JPH028199Y2 - - Google Patents
Info
- Publication number
- JPH028199Y2 JPH028199Y2 JP1980076088U JP7608880U JPH028199Y2 JP H028199 Y2 JPH028199 Y2 JP H028199Y2 JP 1980076088 U JP1980076088 U JP 1980076088U JP 7608880 U JP7608880 U JP 7608880U JP H028199 Y2 JPH028199 Y2 JP H028199Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron beam
- rays
- ray
- cpu
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1980076088U JPH028199Y2 (enrdf_load_stackoverflow) | 1980-05-30 | 1980-05-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1980076088U JPH028199Y2 (enrdf_load_stackoverflow) | 1980-05-30 | 1980-05-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57653U JPS57653U (enrdf_load_stackoverflow) | 1982-01-05 |
JPH028199Y2 true JPH028199Y2 (enrdf_load_stackoverflow) | 1990-02-27 |
Family
ID=29438745
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1980076088U Expired JPH028199Y2 (enrdf_load_stackoverflow) | 1980-05-30 | 1980-05-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH028199Y2 (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54109897A (en) * | 1978-02-16 | 1979-08-28 | Jeol Ltd | Specimen analytical apparatus in scanning electron microscope or the like |
-
1980
- 1980-05-30 JP JP1980076088U patent/JPH028199Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS57653U (enrdf_load_stackoverflow) | 1982-01-05 |
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