JPH0333061Y2 - - Google Patents

Info

Publication number
JPH0333061Y2
JPH0333061Y2 JP1982099147U JP9914782U JPH0333061Y2 JP H0333061 Y2 JPH0333061 Y2 JP H0333061Y2 JP 1982099147 U JP1982099147 U JP 1982099147U JP 9914782 U JP9914782 U JP 9914782U JP H0333061 Y2 JPH0333061 Y2 JP H0333061Y2
Authority
JP
Japan
Prior art keywords
information
input
inspection
semiconductor
rom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1982099147U
Other languages
English (en)
Japanese (ja)
Other versions
JPS593537U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9914782U priority Critical patent/JPS593537U/ja
Publication of JPS593537U publication Critical patent/JPS593537U/ja
Application granted granted Critical
Publication of JPH0333061Y2 publication Critical patent/JPH0333061Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP9914782U 1982-06-30 1982-06-30 半導体素子検査装置の測子カ−ド Granted JPS593537U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9914782U JPS593537U (ja) 1982-06-30 1982-06-30 半導体素子検査装置の測子カ−ド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9914782U JPS593537U (ja) 1982-06-30 1982-06-30 半導体素子検査装置の測子カ−ド

Publications (2)

Publication Number Publication Date
JPS593537U JPS593537U (ja) 1984-01-11
JPH0333061Y2 true JPH0333061Y2 (enrdf_load_stackoverflow) 1991-07-12

Family

ID=30235088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9914782U Granted JPS593537U (ja) 1982-06-30 1982-06-30 半導体素子検査装置の測子カ−ド

Country Status (1)

Country Link
JP (1) JPS593537U (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0229723Y2 (enrdf_load_stackoverflow) * 1985-12-10 1990-08-09

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5950942B2 (ja) * 1978-11-10 1984-12-11 日本プレシジヨン・サ−キツツ株式会社 ウエ−ハプロ−バ
JPS568836A (en) * 1979-07-03 1981-01-29 Chiyou Lsi Gijutsu Kenkyu Kumiai Manufacturing system for semiconductor device

Also Published As

Publication number Publication date
JPS593537U (ja) 1984-01-11

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