JPH0324015B2 - - Google Patents

Info

Publication number
JPH0324015B2
JPH0324015B2 JP54028703A JP2870379A JPH0324015B2 JP H0324015 B2 JPH0324015 B2 JP H0324015B2 JP 54028703 A JP54028703 A JP 54028703A JP 2870379 A JP2870379 A JP 2870379A JP H0324015 B2 JPH0324015 B2 JP H0324015B2
Authority
JP
Japan
Prior art keywords
astigmatism
electron beam
sample
deflector
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP54028703A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55121259A (en
Inventor
Kazuo Yotsui
Toshuki Oohashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2870379A priority Critical patent/JPS55121259A/ja
Priority to US06/129,754 priority patent/US4379231A/en
Priority to NLAANVRAGE8001482,A priority patent/NL188192C/xx
Publication of JPS55121259A publication Critical patent/JPS55121259A/ja
Publication of JPH0324015B2 publication Critical patent/JPH0324015B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1472—Deflecting along given lines
    • H01J37/1474—Scanning means
    • H01J37/1475—Scanning means magnetic

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2870379A 1979-03-14 1979-03-14 Elelctron microscope Granted JPS55121259A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2870379A JPS55121259A (en) 1979-03-14 1979-03-14 Elelctron microscope
US06/129,754 US4379231A (en) 1979-03-14 1980-03-12 Electron microscope
NLAANVRAGE8001482,A NL188192C (nl) 1979-03-14 1980-03-12 Elektronenmicroscoop.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2870379A JPS55121259A (en) 1979-03-14 1979-03-14 Elelctron microscope

Publications (2)

Publication Number Publication Date
JPS55121259A JPS55121259A (en) 1980-09-18
JPH0324015B2 true JPH0324015B2 (cg-RX-API-DMAC7.html) 1991-04-02

Family

ID=12255816

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2870379A Granted JPS55121259A (en) 1979-03-14 1979-03-14 Elelctron microscope

Country Status (3)

Country Link
US (1) US4379231A (cg-RX-API-DMAC7.html)
JP (1) JPS55121259A (cg-RX-API-DMAC7.html)
NL (1) NL188192C (cg-RX-API-DMAC7.html)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57111936A (en) * 1980-12-27 1982-07-12 Jeol Ltd Astigmatism correcting device for electron microscope
JPS57176658A (en) * 1981-04-24 1982-10-30 Jeol Ltd Method and device for astigmatism correction of electron microscope
NL8304217A (nl) * 1983-12-07 1985-07-01 Philips Nv Automatisch instelbare electronenmicroscoop.
SE455736B (sv) * 1984-03-15 1988-08-01 Sarastro Ab Forfaringssett och anordning for mikrofotometrering och efterfoljande bildsammanstellning
US4680469A (en) * 1984-08-17 1987-07-14 Hitachi, Ltd. Focusing device for a television electron microscope
JPH07105209B2 (ja) * 1988-04-28 1995-11-13 株式会社日立製作所 電子顕微鏡
US5311028A (en) * 1990-08-29 1994-05-10 Nissin Electric Co., Ltd. System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions
US5923430A (en) * 1993-06-17 1999-07-13 Ultrapointe Corporation Method for characterizing defects on semiconductor wafers
US5479252A (en) * 1993-06-17 1995-12-26 Ultrapointe Corporation Laser imaging system for inspection and analysis of sub-micron particles
US6148114A (en) * 1996-11-27 2000-11-14 Ultrapointe Corporation Ring dilation and erosion techniques for digital image processing
JP4795883B2 (ja) * 2006-07-21 2011-10-19 株式会社日立ハイテクノロジーズ パターン検査・計測装置
US8283631B2 (en) * 2008-05-08 2012-10-09 Kla-Tencor Corporation In-situ differential spectroscopy
JP7193694B2 (ja) * 2018-07-26 2022-12-21 国立研究開発法人理化学研究所 電子顕微鏡およびそれを用いた試料観察方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB832500A (en) * 1955-12-12 1960-04-13 Ass Elect Ind Improvements relating to electron optical apparatus
JPS4122595Y1 (cg-RX-API-DMAC7.html) * 1964-08-25 1966-11-11
JPS4833903B1 (cg-RX-API-DMAC7.html) * 1969-04-08 1973-10-17
JPS4922351B1 (cg-RX-API-DMAC7.html) * 1969-12-25 1974-06-07
GB1441824A (en) * 1973-04-19 1976-07-07 Cambridge Scientific Instr Ltd Scanning electronbeam instrument
JPS51132885A (en) * 1975-01-17 1976-11-18 Hitachi Ltd Pasticle ray analyzing unit
NL7510276A (nl) * 1975-09-01 1977-03-03 Philips Nv Elektronenmikroskoop.
FR2341922A1 (fr) * 1976-02-17 1977-09-16 Cgr Mev Perfectionnement a un dispositif de balayage d'une cible par un faisceau de particules chargees
US4117339A (en) * 1977-07-01 1978-09-26 Burroughs Corporation Double deflection electron beam generator for employment in the fabrication of semiconductor and other devices
US4162403A (en) * 1978-07-26 1979-07-24 Advanced Metals Research Corp. Method and means for compensating for charge carrier beam astigmatism

Also Published As

Publication number Publication date
JPS55121259A (en) 1980-09-18
US4379231A (en) 1983-04-05
NL188192B (nl) 1991-11-18
NL8001482A (nl) 1980-09-16
NL188192C (nl) 1992-04-16

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