JPH0287082A - プローブピン接触不良判断機能を有するインサーキットテスタ - Google Patents

プローブピン接触不良判断機能を有するインサーキットテスタ

Info

Publication number
JPH0287082A
JPH0287082A JP63238055A JP23805588A JPH0287082A JP H0287082 A JPH0287082 A JP H0287082A JP 63238055 A JP63238055 A JP 63238055A JP 23805588 A JP23805588 A JP 23805588A JP H0287082 A JPH0287082 A JP H0287082A
Authority
JP
Japan
Prior art keywords
probe pin
component
contact
measurement
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63238055A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0581867B2 (enrdf_load_stackoverflow
Inventor
Seiichi Hori
誠一 堀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki EE Corp filed Critical Hioki EE Corp
Priority to JP63238055A priority Critical patent/JPH0287082A/ja
Publication of JPH0287082A publication Critical patent/JPH0287082A/ja
Publication of JPH0581867B2 publication Critical patent/JPH0581867B2/ja
Granted legal-status Critical Current

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D30/00—Reducing energy consumption in communication networks
    • Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP63238055A 1988-09-23 1988-09-23 プローブピン接触不良判断機能を有するインサーキットテスタ Granted JPH0287082A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63238055A JPH0287082A (ja) 1988-09-23 1988-09-23 プローブピン接触不良判断機能を有するインサーキットテスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63238055A JPH0287082A (ja) 1988-09-23 1988-09-23 プローブピン接触不良判断機能を有するインサーキットテスタ

Publications (2)

Publication Number Publication Date
JPH0287082A true JPH0287082A (ja) 1990-03-27
JPH0581867B2 JPH0581867B2 (enrdf_load_stackoverflow) 1993-11-16

Family

ID=17024494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63238055A Granted JPH0287082A (ja) 1988-09-23 1988-09-23 プローブピン接触不良判断機能を有するインサーキットテスタ

Country Status (1)

Country Link
JP (1) JPH0287082A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007178250A (ja) * 2005-12-28 2007-07-12 Nidec-Read Corp 基板検査方法及び基板検査装置
JP2010151790A (ja) * 2008-11-27 2010-07-08 Hioki Ee Corp 基板検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007178250A (ja) * 2005-12-28 2007-07-12 Nidec-Read Corp 基板検査方法及び基板検査装置
JP2010151790A (ja) * 2008-11-27 2010-07-08 Hioki Ee Corp 基板検査装置

Also Published As

Publication number Publication date
JPH0581867B2 (enrdf_load_stackoverflow) 1993-11-16

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