JPH0340940B2 - - Google Patents

Info

Publication number
JPH0340940B2
JPH0340940B2 JP59161422A JP16142284A JPH0340940B2 JP H0340940 B2 JPH0340940 B2 JP H0340940B2 JP 59161422 A JP59161422 A JP 59161422A JP 16142284 A JP16142284 A JP 16142284A JP H0340940 B2 JPH0340940 B2 JP H0340940B2
Authority
JP
Japan
Prior art keywords
electronic component
probe
electronic components
tip
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59161422A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6140041A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16142284A priority Critical patent/JPS6140041A/ja
Publication of JPS6140041A publication Critical patent/JPS6140041A/ja
Publication of JPH0340940B2 publication Critical patent/JPH0340940B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP16142284A 1984-07-31 1984-07-31 電子部品の検査装置 Granted JPS6140041A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16142284A JPS6140041A (ja) 1984-07-31 1984-07-31 電子部品の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16142284A JPS6140041A (ja) 1984-07-31 1984-07-31 電子部品の検査装置

Publications (2)

Publication Number Publication Date
JPS6140041A JPS6140041A (ja) 1986-02-26
JPH0340940B2 true JPH0340940B2 (instruction) 1991-06-20

Family

ID=15734798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16142284A Granted JPS6140041A (ja) 1984-07-31 1984-07-31 電子部品の検査装置

Country Status (1)

Country Link
JP (1) JPS6140041A (instruction)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2557523B2 (ja) * 1989-03-28 1996-11-27 株式会社日立製作所 プロービング装置
JP3896186B2 (ja) * 1997-03-17 2007-03-22 太陽誘電株式会社 チップ状回路部品の計測装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4430779Y1 (instruction) * 1967-07-18 1969-12-18
JPS52127184A (en) * 1976-04-19 1977-10-25 Seiko Epson Corp Semiconductor integrated circuit

Also Published As

Publication number Publication date
JPS6140041A (ja) 1986-02-26

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