JPH03128861U - - Google Patents

Description

[Brief explanation of the drawing]

Fig. 1 is a block diagram of the configuration of the waveform measuring device of the present invention, Fig. 2 is a time chart for explaining the operation of the waveform measuring device of the present invention, and Fig. 3 shows an extracted delay circuit in Fig. 1. FIG. 4 is a timing chart showing the operation of the delay circuit shown in FIG. 3, FIG. The figure is an explanatory diagram when waveform measurement is performed using a digitizer in a conventional LSI tester. DESCRIPTION OF SYMBOLS 1...Track hold circuit, 2...A/D converter, 3...Memory, 4...Memory controller, 5...Delay circuit, 6...Module controller, 7...Comparison circuit.

Claims (1)

[Claim for Utility Model Registration] In a waveform measuring device that measures any measurement point of one waveform of a signal under test in synchronization with a sample clock signal, controlling each part of the device and processing the measurement data of the signal under test. a delay circuit that delays a first clock signal obtained by comparing the signal under test with a constant voltage value by a time set based on a signal from the module controller; A track and hold circuit that holds a specific measurement point of the signal under test using the second clock signal obtained by the clock signal; and a track and hold circuit that digitally converts the value of the measurement point shown in bold. An A/D converter, a memory into which data converted by the A/D converter is written, and a second clock signal obtained by the delay circuit to give an address and a write pulse to the memory. A waveform measurement device comprising: a memory controller that writes data to the memory and reads data from the memory based on instructions from the module controller.