JPH0418602B2 - - Google Patents
Info
- Publication number
- JPH0418602B2 JPH0418602B2 JP15727583A JP15727583A JPH0418602B2 JP H0418602 B2 JPH0418602 B2 JP H0418602B2 JP 15727583 A JP15727583 A JP 15727583A JP 15727583 A JP15727583 A JP 15727583A JP H0418602 B2 JPH0418602 B2 JP H0418602B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- sonde
- light guide
- laser beam
- surrounding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 8
- 239000004020 conductor Substances 0.000 claims description 7
- 230000001681 protective effect Effects 0.000 claims description 5
- 230000004907 flux Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims 1
- 239000003365 glass fiber Substances 0.000 description 15
- 230000007547 defect Effects 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 238000012512 characterization method Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000011152 fibreglass Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
Landscapes
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Viewing The Inside Of Hollow Bodies (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19823232904 DE3232904A1 (de) | 1982-09-04 | 1982-09-04 | Sonde zum automatischen pruefen von oberflaechen |
| DE3232904.0 | 1982-09-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5965708A JPS5965708A (ja) | 1984-04-14 |
| JPH0418602B2 true JPH0418602B2 (fr) | 1992-03-27 |
Family
ID=6172461
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15727583A Granted JPS5965708A (ja) | 1982-09-04 | 1983-08-30 | 自動表面検査用のゾンデ |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPS5965708A (fr) |
| CH (1) | CH660629A5 (fr) |
| DE (1) | DE3232904A1 (fr) |
| GB (1) | GB2126715B (fr) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4712916A (en) * | 1985-01-28 | 1987-12-15 | International Business Machines Corporation | Apparatus for inspection of the walls of deep holes of minute diameter |
| JPS6214042A (ja) * | 1985-07-12 | 1987-01-22 | Toyo Seikan Kaisha Ltd | 缶内部モニタ装置 |
| DE3932151A1 (de) * | 1989-09-22 | 1991-04-04 | Peter Rohleder | Vorrichtung zur scannenden erfassung eines innenraums |
| DE4320845C1 (de) * | 1993-06-23 | 1994-10-27 | Fraunhofer Ges Forschung | Anordnung zur Messung von Streulicht in Bohrungen von Werkstücken oder in Rohren |
| DE4322173C1 (de) * | 1993-07-03 | 1994-08-04 | Fraunhofer Ges Forschung | Vorrichtung zum Abtasten der Oberfläche eines Hohlraumes mit Hilfe eines Lichtstrahles |
| DE4416493A1 (de) * | 1994-05-10 | 1995-11-16 | Bosch Gmbh Robert | Oberflächenprüfvorrichtung |
| DE19632763C2 (de) * | 1996-08-14 | 1998-09-10 | Holger Moritz | Meßkopf für die Beobachtung der Photolackentwicklung |
| DE19714202A1 (de) | 1997-04-07 | 1998-10-15 | Bosch Gmbh Robert | Vorrichtung zum optischen Prüfen von Oberflächen |
| GB2384555B (en) * | 2001-01-16 | 2005-05-04 | Teraview Ltd | Apparatus and method for investigating a sample |
| WO2007060873A1 (fr) * | 2005-11-24 | 2007-05-31 | Kirin Techno-System Corporation | Dispositif d’examen de surface |
| KR101010843B1 (ko) * | 2006-05-16 | 2011-01-25 | 가부시끼가이샤 케이티에스 옵틱스 | 표면 검사 장치 및 표면 검사 헤드 장치 |
| JP4923209B2 (ja) * | 2006-05-23 | 2012-04-25 | キリンテクノシステム株式会社 | 表面検査装置 |
| JP4923210B2 (ja) * | 2006-05-23 | 2012-04-25 | キリンテクノシステム株式会社 | 表面検査装置 |
| EP1882809B1 (fr) * | 2006-07-24 | 2011-04-13 | Services Pétroliers Schlumberger | Procédés et appareil de micro-imagerie |
| DE102007045567A1 (de) * | 2007-09-24 | 2009-04-02 | Robert Bosch Gmbh | Sonde und Vorrichtung zum optischen Prüfen von Oberflächen |
