JPH041458B2 - - Google Patents
Info
- Publication number
- JPH041458B2 JPH041458B2 JP57030593A JP3059382A JPH041458B2 JP H041458 B2 JPH041458 B2 JP H041458B2 JP 57030593 A JP57030593 A JP 57030593A JP 3059382 A JP3059382 A JP 3059382A JP H041458 B2 JPH041458 B2 JP H041458B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- sample
- electron beam
- signal
- address
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57030593A JPS58150256A (ja) | 1982-03-01 | 1982-03-01 | ストロボ走査型電子顕微鏡装置 |
EP83101823A EP0087767B1 (en) | 1982-03-01 | 1983-02-24 | Stroboscopic scanning electron microscope |
DE8383101823T DE3375438D1 (en) | 1982-03-01 | 1983-02-24 | Stroboscopic scanning electron microscope |
US06/470,632 US4538065A (en) | 1982-03-01 | 1983-02-28 | Stroboscopic scanning electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57030593A JPS58150256A (ja) | 1982-03-01 | 1982-03-01 | ストロボ走査型電子顕微鏡装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58150256A JPS58150256A (ja) | 1983-09-06 |
JPH041458B2 true JPH041458B2 (enrdf_load_stackoverflow) | 1992-01-13 |
Family
ID=12308161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57030593A Granted JPS58150256A (ja) | 1982-03-01 | 1982-03-01 | ストロボ走査型電子顕微鏡装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58150256A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6116540A (ja) * | 1984-07-03 | 1986-01-24 | Matsushita Electronics Corp | パタ−ン寸法測定装置 |
JPS6158152A (ja) * | 1984-08-29 | 1986-03-25 | Jeol Ltd | 走査形電子顕微鏡の分析デ−タ処理装置 |
JP2692062B2 (ja) * | 1986-11-05 | 1997-12-17 | 株式会社島津製作所 | 疲労試験機 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5347263A (en) * | 1976-10-12 | 1978-04-27 | Jeol Ltd | Scan-type electronic microscope and its similar device |
JPS5596560U (enrdf_load_stackoverflow) * | 1978-12-27 | 1980-07-04 |
-
1982
- 1982-03-01 JP JP57030593A patent/JPS58150256A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58150256A (ja) | 1983-09-06 |
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