JPH0252171U - - Google Patents
Info
- Publication number
- JPH0252171U JPH0252171U JP13318788U JP13318788U JPH0252171U JP H0252171 U JPH0252171 U JP H0252171U JP 13318788 U JP13318788 U JP 13318788U JP 13318788 U JP13318788 U JP 13318788U JP H0252171 U JPH0252171 U JP H0252171U
- Authority
- JP
- Japan
- Prior art keywords
- data
- under test
- element under
- arbitrary function
- digitizer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案によるＩＣ試験装置の一例を
示すブロツク図、第２図はその任意関数発生器中
の波形メモリの例を示す図、第３図は従来のＩＣ
試験装置の一例を示すブロツク図である。
FIG. 1 is a block diagram showing an example of an IC test device according to this invention, FIG. 2 is a diagram showing an example of the waveform memory in the arbitrary function generator, and FIG.
FIG. 2 is a block diagram showing an example of a test device.
Claims (1)
“１”を設定してトリガ信号を出力する任意関数
発生器と、 その任意関数発生器からの任意関数波形データ
をアナログ信号に変換して被測定ＩＣ素子へ供給
するＤＡ変換器と、 上記被測定ＩＣ素子の出力アナログデータをデ
ジタルデータに変換してメモリに取り込み上記ト
リガ信号を受けると設定されたデータ数だけデー
タを取り込んで停止するデジタイザと、 上記任意関数発生器及び上記デジタイザにスタ
ートをかける制御装置とを具備するＩＣ試験装置
。[Claims for Utility Model Registration] Arbitrary function waveform data and an arbitrary function generator that outputs a trigger signal by setting data “1” at any point thereof; A DA converter that converts the output analog data of the IC element under test into a signal and supplies it to the IC element under test, and converts the output analog data of the IC element under test into digital data and stores it in the memory.When the trigger signal is received, the data is stored by the set number of data. An IC testing device comprising: a digitizer that takes data and stops; and a control device that starts the arbitrary function generator and the digitizer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13318788U JPH0714932Y2 (en) | 1988-10-11 | 1988-10-11 | IC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13318788U JPH0714932Y2 (en) | 1988-10-11 | 1988-10-11 | IC test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0252171U true JPH0252171U (en) | 1990-04-13 |
| JPH0714932Y2 JPH0714932Y2 (en) | 1995-04-10 |
Family
ID=31390826
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13318788U Expired - Lifetime JPH0714932Y2 (en) | 1988-10-11 | 1988-10-11 | IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714932Y2 (en) |
-
1988
- 1988-10-11 JP JP13318788U patent/JPH0714932Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0714932Y2 (en) | 1995-04-10 |
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