| JP5265290B2 (ja) * | 2008-10-01 | 2013-08-14 | シグマ株式会社 | 表面検査装置 |
| DE202008017935U1 (de) | 2008-10-07 | 2010-12-30 | Fionec Gmbh | Optische Sonde (II) |
| DE102008050258A1 (de) | 2008-10-07 | 2010-04-08 | Fionec Gmbh | Optische Sonde (I) |
| DE102009019459B4 (de) | 2009-05-04 | 2012-02-02 | Hommel-Etamic Gmbh | Vorrichtung zur Abbildung der Innenfläche eines Hohlraumes in einem Werkstück |
| DE102010035147B4 (de) | 2010-08-23 | 2016-07-28 | Jenoptik Industrial Metrology Germany Gmbh | Meßvorrichtung |
| US8508743B2 (en) | 2011-03-04 | 2013-08-13 | Hommel-Etamic Gmbh | Crankshaft testing method |
| DE102012018580B4 (de) | 2012-09-20 | 2015-06-11 | Jenoptik Industrial Metrology Germany Gmbh | Messvorrichtung und Messverfahren zur Inprozess-Messung an Prüflingen während eines Bearbeitungsvorganges an einer Bearbeitungsmaschine, insbesondere einer Schleifmaschine |
| CN104121872B (zh) * | 2013-04-26 | 2018-04-13 | 通用电气公司 | 表面粗糙度测量装置 |
| DE102014118753A1 (de) | 2014-10-01 | 2016-04-07 | Jenoptik Industrial Metrology Germany Gmbh | Prüfvorrichtung |
| DE102015010225B4 (de) | 2015-08-12 | 2017-09-21 | Jenoptik Industrial Metrology Germany Gmbh | Bohrungsinspektionsvorrichtung |
| DE102016113400B4 (de) | 2015-08-19 | 2023-11-30 | Jenoptik Industrial Metrology Germany Gmbh | Bohrungsinspektionsvorrichtung und Bohrungsinspektionsverfahren |
| DE102017111819B4 (de) | 2017-05-30 | 2021-07-22 | Jenoptik Industrial Metrology Germany Gmbh | Bohrungsinspektionsvorrichtung |
| JPWO2019083009A1 (ja) * | 2017-10-26 | 2020-12-17 | 長野オートメーション株式会社 | 検査システムおよび検査方法 |
| DE102021105629A1 (de) | 2020-03-12 | 2021-09-16 | Jenoptik Industrial Metrology Germany Gmbh | Bohrungsinspektionsvorrichtung |
| DE102021112120A1 (de) | 2021-05-10 | 2022-11-10 | Carl Mahr Holding Gmbh | Faseroptische Punktsonde und Distanzmesssystem mit einer faseroptischen Punktsonde |
| DE102022131398A1 (de) | 2022-11-28 | 2024-05-29 | Jenoptik Industrial Metrology Germany Gmbh | Bohrungsinspektionsvorrichtung |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3150266A (en) * | 1961-02-13 | 1964-09-22 | Owens Illinois Glass Co | Inspecting interior wall surfaces of containers |
| US3761186A (en) * | 1972-01-17 | 1973-09-25 | Itt | Apparatus for optically inspecting the condition of a surface having known variations in the condition |
| JPS4990561A (fr) * | 1972-12-28 | 1974-08-29 | ||
| JPS49121587A (fr) * | 1973-03-20 | 1974-11-20 | ||
| NL7501009A (nl) * | 1975-01-29 | 1976-08-02 | Skf Ind Trading & Dev | Apparaat voor het automatisch detecteren van oppervlaktefouten. |
| US4305661A (en) * | 1979-02-27 | 1981-12-15 | Diffracto, Ltd. | Method and apparatus for determining physical characteristics of objects and object surfaces |
| DE3037622C2 (de) * | 1980-10-04 | 1987-02-26 | Theodor Prof. Dr.-Ing. 1000 Berlin Gast | Einrichtung zur Bestimmung der Oberflächengüte |
-
1982
- 1982-09-04 DE DE19823232904 patent/DE3232904A1/de active Granted
-
1983
- 1983-08-04 GB GB08321062A patent/GB2126715B/en not_active Expired
- 1983-08-10 CH CH434883A patent/CH660629A5/de not_active IP Right Cessation
- 1983-08-30 JP JP15727583A patent/JPS5965708A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| GB2126715A (en) | 1984-03-28 |
| JPS5965708A (ja) | 1984-04-14 |
| CH660629A5 (de) | 1987-05-15 |
| DE3232904A1 (de) | 1984-03-08 |
| GB2126715B (en) | 1986-04-16 |
| GB8321062D0 (en) | 1983-09-07 |
| DE3232904C2 (fr) | 1991-02-14 |
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