JPH0335822B2 - - Google Patents
Info
- Publication number
- JPH0335822B2 JPH0335822B2 JP56180233A JP18023381A JPH0335822B2 JP H0335822 B2 JPH0335822 B2 JP H0335822B2 JP 56180233 A JP56180233 A JP 56180233A JP 18023381 A JP18023381 A JP 18023381A JP H0335822 B2 JPH0335822 B2 JP H0335822B2
- Authority
- JP
- Japan
- Prior art keywords
- region
- substrate
- film
- single crystal
- semiconductor layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02488—Insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02494—Structure
- H01L21/02496—Layer structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02598—Microstructure monocrystalline
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
- H01L21/02689—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth using particle beams
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Recrystallisation Techniques (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56180233A JPS5880831A (ja) | 1981-11-10 | 1981-11-10 | 半導体装置用基板の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56180233A JPS5880831A (ja) | 1981-11-10 | 1981-11-10 | 半導体装置用基板の製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10732489A Division JPH03114219A (ja) | 1989-04-28 | 1989-04-28 | 半導体装置用基板の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5880831A JPS5880831A (ja) | 1983-05-16 |
| JPH0335822B2 true JPH0335822B2 (enExample) | 1991-05-29 |
Family
ID=16079697
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56180233A Granted JPS5880831A (ja) | 1981-11-10 | 1981-11-10 | 半導体装置用基板の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5880831A (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6012722A (ja) * | 1983-07-01 | 1985-01-23 | Agency Of Ind Science & Technol | 薄膜結晶形成法 |
| JPS6017911A (ja) * | 1983-07-11 | 1985-01-29 | Agency Of Ind Science & Technol | 半導体装置の製造方法 |
| JPS6017910A (ja) * | 1983-07-11 | 1985-01-29 | Agency Of Ind Science & Technol | 半導体装置の製造方法 |
| JPH07105338B2 (ja) * | 1985-08-07 | 1995-11-13 | 日本電気株式会社 | 半導体装置の製造方法 |
| JPH03114219A (ja) * | 1989-04-28 | 1991-05-15 | Fujitsu Ltd | 半導体装置用基板の製造方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5658269A (en) * | 1979-10-17 | 1981-05-21 | Seiko Epson Corp | Mos type semiconductor device |
| JPS5678495A (en) * | 1979-11-29 | 1981-06-27 | Toshiba Corp | Preparation of base |
-
1981
- 1981-11-10 JP JP56180233A patent/JPS5880831A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5880831A (ja) | 1983-05-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5371381A (en) | Process for producing single crystal semiconductor layer and semiconductor device produced by said process | |
| JPH0454370B2 (enExample) | ||
| JPS5939790A (ja) | 単結晶の製造方法 | |
| JPH0335822B2 (enExample) | ||
| JPH09260676A (ja) | 薄膜トランジスタの製造方法 | |
| JPH0343769B2 (enExample) | ||
| JPH0450746B2 (enExample) | ||
| JPS61251115A (ja) | 絶縁膜上の半導体単結晶成長方法 | |
| JPH03114219A (ja) | 半導体装置用基板の製造方法 | |
| JPS6342417B2 (enExample) | ||
| JPH03159116A (ja) | 多結晶半導体薄膜の熱処理方法 | |
| JPS5983993A (ja) | 単結晶半導体層の成長方法 | |
| JPS61135110A (ja) | 半導体装置の製造方法 | |
| JPH02177534A (ja) | 半導体装置の製造方法 | |
| JPS62219510A (ja) | 単結晶島状領域の形成方法 | |
| JP2526380B2 (ja) | 多層半導体基板の製造方法 | |
| JPS59158515A (ja) | 半導体装置の製造方法 | |
| JPH01264215A (ja) | 半導体装置の製造方法 | |
| JPS5961118A (ja) | 半導体装置の製造方法 | |
| JPS5893224A (ja) | 半導体単結晶膜の製造方法 | |
| JPS6347251B2 (enExample) | ||
| JPH0223027B2 (enExample) | ||
| JPH0410214B2 (enExample) | ||
| JPH08181069A (ja) | 多結晶薄膜の形成方法及び薄膜半導体素子 | |
| JPS63265464A (ja) | 半導体装置の製造方法 |