecting device |
| GB9004758A GB2228321B (en) | 1986-08-15 | 1990-03-02 | Optical type replacement detecting device |
| IN234/CAL/90A IN169777B (enEXAMPLES) | 1986-08-15 | 1990-03-21 | |
| IN235/CAL/90A IN169778B (enEXAMPLES) | 1986-08-15 | 1990-03-21 | |
| IN236/CAL/90A IN169779B (enEXAMPLES) | 1986-08-15 | 1990-03-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19153286A JPS6347615A (ja) | 1986-08-15 | 1986-08-15 | 光学式変位検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6347615A JPS6347615A (ja) | 1988-02-29 |
| JPH0444211B2 true JPH0444211B2 (enEXAMPLES) | 1992-07-21 |
Family
ID=16276233
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19153286A Granted JPS6347615A (ja) | 1986-08-15 | 1986-08-15 | 光学式変位検出器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6347615A (enEXAMPLES) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5345269B2 (ja) * | 1999-10-26 | 2013-11-20 | シチズンホールディングス株式会社 | 光学式変位測定装置 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01212316A (ja) * | 1988-02-19 | 1989-08-25 | Omron Tateisi Electron Co | 光学式エンコーダ |
| KR100326170B1 (ko) * | 2000-03-30 | 2002-02-27 | 윤종용 | 광소자의 광도파로열 피치를 측정하는 장치 |
| JP4833543B2 (ja) * | 2004-12-09 | 2011-12-07 | 株式会社ミツトヨ | 光電式エンコーダ、それに用いるスケール及びその製造方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2826213B2 (de) * | 1978-06-15 | 1980-06-04 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Photoelektrisches inkrementales Längen- und Winkelmeßsystem |
-
1986
- 1986-08-15 JP JP19153286A patent/JPS6347615A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5345269B2 (ja) * | 1999-10-26 | 2013-11-20 | シチズンホールディングス株式会社 | 光学式変位測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6347615A (ja) | 1988-02-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |