JPS5848874A - 集積回路 - Google Patents

集積回路

Info

Publication number
JPS5848874A
JPS5848874A JP56147256A JP14725681A JPS5848874A JP S5848874 A JPS5848874 A JP S5848874A JP 56147256 A JP56147256 A JP 56147256A JP 14725681 A JP14725681 A JP 14725681A JP S5848874 A JPS5848874 A JP S5848874A
Authority
JP
Japan
Prior art keywords
signal
circuit
level
gate
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56147256A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0311437B2 (enrdf_load_stackoverflow
Inventor
Masami Hashimoto
正美 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP56147256A priority Critical patent/JPS5848874A/ja
Publication of JPS5848874A publication Critical patent/JPS5848874A/ja
Publication of JPH0311437B2 publication Critical patent/JPH0311437B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56147256A 1981-09-18 1981-09-18 集積回路 Granted JPS5848874A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56147256A JPS5848874A (ja) 1981-09-18 1981-09-18 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56147256A JPS5848874A (ja) 1981-09-18 1981-09-18 集積回路

Publications (2)

Publication Number Publication Date
JPS5848874A true JPS5848874A (ja) 1983-03-22
JPH0311437B2 JPH0311437B2 (enrdf_load_stackoverflow) 1991-02-15

Family

ID=15426113

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56147256A Granted JPS5848874A (ja) 1981-09-18 1981-09-18 集積回路

Country Status (1)

Country Link
JP (1) JPS5848874A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119133A (ja) * 1983-12-01 1985-06-26 Seiko Epson Corp 制御端子回路
JPH0388180U (enrdf_load_stackoverflow) * 1989-12-26 1991-09-09
US5817397A (en) * 1995-03-01 1998-10-06 Taiho Kogyo Co., Ltd. Sliding bearing

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5612962A (en) * 1991-10-04 1997-03-18 Fujitsu Limited Pin-scan-in type LSI logic circuit, pin-scan-in system driving circuit, and method of testing circuit-mounting substrates

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119133A (ja) * 1983-12-01 1985-06-26 Seiko Epson Corp 制御端子回路
JPH0388180U (enrdf_load_stackoverflow) * 1989-12-26 1991-09-09
US5817397A (en) * 1995-03-01 1998-10-06 Taiho Kogyo Co., Ltd. Sliding bearing

Also Published As

Publication number Publication date
JPH0311437B2 (enrdf_load_stackoverflow) 1991-02-15

Similar Documents

Publication Publication Date Title
US3967062A (en) Method and apparatus for encoding data and clock information in a self-clocking data stream
US6614371B2 (en) Synchronous data serialization circuit
EP0256861B1 (en) Flip-flop circuit
JPS59112747A (ja) ２進デ−タ受信機
EP0330971A3 (en) Flip-flop circuit
EP0219846B1 (en) Latch circuit tolerant of undefined control signals
US6018560A (en) Up/down counter
US6121906A (en) Serial/parallel selective converter
JPS5848874A (ja) 集積回路
KR960701539A (ko) 단일 단자 펄스 게이팅 회로(single-ended pulse gating circuit)
JPS6179318A (ja) フリツプフロツプ回路
JP3326137B2 (ja) 直列通信インターフェース回路
US5341048A (en) Clock invert and select circuit
KR900000995B1 (ko) 테스트 데이타 부하 기능을 갖춘 논리회로
US4887083A (en) Bipolar with eight-zeros substitution and bipolar with six-zeros substitution coding circuit
JPS5920196B2 (ja) 双方向性シフトレジスタ
KR900000703B1 (ko) 패리티(parity) 검출회로
EP0294614B1 (en) m bit to n bit code converting circuit
KR920000407Y1 (ko) Dat시스템에서의 샘플링 데이타 변환회로
KR910009093B1 (ko) 부호화 마크 반전 코딩회로
KR940004543Y1 (ko) 다용도 플립플롭
JPH0744473A (ja) 信号授受回路
JPH0330326B2 (enrdf_load_stackoverflow)
JPH0369446B2 (enrdf_load_stackoverflow)
JPH0691432B2 (ja) フリツプフロツプ回路