JPH0311437B2 - - Google Patents

Info

Publication number
JPH0311437B2
JPH0311437B2 JP56147256A JP14725681A JPH0311437B2 JP H0311437 B2 JPH0311437 B2 JP H0311437B2 JP 56147256 A JP56147256 A JP 56147256A JP 14725681 A JP14725681 A JP 14725681A JP H0311437 B2 JPH0311437 B2 JP H0311437B2
Authority
JP
Japan
Prior art keywords
signal
level
circuit
terminal
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56147256A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5848874A (ja
Inventor
Masami Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP56147256A priority Critical patent/JPS5848874A/ja
Publication of JPS5848874A publication Critical patent/JPS5848874A/ja
Publication of JPH0311437B2 publication Critical patent/JPH0311437B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56147256A 1981-09-18 1981-09-18 集積回路 Granted JPS5848874A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56147256A JPS5848874A (ja) 1981-09-18 1981-09-18 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56147256A JPS5848874A (ja) 1981-09-18 1981-09-18 集積回路

Publications (2)

Publication Number Publication Date
JPS5848874A JPS5848874A (ja) 1983-03-22
JPH0311437B2 true JPH0311437B2 (enrdf_load_stackoverflow) 1991-02-15

Family

ID=15426113

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56147256A Granted JPS5848874A (ja) 1981-09-18 1981-09-18 集積回路

Country Status (1)

Country Link
JP (1) JPS5848874A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993007502A1 (en) * 1991-10-04 1993-04-15 Fujitsu Limited Pin scan-in type lsi logic circuit, pin scan-in system driving circuit, and circuit mounting board test method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119133A (ja) * 1983-12-01 1985-06-26 Seiko Epson Corp 制御端子回路
JPH0388180U (enrdf_load_stackoverflow) * 1989-12-26 1991-09-09
US5817397A (en) * 1995-03-01 1998-10-06 Taiho Kogyo Co., Ltd. Sliding bearing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993007502A1 (en) * 1991-10-04 1993-04-15 Fujitsu Limited Pin scan-in type lsi logic circuit, pin scan-in system driving circuit, and circuit mounting board test method

Also Published As

Publication number Publication date
JPS5848874A (ja) 1983-03-22

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