JPH0316780B2 - - Google Patents

Info

Publication number
JPH0316780B2
JPH0316780B2 JP57093049A JP9304982A JPH0316780B2 JP H0316780 B2 JPH0316780 B2 JP H0316780B2 JP 57093049 A JP57093049 A JP 57093049A JP 9304982 A JP9304982 A JP 9304982A JP H0316780 B2 JPH0316780 B2 JP H0316780B2
Authority
JP
Japan
Prior art keywords
rising
falling
data
circuit
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57093049A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58210632A (ja
Inventor
Hiroshige Sakahara
Wataru Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP9304982A priority Critical patent/JPS58210632A/ja
Publication of JPS58210632A publication Critical patent/JPS58210632A/ja
Publication of JPH0316780B2 publication Critical patent/JPH0316780B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
JP9304982A 1982-06-02 1982-06-02 パタ−ンエツジ検出回路 Granted JPS58210632A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9304982A JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9304982A JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Publications (2)

Publication Number Publication Date
JPS58210632A JPS58210632A (ja) 1983-12-07
JPH0316780B2 true JPH0316780B2 (enrdf_load_stackoverflow) 1991-03-06

Family

ID=14071649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9304982A Granted JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Country Status (1)

Country Link
JP (1) JPS58210632A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102837A (en) * 1978-01-28 1979-08-13 Nippon Telegr & Teleph Corp <Ntt> Pattern check system

Also Published As

Publication number Publication date
JPS58210632A (ja) 1983-12-07

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