JPH0714932Y2 - IC test equipment - Google Patents

Description

[Detailed Description of the Device] “Industrial Application Field” This device converts an arbitrary function waveform data from an arbitrary function generator into an analog signal and supplies it to an IC device under test, and outputs the IC device under test. The present invention relates to an IC test apparatus including a digitizer that converts analog data into digital data, loads it into a memory, and loads a set number of data when a trigger signal is received and stops the digitizer.

"Prior Art" Fig. 3 shows the prior art of this type of IC testing device. The arbitrary function waveform data from the arbitrary function generator 11 is converted into an analog signal by the DA converter 12, and the analog signal is supplied to the IC element under test 13 as a test signal. The analog data output from the IC device under test 13 is converted into digital data by the digitizer 14 and stored in the memory. When the digitizer 14 receives the trigger signal, the digitizer 14 takes in the set number of data and stops taking the data.

In the past, waveform generation was started by the start signal from the digital pattern generator 15, the digitizer 14 was started by the control device 16, the output data from the IC device under test 13 was taken in, and the trigger signal from the digital pattern generator 15 was received. To stop. Digital pattern generator 15
Is for generating a digital pattern and supplying it to the IC element under test 13 for testing.

"Problems to be solved by the device" When you want to set the trigger timing of the digitizer 14 to a certain point for the analog signal applied to the IC element under test 13, set the timing of start and trigger to the digital pattern generator 15. Had to describe. That is, it was necessary to make a control pattern program for the digital pattern generator 15 in that way.

"Means for Solving the Problem" In the present invention, in addition to outputting arbitrary function waveform data to the arbitrary function generator, data "1" is set at an arbitrary point and a trigger signal is output. It

In this way, the data "1" that outputs the trigger signal to the arbitrary function generator is set, so it can be easily set when you want to set the trigger timing for the analog signal applied to the IC device under test. .

[Embodiment] FIG. 1 shows an embodiment of the present invention, in which parts corresponding to those in FIG. In addition to generating arbitrary function waveform data as in the conventional case, the arbitrary function generator 21 also generates a trigger signal in the present invention. For example, as shown in FIG. 2, the arbitrary function waveform data is stored in the waveform memory of the arbitrary function generator 21, and 1 bit is added to each address to make it a trigger bit area.
In the trigger bit area, "1" is set in the address corresponding to the timing of the arbitrary function waveform for which the trigger is to be generated. The trigger signal read from the arbitrary function generator 21 is supplied to the digitizer 14. Arbitrary function generator 21 is started by controller 16.

When the IC device under test 13 has analog input and digital output, a memory that captures the digital output signal of the IC device under test 13 is used instead of the digitizer, and the arbitrary function generator 21
The capture can also be stopped by the trigger signal from.

“Effect of Device” As described above, according to this device, the arbitrary function generator 21
It is only necessary to set "1" to the trigger bit at the point where you want to set the trigger of the waveform memory inside, the trigger setting is simple, and there is no need to create a control pattern program for the digital pattern generator, which was required in the past.

[Brief description of drawings]

FIG. 1 is a block diagram showing an example of an IC test device according to the present invention, FIG. 2 is a diagram showing an example of a waveform memory in the arbitrary function generator, and FIG. 3 is a block showing an example of a conventional IC test device. It is a figure.

Claims (1)

[Scope of utility model registration request] 1. Arbitrary function waveform data and an arbitrary function generator for setting a data "1" at an arbitrary point and outputting a trigger signal, and arbitrary function waveform data from the arbitrary function generator are converted into analog signals. Then, the DA converter that supplies the measured IC element to the measured IC element converts the output analog data of the measured IC element to digital data and stores it in the memory. When the trigger signal is received, the specified number of data is acquired and stopped. An IC test apparatus comprising: a digitizer, and a controller that starts the arbitrary function generator and the digitizer.