JPH0370814B2 - - Google Patents

Info

Publication number
JPH0370814B2
JPH0370814B2 JP56207212A JP20721281A JPH0370814B2 JP H0370814 B2 JPH0370814 B2 JP H0370814B2 JP 56207212 A JP56207212 A JP 56207212A JP 20721281 A JP20721281 A JP 20721281A JP H0370814 B2 JPH0370814 B2 JP H0370814B2
Authority
JP
Japan
Prior art keywords
data
address
circuit
rom
read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56207212A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58111195A (ja
Inventor
Takashi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP56207212A priority Critical patent/JPS58111195A/ja
Publication of JPS58111195A publication Critical patent/JPS58111195A/ja
Publication of JPH0370814B2 publication Critical patent/JPH0370814B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Calculators And Similar Devices (AREA)
  • Debugging And Monitoring (AREA)
JP56207212A 1981-12-23 1981-12-23 デ−タ破壊検出装置 Granted JPS58111195A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56207212A JPS58111195A (ja) 1981-12-23 1981-12-23 デ−タ破壊検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56207212A JPS58111195A (ja) 1981-12-23 1981-12-23 デ−タ破壊検出装置

Publications (2)

Publication Number Publication Date
JPS58111195A JPS58111195A (ja) 1983-07-02
JPH0370814B2 true JPH0370814B2 (en, 2012) 1991-11-11

Family

ID=16536090

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56207212A Granted JPS58111195A (ja) 1981-12-23 1981-12-23 デ−タ破壊検出装置

Country Status (1)

Country Link
JP (1) JPS58111195A (en, 2012)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2541216B2 (ja) * 1987-04-27 1996-10-09 沖電気工業株式会社 信号処理プロセッサにおける異常動作の検出方法
JPH06324953A (ja) * 1993-05-10 1994-11-25 Mita Ind Co Ltd 書換可能なメモリのメモリチェック方法、その装置及び該装置を有するデータ自動復旧装置

Also Published As

Publication number Publication date
JPS58111195A (ja) 1983-07-02

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