JPS648677U - - Google Patents
Info
- Publication number
- JPS648677U JPS648677U JP10325287U JP10325287U JPS648677U JP S648677 U JPS648677 U JP S648677U JP 10325287 U JP10325287 U JP 10325287U JP 10325287 U JP10325287 U JP 10325287U JP S648677 U JPS648677 U JP S648677U
- Authority
- JP
- Japan
- Prior art keywords
- timing
- generator
- signal
- pattern
- given
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案の一実施例を説明するブロツ
ク図、第２図及び第３図はこの考案の動作を説明
するための波形図、第４図は従来の技術を説明す
るためのブロツク図、第５図は従来の技術の動作
を説明するための波形図である。
１……タイミング発生器、２……パターン発生
器、３……波形発生器、４……被試験ＩＣ、５…
…判定器、８……一時記憶手段。
Fig. 1 is a block diagram for explaining one embodiment of this invention, Figs. 2 and 3 are waveform diagrams for explaining the operation of this invention, and Fig. 4 is a block diagram for explaining the conventional technique. , FIG. 5 is a waveform diagram for explaining the operation of the conventional technique. 1... Timing generator, 2... Pattern generator, 3... Waveform generator, 4... IC under test, 5...
...Judgment device, 8...Temporary storage means.
Claims (1)
生器と、 Ｂ このタイミング信号発生器が出力するシステ
ムクロツクによつて試験パターン信号を被試験Ｉ
Ｃに与えるタイミングを指定するためのタイミン
グ指定データを出力するパターン発生器と、 Ｃ このパターン発生器から出力されるタイミン
グ指定データを一時記憶し、上記タイミング発生
器から与えられる読出クロツクによつて記憶した
タイミング指定データを読出す一時記憶手段と、 Ｄ この一時記憶手段を介して取込んだタイミン
グ指定データによつて指定されたタイミングが規
定され被試験ＩＣに与える試験パターン信号を出
力する波形発生器と、 Ｅ 上記タイミング発生器から出力される波形判
定タイミングに従つて被試験ＩＣの応答信号と上
記パターン発生器が出力する期待値デ−タとの一
致、不一致を判定する判定器と、 から成るＩＣ試験装置。[Claims for Utility Model Registration] A. A timing signal generator that generates a timing signal; B. A system clock outputted from this timing signal generator to generate a test pattern signal to be tested.
A pattern generator that outputs timing specification data for specifying the timing to be given to C; and C temporarily stores the timing specification data output from this pattern generator, and stores it using a read clock given from the timing generator. (D) a waveform generator that outputs a test pattern signal whose timing is defined by the timing specification data taken in through the temporary storage means and is given to the IC under test; and E; a determiner that determines whether the response signal of the IC under test matches or does not match the expected value data output from the pattern generator according to the waveform determination timing output from the timing generator; IC test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987103252U JP2507879Y2 (en) | 1987-07-03 | 1987-07-03 | IC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987103252U JP2507879Y2 (en) | 1987-07-03 | 1987-07-03 | IC test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS648677U true JPS648677U (en) | 1989-01-18 |
| JP2507879Y2 JP2507879Y2 (en) | 1996-08-21 |
Family
ID=31333911
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987103252U Expired - Lifetime JP2507879Y2 (en) | 1987-07-03 | 1987-07-03 | IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2507879Y2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61250571A (en) * | 1985-04-30 | 1986-11-07 | Hitachi Ltd | Apparatus for testing semiconductor device |
-
1987
- 1987-07-03 JP JP1987103252U patent/JP2507879Y2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61250571A (en) * | 1985-04-30 | 1986-11-07 | Hitachi Ltd | Apparatus for testing semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2507879Y2 (en) | 1996-08-21 |
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