JPH0421881U - - Google Patents

Info

Publication number
JPH0421881U
JPH0421881U JP6079990U JP6079990U JPH0421881U JP H0421881 U JPH0421881 U JP H0421881U JP 6079990 U JP6079990 U JP 6079990U JP 6079990 U JP6079990 U JP 6079990U JP H0421881 U JPH0421881 U JP H0421881U
Authority
JP
Japan
Prior art keywords
performance board
pin card
motherboard
board
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6079990U
Other languages
English (en)
Japanese (ja)
Other versions
JP2537892Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990060799U priority Critical patent/JP2537892Y2/ja
Publication of JPH0421881U publication Critical patent/JPH0421881U/ja
Application granted granted Critical
Publication of JP2537892Y2 publication Critical patent/JP2537892Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1990060799U 1990-06-08 1990-06-08 Ｉｃ試験装置 Expired - Lifetime JP2537892Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0421881U true JPH0421881U (en, 2012) 1992-02-24
JP2537892Y2 JP2537892Y2 (ja) 1997-06-04

Family

ID=31588481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990060799U Expired - Lifetime JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2537892Y2 (en, 2012)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999042851A1 (fr) * 1998-02-20 1999-08-26 Advantest Corporation Structure d'interface de dispositif de test
JP2003503712A (ja) * 1999-06-28 2003-01-28 テラダイン・インコーポレーテッド 半導体並列テスタ
JP2007078675A (ja) * 2005-09-15 2007-03-29 Agilent Technol Inc プローブアセンブリおよびこれを利用した装置
WO2008062579A1 (en) * 2006-11-22 2008-05-29 Panasonic Corporation Semiconductor inspection equipment
WO2010052761A1 (ja) * 2008-11-04 2010-05-14 株式会社アドバンテスト コネクタ着脱装置およびテストヘッド

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960269A (ja) * 1982-09-29 1984-04-06 Nec Corp 汎用フイクスチヤ−
JPS62120289U (en, 2012) * 1986-01-22 1987-07-30
JPS63153481A (ja) * 1986-12-18 1988-06-25 Asia Electron Kk 集積回路測定用接続装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960269A (ja) * 1982-09-29 1984-04-06 Nec Corp 汎用フイクスチヤ−
JPS62120289U (en, 2012) * 1986-01-22 1987-07-30
JPS63153481A (ja) * 1986-12-18 1988-06-25 Asia Electron Kk 集積回路測定用接続装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999042851A1 (fr) * 1998-02-20 1999-08-26 Advantest Corporation Structure d'interface de dispositif de test
JP2003503712A (ja) * 1999-06-28 2003-01-28 テラダイン・インコーポレーテッド 半導体並列テスタ
JP2007078675A (ja) * 2005-09-15 2007-03-29 Agilent Technol Inc プローブアセンブリおよびこれを利用した装置
WO2008062579A1 (en) * 2006-11-22 2008-05-29 Panasonic Corporation Semiconductor inspection equipment
WO2010052761A1 (ja) * 2008-11-04 2010-05-14 株式会社アドバンテスト コネクタ着脱装置およびテストヘッド
JP5161975B2 (ja) * 2008-11-04 2013-03-13 株式会社アドバンテスト コネクタ着脱装置およびテストヘッド

Also Published As

Publication number Publication date
JP2537892Y2 (ja) 1997-06-04

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