JPH0435024B2 - - Google Patents

Info

Publication number
JPH0435024B2
JPH0435024B2 JP723785A JP723785A JPH0435024B2 JP H0435024 B2 JPH0435024 B2 JP H0435024B2 JP 723785 A JP723785 A JP 723785A JP 723785 A JP723785 A JP 723785A JP H0435024 B2 JPH0435024 B2 JP H0435024B2
Authority
JP
Japan
Prior art keywords
terminal
crimped
electric wire
wire
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP723785A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61165645A (ja
Inventor
Masakazu Kobayashi
Takashi Matsubara
Masao Ueda
Hiroaki Miki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinmaywa Industries Ltd
Original Assignee
Shin Meiva Industry Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Meiva Industry Ltd filed Critical Shin Meiva Industry Ltd
Priority to JP723785A priority Critical patent/JPS61165645A/ja
Publication of JPS61165645A publication Critical patent/JPS61165645A/ja
Publication of JPH0435024B2 publication Critical patent/JPH0435024B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP723785A 1985-01-17 1985-01-17 端子圧着電線の端子圧着部検査装置 Granted JPS61165645A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP723785A JPS61165645A (ja) 1985-01-17 1985-01-17 端子圧着電線の端子圧着部検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP723785A JPS61165645A (ja) 1985-01-17 1985-01-17 端子圧着電線の端子圧着部検査装置

Publications (2)

Publication Number Publication Date
JPS61165645A JPS61165645A (ja) 1986-07-26
JPH0435024B2 true JPH0435024B2 (enrdf_load_stackoverflow) 1992-06-09

Family

ID=11660386

Family Applications (1)

Application Number Title Priority Date Filing Date
JP723785A Granted JPS61165645A (ja) 1985-01-17 1985-01-17 端子圧着電線の端子圧着部検査装置

Country Status (1)

Country Link
JP (1) JPS61165645A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4914602A (en) * 1987-05-13 1990-04-03 Furukawa Electric Co., Ltd. Method for detecting the molding defectiveness of a press-molded workpiece and a terminal press-bonding apparatus utilizing the same

Also Published As

Publication number Publication date
JPS61165645A (ja) 1986-07-26

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