JPS58210632A - パタ−ンエツジ検出回路 - Google Patents

パタ−ンエツジ検出回路

Info

Publication number
JPS58210632A
JPS58210632A JP9304982A JP9304982A JPS58210632A JP S58210632 A JPS58210632 A JP S58210632A JP 9304982 A JP9304982 A JP 9304982A JP 9304982 A JP9304982 A JP 9304982A JP S58210632 A JPS58210632 A JP S58210632A
Authority
JP
Japan
Prior art keywords
data
rising
circuit
falling
edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9304982A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0316780B2 (enrdf_load_stackoverflow
Inventor
Hiroshige Sakahara
坂原　広重
Wataru Takahashi
渉 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP9304982A priority Critical patent/JPS58210632A/ja
Publication of JPS58210632A publication Critical patent/JPS58210632A/ja
Publication of JPH0316780B2 publication Critical patent/JPH0316780B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
JP9304982A 1982-06-02 1982-06-02 パタ−ンエツジ検出回路 Granted JPS58210632A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9304982A JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9304982A JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Publications (2)

Publication Number Publication Date
JPS58210632A true JPS58210632A (ja) 1983-12-07
JPH0316780B2 JPH0316780B2 (enrdf_load_stackoverflow) 1991-03-06

Family

ID=14071649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9304982A Granted JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Country Status (1)

Country Link
JP (1) JPS58210632A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102837A (en) * 1978-01-28 1979-08-13 Nippon Telegr & Teleph Corp <Ntt> Pattern check system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102837A (en) * 1978-01-28 1979-08-13 Nippon Telegr & Teleph Corp <Ntt> Pattern check system

Also Published As

Publication number Publication date
JPH0316780B2 (enrdf_load_stackoverflow) 1991-03-06

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