JPH0249650B2 - - Google Patents

Info

Publication number
JPH0249650B2
JPH0249650B2 JP58094270A JP9427083A JPH0249650B2 JP H0249650 B2 JPH0249650 B2 JP H0249650B2 JP 58094270 A JP58094270 A JP 58094270A JP 9427083 A JP9427083 A JP 9427083A JP H0249650 B2 JPH0249650 B2 JP H0249650B2
Authority
JP
Japan
Prior art keywords
printed circuit
circuit board
wiring pattern
pattern
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58094270A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59218938A (ja
Inventor
Nobuo Igusa
Katsunori Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58094270A priority Critical patent/JPS59218938A/ja
Publication of JPS59218938A publication Critical patent/JPS59218938A/ja
Publication of JPH0249650B2 publication Critical patent/JPH0249650B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP58094270A 1983-05-27 1983-05-27 プリント基板の配線パタ−ン検査方法 Granted JPS59218938A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58094270A JPS59218938A (ja) 1983-05-27 1983-05-27 プリント基板の配線パタ−ン検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58094270A JPS59218938A (ja) 1983-05-27 1983-05-27 プリント基板の配線パタ−ン検査方法

Publications (2)

Publication Number Publication Date
JPS59218938A JPS59218938A (ja) 1984-12-10
JPH0249650B2 true JPH0249650B2 (US07902200-20110308-C00004.png) 1990-10-30

Family

ID=14105578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58094270A Granted JPS59218938A (ja) 1983-05-27 1983-05-27 プリント基板の配線パタ−ン検査方法

Country Status (1)

Country Link
JP (1) JPS59218938A (US07902200-20110308-C00004.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0467555U (US07902200-20110308-C00004.png) * 1990-10-22 1992-06-16

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281517A (ja) * 1985-10-04 1987-04-15 Nec Corp 凹凸パタ−ン読取装置
JPH01121712A (ja) * 1987-11-06 1989-05-15 Nkk Corp 被検査物内面の減肉部検出方法
JPH01182745A (ja) * 1988-01-13 1989-07-20 Nec Corp スルーホール欠陥検出装置
JP2502341B2 (ja) * 1988-04-27 1996-05-29 株式会社日立製作所 プリント基板のはんだ付け検査方法および装置
FR2640050B1 (fr) * 1988-12-06 1991-03-29 Bull Sa Procede pour le controle d'une carte de circuit imprime equipee notamment le controle des composants de la carte et appareillage pour la mise en oeuvre de ce procede
US6452180B1 (en) * 2000-03-28 2002-09-17 Advanced Micro Devices, Inc. Infrared inspection for determining residual films on semiconductor devices
WO2004023122A1 (ja) * 2002-09-03 2004-03-18 Hamamatsu Foundation For Science And Technology Promotion パターン検査方法とその検査装置
JP2006234635A (ja) * 2005-02-25 2006-09-07 Three M Innovative Properties Co フレキシブルプリント配線板の接合部の非破壊検査方法
CZ305219B6 (cs) * 2013-03-21 2015-06-17 České vysoké učení technické v Praze, Fakulta strojní, Ústav přístrojové a řídící techniky Způsob automatického bezdotykového stanovení emisivity povrchu a zařízení k provádění tohoto způsobu
JP6306831B2 (ja) * 2013-06-28 2018-04-04 リンテック株式会社 位置検出装置および位置検出方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4938154A (US07902200-20110308-C00004.png) * 1972-08-14 1974-04-09
JPS4941855A (US07902200-20110308-C00004.png) * 1972-05-01 1974-04-19
JPS5074167A (US07902200-20110308-C00004.png) * 1973-10-30 1975-06-18

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4941855A (US07902200-20110308-C00004.png) * 1972-05-01 1974-04-19
JPS4938154A (US07902200-20110308-C00004.png) * 1972-08-14 1974-04-09
JPS5074167A (US07902200-20110308-C00004.png) * 1973-10-30 1975-06-18

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0467555U (US07902200-20110308-C00004.png) * 1990-10-22 1992-06-16

Also Published As

Publication number Publication date
JPS59218938A (ja) 1984-12-10

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